Patents by Inventor Fang Jao

Fang Jao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Built-in test circuit and method
    Patent number: 8773930
    Abstract: A method of testing a semiconductor memory includes performing a first test of a first type prior to packaging the semiconductor memory. The first test of the first type includes generating a first plurality of addresses, decoding the first plurality of addresses to generate a second plurality of decoded addresses at a first decoder, and activating one of a plurality of rows or a plurality of columns of the semiconductor memory based on the second plurality of decoded addresses. The semiconductor memory is packaged after performing the first test of the first type.
    Type: Grant
    Filed: February 3, 2012
    Date of Patent: July 8, 2014
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Tzu-Kuei Lin, Hung-Jen Liao, Yen-Huei Chen, Fang Jao
  • BUILT-IN TEST CIRCUIT AND METHOD
    Publication number: 20130201776
    Abstract: A method of testing a semiconductor memory includes performing a first test of a first type prior to packaging the semiconductor memory. The first test of the first type includes generating a first plurality of addresses, decoding the first plurality of addresses to generate a second plurality of decoded addresses at a first decoder, and activating one of a plurality of rows or a plurality of columns of the semiconductor memory based on the second plurality of decoded addresses. The semiconductor memory is packaged after performing the first test of the first type.
    Type: Application
    Filed: February 3, 2012
    Publication date: August 8, 2013
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Tzu-Kuei LIN, Hung-Jen Liao, Yen-Huei Chen, Fang Jao