Abstract: A method for localizing a hot spot (27) in a sample (12), in particular an encapsulated device under test (DUT), by using lock-in thermography (LIT), where at least one heat source (23) of an electrical circuit is buried within the sample (12) and generated the hot spot (27) upon flow of current therein, comprises applying a non-harmonic excitation wave test signal at a lock-in frequency to the electrical circuit of the sample (12) to activate the heat source (23) for generating the hot spot (27); imaging the sample (12) using an infrared sensor (16) to obtain IR images of the sample (12) while the non-harmonic test signal is applied to the electrical circuit; and detecting a thermal response signal obtained from the imaging, the thermal response signal being in correlation to the thermal heat propagation within the sample (12).

Abstract: Manual cleaning device (10), comprising a cleaning member (12, 120), delimited at least over a portion of its circumference by an edge (13) formed in a plane (14) and configured on one side of this plane (14) to have a dome shape, characterized in that the cleaning member (12, 120) has a flat dome shape on both sides of the edge (13) and in that the circumference of the cleaning member (12, 120), dome-shaped on both sides, is oval at least in the area of its edge (13).