Patents by Inventor Fabrice Picot

Fabrice Picot has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130210945
    Abstract: The invention relates to a cross-linked elastomer composition including: an ethylene/alpha-olefin multiblock copolymer comprising polymerized ethylene and alpha-olefin units, an elastomer including a block copolymer having at least two, identical or different, aromatic blocks which are separated by at least one elastomer block, and a cross-linkable polymer, for example, a diene elastomer. The invention also relates to a product including the composition, and to the use of such a product as a seal.
    Type: Application
    Filed: June 20, 2011
    Publication date: August 15, 2013
    Inventors: Fabrice Picot, Démosthène Sakkas, Aline Grudet
  • Patent number: 7392448
    Abstract: Methods and apparatus are provided for testing digital circuits. In one implementation, a scan chain test structure is provided that includes a cell chain, a first scan chain, and a second scan chain. The first scan chain is operable to test digital circuitry within a first portion of the cell chain, and the second scan chain is operable to test digital circuitry within a second portion of the cell chain. The first scan chain is further operable to test digital circuitry within the second scan chain, and the second scan chain is further operable to test digital circuitry within the first scan chain.
    Type: Grant
    Filed: August 17, 2005
    Date of Patent: June 24, 2008
    Assignee: Atmel Corporation
    Inventors: Alexandre De Poorter, Fabrice Picot
  • Publication number: 20070022340
    Abstract: Methods and apparatus are provided for testing digital circuits. In one implementation, a scan chain test structure is provided that includes a cell chain, a first scan chain, and a second scan chain. The first scan chain is operable to test digital circuitry within a first portion of the cell chain, and the second scan chain is operable to test digital circuitry within a second portion of the cell chain. The first scan chain is further operable to test digital circuitry within the second scan chain, and the second scan chain is further operable to test digital circuitry within the first scan chain.
    Type: Application
    Filed: August 17, 2005
    Publication date: January 25, 2007
    Inventors: Alexandre De Poorter, Fabrice Picot
  • Patent number: 6753713
    Abstract: A circuit and method for expanding the pulse width of a signal based on the input signal's pulse width. A circuit generates a delay equal to the pulse width of the input signal for both a SHIFT and OUT signal, which are out of phase with each other. The delay is generated when a capacitor applies voltage to two control transistors in both the SHIFT and OUT blocks, reducing gate control in these transistors and generating a delay in the falling edge of these signals such that the pulse width of the SHIFT signal is reduced and the pulse width of the OUT signal is increased. The capacitor is charged by a transistor activated by the SHIFT signal. The pulse-doubling system is self-converging: when the SHIFT signal's pulse width is zero, the OUT signal's pulse width is doubled, and the capacitor's charging level is fixed since it is no longer charged by the transistor controlled by the SHIFT signal.
    Type: Grant
    Filed: March 3, 2003
    Date of Patent: June 22, 2004
    Assignee: Atmel Corporation
    Inventors: Severin Barth, Fabrice Picot, Philippe Coll
  • Publication number: 20040104752
    Abstract: A circuit and method for expanding the pulse width of a signal based on the input signal's pulse width. A circuit generates a delay equal to the pulse width of the input signal for both a SHIFT and OUT signal, which are out of phase with each other. The delay is generated when a capacitor applies voltage to two control transistors in both the SHIFT and OUT blocks, reducing gate control in these transistors and generating a delay in the falling edge of these signals such that the pulse width of the SHIFT signal is reduced and the pulse width of the OUT signal is increased. The capacitor is charged by a transistor activated by the SHIFT signal. The pulse-doubling system is self-converging: when the SHIFT signal's pulse width is zero, the OUT signal's pulse width is doubled, and the capacitor's charging level is fixed since it is no longer charged by the transistor controlled by the SHIFT signal.
    Type: Application
    Filed: March 3, 2003
    Publication date: June 3, 2004
    Inventors: Severin Barth, Fabrice Picot, Philippe Coll