Patents by Inventor Fangfang Ren

Fangfang Ren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • In-situ testing system for semiconductor device in aerospace irradiation environment
    Patent number: 12146908
    Abstract: The present invention discloses an in-situ testing system for semiconductor device in aerospace irradiation environment. The present invention includes a static testing unit, a static testing channel, a dynamic testing unit, a dynamic testing channel, and a channel switching control unit; the static testing unit is connected to the device under test through the static testing channel, and is used to output static testing signals and display the static testing data of the device under test; the dynamic testing unit is connected to the device under test through the dynamic testing channel, and is used to output dynamic testing signals and display the dynamic testing data of the device under test; the channel switching control unit is connected to the static testing channel and the dynamic testing channel, respectively. This invention can achieve static, dynamic, and degradation testing of third-generation semiconductor device in aerospace irradiation environment.
    Type: Grant
    Filed: April 10, 2024
    Date of Patent: November 19, 2024
    Assignee: NANJING UNIVERSITY
    Inventors: Feng Zhou, Wenfeng Wang, Hai Lu, Weizong Xu, Dong Zhou, Fangfang Ren