Abstract: A memory driving device includes a first switch, a voltage detecting circuit, and a switch array. The first switch includes a first output terminal and a first control terminal, and the first output terminal provides an output voltage for a memory unit. The voltage detecting circuit is coupled to the first output terminal, and configured to detect the output voltage, and generates a control signal according to the output voltage, wherein the control signal changes in real time according to the changing of the output voltage. The switch array includes a plurality of second switches, and the second switches are coupled to the first control terminal. At least one of the second switches is turned on according to the control signal so as to adjust a voltage of the first control terminal for regulating a waveform of the output voltage.

Abstract: A memory device includes a memory array, write drivers and a controller. The memory array includes a plurality of memory units respectively arranged in a plurality of bit lines. The write drivers generate a plurality of write bit signals respectively inputted to the bit lines. The controller provides a voltage mode control signal and a current mode control signal. The controller is electrically coupled to the write drivers. Each of the write drivers generates a respective write bit signal of each of the write drivers according to the voltage mode control signal and the current mode control signal. When each of the memory units is in a set state, the controller outputs the voltage mode control signal and the current mode control signal to the write drivers. When each of the memory units is in a reset state, the controller outputs the voltage mode control signal to the write drivers.

Abstract: A memory device includes a memory array, write drivers and a controller. The memory array includes a plurality of memory units respectively arranged in a plurality of bit lines. The write drivers generate a plurality of write bit signals respectively inputted to the bit lines. The controller provides a voltage mode control signal and a current mode control signal. The controller is electrically coupled to the write drivers. Each of the write drivers generates a respective write bit signal of each of the write drivers according to the voltage mode control signal and the current mode control signal. When each of the memory units is in a set state, the controller outputs the voltage mode control signal and the current mode control signal to the write drivers. When each of the memory units is in a reset state, the controller outputs the voltage mode control signal to the write drivers.

Abstract: A memory driving device includes a first switch, a voltage detecting circuit, and a switch array. The first switch includes a first output terminal and a first control terminal, and the first output terminal provides an output voltage for a memory unit. The voltage detecting circuit is coupled to the first output terminal, and configured to detect the output voltage, and generates a control signal according to the output voltage, wherein the control signal changes in real time according to the changing of the output voltage. The switch array includes a plurality of second switches, and the second switches are coupled to the first control terminal. At least one of the second switches is turned on according to the control signal so as to adjust a voltage of the first control terminal for regulating a waveform of the output voltage.

Abstract: A memory device includes a memory array, a bit line driving circuit, a word line driving circuit, a read/write circuit, a controller, and a reference driving circuit. The memory array includes several memory units. The bit line driving circuit is configured to interpret a memory bit address and to drive a bit line. The word line driving circuit is configured to interpret a memory word address and to drive a word line. The read/write circuit is configured to read, set, or reset the memory units. The controller is configured to switch the memory array to work in a single memory unit mode or a dual memory unit mode. The reference driving circuit is configured to drive a reference line, wherein the reference line comprises several reference units, and the reference line and the reference units are located in the memory array.

Abstract: A memory device includes a memory array, a bit line driving circuit, a word line driving circuit, a read/write circuit, a controller, and a reference driving circuit. The memory array includes several memory units. The bit line driving circuit is configured to interpret a memory bit address and to drive a bit line. The word line driving circuit is configured to interpret a memory word address and to drive a word line. The read/write circuit is configured to read, set, or reset the memory units. The controller is configured to switch the memory array to work in a single memory unit mode or a dual memory unit mode. The reference driving circuit is configured to drive a reference line, wherein the reference line comprises several reference units, and the reference line and the reference units are located in the memory array.

Abstract: A memory driving device includes a first switch, a voltage detecting circuit, and a switch array. The first switch includes a first output terminal and a first control terminal, and the first output terminal provides an output voltage for a memory unit. The voltage detecting circuit is coupled to the first output terminal, and configured to detect the output voltage, and generates a control signal according to the output voltage, wherein the control signal changes in real time according to the changing of the output voltage. The switch array includes a plurality of second switches, and the second switches are coupled to the first control terminal. At least one of the second switches is turned on according to the control signal so as to adjust a voltage of the first control terminal for regulating a waveform of the output voltage.

Abstract: A memory device includes first and second memory arrays, first and second bit line driving circuits, first and second word line driving circuits, a read/write circuit, a controller, and first and second reference driving circuits. The first and second memory arrays include several memory units. The first and second bit line driving circuits are configured to interpret a memory bit address and drive a bit line. The first and second word line driver circuits are configured to interpret the memory word address and drive the word line. The read/write circuit is configured to read, set or reset the memory units. The controller is configured to switch the first and second memory arrays to work in a single memory unit mode or a dual memory unit mode. The first and second reference driving circuits are configured to drive reference rows.

Abstract: A memory driving circuit is disclosed herein. The memory driving circuit includes a programmable current source, a reference voltage generation unit and a voltage comparator unit, The programmable current source generates a second current according to a first current. The second current flows into a memory cell, and produces a device voltage at the input of the memory cell. The reference voltage generation unit generates a crystal voltage. The voltage comparator unit compares the device voltage with the crystal voltage and sends out a control signal to control the programmable current source. The first current and the second current are adjusted by the control signal so that the shape of the current pulse of SET operation to the memory cell is well controlled.

Abstract: A memory driving circuit is disclosed herein. The memory driving circuit includes a programmable current source, a reference voltage generation unit and a voltage comparator unit, The programmable current source generates a second current according to a first current. The second current flows into a memory cell, and produces a device voltage at the input of the memory cell. The reference voltage generation unit generates a crystal voltage. The voltage comparator unit compares the device voltage with the crystal voltage and sends out a control signal to control the programmable current source. The first current and the second current are adjusted by the control signal so that the shape of the current pulse of SET operation to the memory cell is well controlled.

Abstract: A non-volatile memory cell and a non-volatile memory device are provided. The non-volatile memory cell includes a latch structure, a first read/write circuit, a first memristor, a second read/write circuit and a second memristor. The first read/write circuit controls a writing operation of the first memristor. The second read/write circuit controls a writing operation of the second memristor. When a restore operation is performed, the data in the latch structure is restored by using the resistance difference between the first memristor and the second memristor. The non-volatile device of the invention combines the advantages of fast memory unit and non-volatile memory, and it may work at a high speed and retain data when powered off.

Abstract: A non-volatile memory device includes plural non-memory cells. Each non-volatile memory cell includes a first switch, a first memristor, a second switch, a second memristor and a third switch. The control terminal of the first switch is coupled to a word line. The first memristor is provided with a first impedance. The control terminal of the second switch is coupled to the word line. The second memristor is provided with a second impedance. The first switch, the first memristor, the second switch and the second memristor are serially connected between a bit line and an inverted bit line in an alternate manner. The third switch is used for configuring the first impedance and the second impedance. The non-volatile memory device provided by the disclosure has a characteristic of quick access and the data stored therein does not require a dynamic update.

Abstract: A non-volatile memory cell and a non-volatile memory device are provided. The non-volatile memory cell includes a latch structure, a first read/write circuit, a first memristor, a second read/write circuit and a second memristor. The first read/write circuit controls a writing operation of the first memristor. The second read/write circuit controls a writing operation of the second memristor. When a restore operation is performed, the data in the latch structure is restored by using the resistance difference between the first memristor and the second memristor. The non-volatile device of the invention combines the advantages of fast memory unit and non-volatile memory, and it may work at a high speed and retain data when powered off.

Abstract: A memory driving circuit includes a current source configured to output a second current, a first switching unit configured to undergo switching to connect to the current source selectively to output the second current, a voltage generating unit configured to provide a reference voltage, a capacitive energy storage unit configured to store energy according to the reference voltage, a third switching unit configured to undergo switching to connect the voltage generating unit and the capacitive energy storage unit selectively, a second switching unit configured to undergo switching to connect the capacitive energy storage unit selectively to output a third current, and a current output terminal configured to output the second current, the third current, or the sum of the second current and the third current.

Abstract: A non-volatile storage device adopt memristors to store data and uses fewer transistors to realize the same circuit function, whereby to decrease the chip area and reduce the time and energy spent in initiating the device. Further, the non-volatile storage device disposes appropriate electronic elements in the spacing between adjacent memristors to meet the layout design rule and achieve high space efficiency in the chip lest the space between memristors be wasted.

Abstract: A differential circuit system is provided. The differential circuit system includes: a different circuit set including a plurality of differential circuits, a voltage regulator, and a current drainage circuit set. The differential circuits are electrically connected between a first node and a second node, and each differential circuit generates a current flowing from the first node to the second node. A high voltage is provided to the first node and a low voltage is provided to the second node. The first node receives an external voltage. According to the first voltage, the voltage regulator generates the low voltage. The low voltage is provided to the second node. The current drainage circuit set generates a drainage current in between the second node and a ground voltage. A superposed current flowing to the voltage regulator is difference of the summation of currents minus the conducting current.

Abstract: A differential circuit system is provided. The differential circuit system includes: a different circuit set including a plurality of differential circuits, a voltage regulator, and a current drainage circuit set. The differential circuits are electrically connected between a first node and a second node, and each differential circuit generates a current flowing from the first node to the second node. A high voltage is provided to the first node and a low voltage is provided to the second node. The first node receives an external voltage. According to the first voltage, the voltage regulator generates the low voltage. The low voltage is provided to the second node. The current drainage circuit set generates a drainage current in between the second node and a ground voltage. A superposed current flowing to the voltage regulator is difference of the summation of currents minus the conducting current.

Abstract: The invention provides systems and methods for ESD protection for an integrated circuit (IC) having multi-power domains. The IC comprises a first device in a first power domain having a first power line and a first ground line and a second device in a second power domain having a second power line and a second ground line. A clamp circuit having a first node and a second node is coupled to the first device and the second device to provide cross-domain protection. Alternatively, two clamp circuits are used to couple with the first device and the second device to provide cross-domain ESD protection.