Patents by Inventor Fan LAN
Fan LAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11959964Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.Type: GrantFiled: June 2, 2023Date of Patent: April 16, 2024Assignee: SEMITRONIX CORPORATIONInventors: Jiabai Cheng, Wei Chen, Ludan Yang, Fan Lan
-
Publication number: 20230324458Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.Type: ApplicationFiled: June 2, 2023Publication date: October 12, 2023Applicant: SEMITRONIX CORPORATIONInventors: Jiabai CHENG, Wei CHEN, Ludan YANG, Fan LAN
-
Patent number: 11668748Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.Type: GrantFiled: January 25, 2022Date of Patent: June 6, 2023Assignee: SEMITRONIX CORPORATIONInventors: Fan Lan, Weiwei Pan, Shenzhi Yang, Yongjun Zheng
-
Publication number: 20220146573Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.Type: ApplicationFiled: January 25, 2022Publication date: May 12, 2022Applicant: SEMITRONIX CORPORATIONInventors: Fan LAN, Weiwei PAN, Shenzhi YANG, YONGJUN ZHENG
-
Patent number: 11330338Abstract: The present disclosure describes techniques for displaying comments on videos. The disclosed techniques include obtaining a first list comprising a plurality of comment messages and a second list configured to store address information corresponding to at least one reusable comment style; determining whether the second list comprises the address information in response to a determination that a target comment message among the plurality of comment messages is initialized; selecting a piece of address information corresponding to a target comment style among the at least one reusable comment style in response to a determination that the second list comprises the address information; and generating a target comment object based on the target comment message and the target comment style corresponding to the selected piece of address information, wherein the target comment style comprises data indicative of effects of presenting the target comment message on a display device.Type: GrantFiled: June 18, 2020Date of Patent: May 10, 2022Assignee: SHANGHAI BILIBILI TECHNOLOGY CO., LTD.Inventors: Zhaoxin Tan, Jianqiang Ding, Fan Lan, Jianqiang Zhang
-
Patent number: 11243251Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.Type: GrantFiled: July 27, 2020Date of Patent: February 8, 2022Assignee: SEMITRONIX CORPORATIONInventors: Fan Lan, Weiwei Pan, Shenzhi Yang
-
Publication number: 20200404380Abstract: The present disclosure describes techniques for displaying comments on videos. The disclosed techniques include obtaining a first list comprising a plurality of comment messages and a second list configured to store address information corresponding to at least one reusable comment style; determining whether the second list comprises the address information in response to a determination that a target comment message among the plurality of comment messages is initialized; selecting a piece of address information corresponding to a target comment style among the at least one reusable comment style in response to a determination that the second list comprises the address information; and generating a target comment object based on the target comment message and the target comment style corresponding to the selected piece of address information, wherein the target comment style comprises data indicative of effects of presenting the target comment message on a display device.Type: ApplicationFiled: June 18, 2020Publication date: December 24, 2020Inventors: Zhaoxin TAN, Jianqiang DING, Fan LAN, Jianqiang ZHANG
-
Publication number: 20200355742Abstract: A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.Type: ApplicationFiled: July 27, 2020Publication date: November 12, 2020Applicant: SEMITRONIX CORPORATIONInventors: Fan LAN, Weiwei PAN, Shenzhi YANG
-
Patent number: 10725101Abstract: A test apparatus for testing electrical parameters of a target chip, the apparatus including: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.Type: GrantFiled: April 8, 2019Date of Patent: July 28, 2020Assignee: Semitronix CorporationInventor: Fan Lan
-
Patent number: 10725102Abstract: An address register includes a plurality of edge-triggered flip-flop registers having an input D, an input R, an input CK, and an output Q; a counter logic; a shifter logic; a multiplexer; input ports including a reset signal RST, a clock signal CLK, a shift enable signal SE, a shift data input signal SI; an output port including address signals ADDR. D is coupled to a data output of the multiplexer; R is coupled to a reset (RST) pad; CK is coupled to a clock (CLK) pad; Q is coupled to an address (ADDR) pad; an input of the counter logic is coupled to ADDR; an input of the shifter logic is coupled to ADDR and the shift data input signal SI; an input of the multiplexer is coupled to SE, an output of the counter logic, and an output of the shifter logic.Type: GrantFiled: April 8, 2019Date of Patent: July 28, 2020Assignee: Semitronix CorporationInventor: Fan Lan
-
Patent number: 10708215Abstract: Techniques for displaying comment information are described herein. A method includes playing the target video, displaying the comments information associated with a video when said video is being played, displaying the social functions corresponding to said specific comment information when receiving the selection command corresponding to the specific comments information currently displayed, receiving the social information sending command corresponding to said social functions, obtaining the command inputted by the user on said social function panel, displaying said command corresponding to said specific comments information, and sending the server a request to add said command of said specific comments information so that said server will add said command into the comments information of said target video and record said command as the social information of said specific comments information. This invention allows the user to use more social functions when using the comments.Type: GrantFiled: March 10, 2017Date of Patent: July 7, 2020Assignee: Shanghai Hode Information Technology Co., Ltd.Inventors: Yi Xu, Fan Lan
-
Patent number: 10448073Abstract: The present invention discloses a popping-screen push system which includes: a popping-screen server which receives a text or image information, transfer it into a popping-screen message, stores and manages the popping-screen message, and adds it into a broadcast request; a broadcasting server which receives a broadcast request from the popping-screen server and sends out the popping-screen message in the broadcast request in real time; a popping-screen player which receives the popping-screen message from the broadcast server, downloads and plays the popping-screen. The present invention is provided with a broadcasting server, and provides identification codes for respective popping-screen messages, videos, and popping-screen players. Thus, it is convenient for popping-screen management and thereby realizes a high efficiency of polling for users and the popping-screens.Type: GrantFiled: July 28, 2017Date of Patent: October 15, 2019Assignee: Shanghai Hode Information Technology Co., Ltd.Inventors: Fan Lan, Yuxing Wang
-
Publication number: 20190235021Abstract: A test apparatus for testing electrical parameters of a target chip, the apparatus including: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.Type: ApplicationFiled: April 8, 2019Publication date: August 1, 2019Applicant: Semitronix CorporationInventor: Fan LAN
-
Publication number: 20190235022Abstract: An address register includes a plurality of edge-triggered flip-flop registers having an input D, an input R, an input CK, and an output Q; a counter logic; a shifter logic; a multiplexer; input ports including a reset signal RST, a clock signal CLK, a shift enable signal SE, a shift data input signal SI; an output port including address signals ADDR. D is coupled to a data output of the multiplexer; R is coupled to a reset (RST) pad; CK is coupled to a clock (CLK) pad; Q is coupled to an address (ADDR) pad; an input of the counter logic is coupled to ADDR; an input of the shifter logic is coupled to ADDR and the shift data input signal SI; an input of the multiplexer is coupled to SE, an output of the counter logic, and an output of the shifter logic.Type: ApplicationFiled: April 8, 2019Publication date: August 1, 2019Applicant: Semitronix CorporationInventor: Fan LAN
-
Patent number: 10254339Abstract: To improve test efficiency of addressable test chips, an addressable test chip test system includes a test equipment, a probe card and an addressable test chip, the test equipment connects to the addressable test chip through the probe card to constitute a test path, the test system includes a new type of address register, which can provide two test modes for users according to user's needs. A new type of high density addressable test chip can accommodate DUTs of more than 1000/mm2.Type: GrantFiled: December 29, 2017Date of Patent: April 9, 2019Assignee: Semitronix CorporationInventors: Fan Lan, Shenzhi Yang, Yongjun Zheng, Weiwei Pan
-
Publication number: 20180188324Abstract: To improve test efficiency of addressable test chips, an addressable test chip test system includes a test equipment, a probe card and an addressable test chip, the test equipment connects to the addressable test chip through the probe card to constitute a test path, the test system includes a new type of address register, which can provide two test modes for users according to user's needs. A new type of high density addressable test chip can accommodate DUTs of more than 1000/mm2.Type: ApplicationFiled: December 29, 2017Publication date: July 5, 2018Applicant: Semitronix CorporationInventors: Fan LAN, Shenzhi YANG, YONGJUN ZHENG, WEIWEI PAN
-
Publication number: 20180035143Abstract: The present invention discloses a popping-screen push system which includes: a popping-screen server which receives a text or image information, transfer it into a popping-screen message, stores and manages the popping-screen message, and adds it into a broadcast request; a broadcasting server which receives a broadcast request from the popping-screen server and sends out the popping-screen message in the broadcast request in real time; a popping-screen player which receives the popping-screen message from the broadcast server, downloads and plays the popping-screen. The present invention is provided with a broadcasting server, and provides identification codes for respective popping-screen messages, videos, and popping-screen players. Thus, it is convenient for popping-screen management and thereby realizes a high efficiency of polling for users and the popping-screens.Type: ApplicationFiled: July 28, 2017Publication date: February 1, 2018Inventors: Fan LAN, Yuxing WANG
-
Publication number: 20170264585Abstract: Techniques for displaying comment information are described herein. A method includes playing the target video, displaying the comments information associated with a video when said video is being played, displaying the social functions corresponding to said specific comment information when receiving the selection command corresponding to the specific comments information currently displayed, receiving the social information sending command corresponding to said social functions, obtaining the command inputted by the user on said social function panel, displaying said command corresponding to said specific comments information, and sending the server a request to add said command of said specific comments information so that said server will add said command into the comments information of said target video and record said command as the social information of said specific comments information. This invention allows the user to use more social functions when using the comments.Type: ApplicationFiled: March 10, 2017Publication date: September 14, 2017Inventors: Yi XU, Fan LAN
-
Publication number: 20170264662Abstract: This invention relates generally to the video stream of the comment data and more particularly to the method and apparatus for the transmission of the video stream of the comment data. A method comprising: receiving content data associated with a presentation of a content item, wherein the content data comprises attribute information corresponding to the content data; receiving comment data, wherein the comment data comprises a plurality of comment data segments and attribute information corresponding to the plurality of comment data segments; integrating the plurality of comment data segments into the content data based on their respective attribute information and generating an integrated data stream; and transmitting, to a client computing device, the integrated data stream, saving the bandwidth required by decoding and greatly unleashing the decoding speed of the comment data video; improving the viewability of the comment data; enhanced the adaptability of advanced comments.Type: ApplicationFiled: March 10, 2017Publication date: September 14, 2017Inventors: Yi XU, Fan LAN
-
Publication number: 20100118440Abstract: A cage adapted to carry a plurality of disc drives and fix the disc drives within a case of a computer host is provided. The computer host has a mother board. The disc drives are spread horizontally within the cage, so that the disc drives are hung above the mother board.Type: ApplicationFiled: December 29, 2008Publication date: May 13, 2010Applicant: INVENTEC CORPORATIONInventors: Fan-Lan Qu, Shi-Feng Wang, Tsai-Kuei Cheng