Abstract: A method includes tracing from an observation point in a circuit to an input of the circuit to produce a cone of influence that includes a plurality of components of the circuit. The plurality of components is connected at a plurality of nodes in the cone of influence and the plurality of components includes a plurality of logic elements. The method also includes, for each node of the plurality of nodes, determining an observability probability that a logical high or low value at a corresponding node propagates to the observation point. The method further includes determining a weighted soft error probability for each logic element of the plurality of logic elements and determining a weighed soft error failure mode distribution for the cone of influence.

Abstract: Training data may be collected based on a set of test-case configurations for each integrated circuit (IC) design in a set of IC designs. The training data may include a set of features extracted from each IC design, and a count of test cycles required for achieving a target test coverage for each test-case configuration. A machine learning (ML) model may be trained using the training data to obtain a trained ML model. The trained ML model may be used to predict a set of ranked test-case configurations for a given IC design based on features extracted from the given IC design.

Abstract: A method includes tracing from an observation point in a circuit to an input of the circuit to produce a cone of influence that includes a plurality of components of the circuit. The plurality of components is connected at a plurality of nodes in the cone of influence and the plurality of components includes a plurality of logic elements. The method also includes, for each node of the plurality of nodes, determining an observability probability that a logical high or low value at a corresponding node propagates to the observation point. The method further includes determining a weighted soft error probability for each logic element of the plurality of logic elements and determining a weighed soft error failure mode distribution for the cone of influence.

Abstract: An integrated circuit (IC) design comprising a scan chain may be received, where stimulus values may be scanned-in and response values may be scanned-out through a scan path in the scan chain, where the scan path may include a first scan cell and a second scan cell such that the first scan cell is downstream with respect to the second scan cell. The scan chain may be modified to enable observation of a 0 and a 1 value in the first scan cell in presence of a defect in the second scan cell, or observation of a 0 and a 1 value in the second scan cell in presence of a defect in the first scan cell.

Abstract: In order to realize some of the advantages described above, there is provided a computer system for verification of an intellectual property (IP) core in a system-on-chip (SoC). The system generates a plurality of verification specific abstracted views of the IP core, each of the plurality of verification specific abstracted views having a plurality of verification specific attributes at an input/output (I/O) interface of each of the abstracted view of the IP-core. A unified abstracted view of the IP-core is generated.

Abstract: In order to realize some of the advantages described above, there is provided a computer system for verification of an intellectual property (IP) core in a system-on-chip (SoC). The system generates a plurality of verification specific abstracted views of the IP core, each of the plurality of verification specific abstracted views having a plurality of verification specific attributes at an input/output (I/O) interface of each of the abstracted view of the IP-core. A unified abstracted view'of the IP-core is generated.

Abstract: In order to realize some of the advantages described above, there is provided a computer-implemented method for verification of an intellectual property (IP) core in a system-on-chip (SoC). The method comprises generating a plurality of verification specific abstracted views of the IP core each of the plurality of verification specific abstracted views having a plurality of verification specific attributes at an input/output (I/O) interface of each of the abstracted view of the IP-core. A unified abstracted view of the IP-core is generated.

Abstract: A clocking method for at-speed scan testing for delay defects in cross-domain paths of interacting synchronous clock domains in a scan circuit, each path originating from a source memory element in one of the domains and terminating at a destination memory element in another of the domains and comprises selectively aligning either a capture edge or a launch edge of the clock of each domain with a corresponding edge of at least one other domain of the interacting synchronous clock domains to determine the cross-domain paths to be tested between a source domain and a destination domain; clocking memory elements in each domain at respective domain clock rates to launch signal transitions from source memory elements in source domains; and for each pair of interacting clock domains under test, capturing, in the destination domain, circuit responses to signal transitions launched along paths originating from the source domain and selectively disabling capturing, in the source domain, of circuit responses to signal

Abstract: A method of fault diagnosis of integrated circuits having failing test vectors with observed fault effects using fault candidate fault-effects obtained by simulation of a set of test vectors, comprises determining a fault candidate diagnostic measure for each fault candidate, the fault candidate diagnostic measure having a fault candidate match metric, an observed fault effect mismatch metric and a fault candidate excitation metric, ranking fault candidates in decreasing diagnostic measure order; and identifying fault candidate(s) having the highest diagnostic measure as the most likely cause of observed fault effects.

Abstract: A method of designing a scan testable integrated circuit with embedded test objects for use in scan testing the circuit, comprises compiling a register-transfer level (RTL) circuit description of the circuit into an unmapped circuit description; extracting information from the unmapped circuit description for use in generating and inserting RTL descriptions of test objects into the RTL circuit description and for use in generating and inserting scan chains into the circuit; generating and inserting the RTL descriptions of the test objects into the RTL circuit description to produce a modified RTL circuit description; storing the modified RTL circuit description; synthesizing the modified RTL description into a gate level circuit description of the circuit; and constructing and inserting scan chains into the gate level circuit description according to information extracted from the unmapped circuit description.

Abstract: A clocking method for at-speed scan testing for delay defects in cross-domain paths of interacting synchronous clock domains in a scan circuit, each path originating from a source memory element in one of the domains and terminating at a destination memory element in another of the domains and comprises selectively aligning either a capture edge or a launch edge of the clock of each domain with a corresponding edge of at least one other domain of the interacting synchronous clock domains to determine the cross-domain paths to be tested between a source domain and a destination domain; clocking memory elements in each domain at respective domain clock rates to launch signal transitions from source memory elements in source domains; and for each pair of interacting clock domains under test, capturing, in the destination domain, circuit responses to signal transitions launched along paths originating from the source domain and selectively disabling capturing, in the source domain, of circuit responses to signal

Abstract: A method and program product for verifying a logic design for proper operation of tri-state buses in the design, comprises, for each bus in the circuit design, determining the smallest cut set, a min-cut, of the logic controlling the bus, performing an exhaustive analysis on a min-cut set of logic, and performing a full exhaustive analysis of the bus when the exhaustive analysis on the min-cut set of logic is inconclusive. In a preferred embodiment, prior to performing the min-cut set analysis, implication based conflict-free and float-free analyses are performed on the bus.

Abstract: A method of fault diagnosis of integrated circuits having failing test vectors with observed fault effects using fault candidate fault-effects obtained by simulation of a set of test vectors, comprises determining a fault candidate diagnostic measure for each fault candidate, the fault candidate diagnostic measure having a fault candidate match metric, an observed fault effect mismatch metric and a fault candidate excitation metric, ranking fault candidates in decreasing diagnostic measure order; and identifying fault candidate(s) having the highest diagnostic measure as the most likely cause of observed fault effects.

Abstract: A method for at-speed testing high-performance digital systems and circuits having combinational logic and memory elements that may be both scannable and non-scannable is performed by enabling at least two clock pulses during a capture sequence following a shift sequence. The method provides for initialization of any non-scannable memory elements via the scannable memory elements at the beginning of the test before an at-speed test is performed. During initialization, control logic generates a signal to disable the generation of system clock pulses for capture. Instead, only one clock cycle derived from the test clock or a system clock is generated to initialize the non-scannable elements. The number of shift sequences required depends on the maximum number of non-scannable elements that must be traversed between two scannable memory elements. During the same initialization period, the output response analyzer is disabled since unknown data values will present in the stream of data shifted out.

Abstract: A method of and computer program product for modeling a logic circuit having combinational logic and latches, in which the latches are clocked by one of a first clock phase, a second clock phase or a pulse derived from the second clock phase, a subset of latches being scannable, comprises, for each latch in the logic circuit, associating the latch with one of the first and second clock phase; and when latch is associated with the first clock phase, modeling the latch as a buffer connected between the data input and output of latch; and when the latch is associated with the second clock phase, modeling the latch as an edge-triggered flip-flop having the same data input, data output and clock input as the latch.

Abstract: A method and program product for verifying a logic design for proper operation of tri-state buses in the design, comprises, for each bus in the circuit design, determining the smallest cut set, a min-cut, of the logic controlling the bus, performing an exhaustive analysis on a min-cut set of logic, and performing a full exhaustive analysis of the bus when the exhaustive analysis on the min-cut set of logic is inconclusive. In a preferred embodiment, prior to performing the min-cut set analysis, implication based conflict-free and float-free analyses are performed on the bus.

Abstract: A method of and computer program product for modeling a logic circuit having combinational logic and latches, in which the latches are clocked by one of a first clock phase, a second clock phase or a pulse derived from the second clock phase, a subset of latches being scannable, comprises, for each latch in the logic circuit, associating the latch with one of the first and second clock phase; and when latch is associated with the first clock phase, modeling the latch as a buffer connected between the data input and output of latch; and when the latch is associated with the second clock phase, modeling the latch as an edge-triggered flip-flop having the same data input, data output and clock input as the latch.

Abstract: The integrity of a bus (16) may be maintained in a circuit (10) during testing by first scrutinizing the circuit to learn whether a potential conflict will ever exist on the bus for any combination of input values to the circuit. If no conflict will ever exist, then the bus is deemed a no-conflict bus, and nothing further need be done to that bus during testing. Should the bus be found to be a potential conflict bus, then a bus justification vector is generated for application to the circuit to maintain the integrity of the bus intact during testing.

Abstract: The generation of a test for detecting faults in a circuit (10) can be speeded up by first selecting a successive one of a first set of faults for targeting and thereafter determining the effort required to detect a predetermined number of the first set of faults. Each of the remaining faults is then successively targeted, with the amount of effort spent to detect each of the remaining faults being adjusted in accordance with the amount of effort spent detecting the previously targeted fault. In each test cycle, faults that are untestable, or too difficult to detect during that cycle, are eliminated from consideration to improve the efficiency and speed of the test generation process.