Patents by Inventor Fabrice Alain Robert Veersé

Fabrice Alain Robert Veersé has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Prediction of circuit performance variations due to device mismatch
    Patent number: 9087167
    Abstract: Aspects of the invention relate to techniques for predicting circuit performance variations due to device mismatch. Circuit simulation is performed to generate circuit simulation results based on a circuit description and information of circuit element parameters. Based on the simulation results, sensitivity information for the circuit design and current/charge deviations caused by individual circuit element parameter variations may be computed. Based on the sensitivity information and the current/charge deviations, steady-state mismatch effect information is determined. The determination may comprise first computing output parameter deviations caused by the individual variations of the circuit element parameters and then computing a total output parameter deviation based on the output parameter deviations.
    Type: Grant
    Filed: July 11, 2012
    Date of Patent: July 21, 2015
    Assignee: Mentor Graphics Corporation
    Inventor: Fabrice Alain Robert Veersé
  • Prediction Of Circuit Performance Variations Due To Device Mismatch
    Publication number: 20130018645
    Abstract: Aspects of the invention relate to techniques for predicting circuit performance variations due to device mismatch. Circuit simulation is performed to generate circuit simulation results based on a circuit description and information of circuit element parameters. Based on the simulation results, sensitivity information for the circuit design and current/charge deviations caused by individual circuit element parameter variations may be computed. Based on the sensitivity information and the current/charge deviations, steady-state mismatch effect information is determined. The determination may comprise first computing output parameter deviations caused by the individual variations of the circuit element parameters and then computing a total output parameter deviation based on the output parameter deviations.
    Type: Application
    Filed: July 11, 2012
    Publication date: January 17, 2013
    Inventor: Fabrice Alain Robert Veersé