Patents by Inventor Fangzhou Cheng

Fangzhou Cheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11448570
    Abstract: One embodiment can provide a system for detecting anomaly for high-dimensional sensor data associated with one or more machines. During operation, the system can obtain sensor data from a set of sensor associated with one or machines, apply data exploration techniques on the sensor data to automatically process sensor data to identify a subset of feature sensors from the available set of feature sensors, apply an unsupervised machine-learning technique to the identified subset of feature sensors and the target sensor to learn a set of pair-wise univariate models, and determine whether and how an anomaly occurs in the operation of the one or more machines based on the set of pair-wise univariate models.
    Type: Grant
    Filed: June 4, 2019
    Date of Patent: September 20, 2022
    Assignees: Palo Alto Research Center Incorporated, Panasonic Holdings Corporation
    Inventors: Deokwoo Jung, Fangzhou Cheng, Ajay Raghavan, Yukinori Sasaki, Akira Minegishi, Tetsuyoshi Ogura, Yosuke Tajika
  • Publication number: 20220101191
    Abstract: Systems, methods, and apparatuses for providing a device health service are described. In some examples, a method includes receiving a request to perform a model transfer to generate a model to use on previously unseen data; receiving previously unseen data; determining a previously seen feature data most closely resembles the received previously unseen data; mapping, using the determined previously seen feature, the previously unseen data to labels; training a model using the mapped labels and the previously unseen data; and performing inference using the trained model.
    Type: Application
    Filed: September 30, 2020
    Publication date: March 31, 2022
    Inventors: Karim HELWANI, Arvindh KRISHNASWAMY, Fangzhou CHENG, Ritwik GIRI, Mehmet Umut ISIK, Aparna PANDEY, Srikanth Venkata TENNETI
  • Publication number: 20220101193
    Abstract: Systems, methods, and apparatuses for selecting a model are described. In some examples, a method of selecting a model includes receiving a request to perform model selection; evaluating a plurality of models to select model by: generating a plurality of metrics for each of the trained plurality of models, the plurality of metrics including at least two of an forewarning time metric of how much in advance of a failure an alert can be raised by the model, event recall metric of how many failure events were alerted to in advance of failure, an event precision metric of a ratio of true and false positives, and an area under a receiver operating characteristic (ROC) curve, calculating, for each of the trained plurality of models, a weighted harmonic mean from the at least two metrics, and selecting one of plurality of models based on the calculated weighted harmonic means; and generating and providing a report regarding the selected trained model.
    Type: Application
    Filed: September 30, 2020
    Publication date: March 31, 2022
    Inventors: Karim HELWANI, Srikanth Venkata TENNETI, Arvindh KRISHNASWAMY, Ritwik GIRI, Mehmet Umut ISIK, Aparna PANDEY, Fangzhou CHENG
  • Publication number: 20220101270
    Abstract: Systems, methods, and apparatuses for detecting anomalies using clusters are described. In some examples, a method includes receiving a request to perform anomaly detection using a plurality of clusters; receiving a data point; determining when the received data point is a part of one of the plurality of clusters utilizing a distance to centers of the one or more clusters, wherein: when the received data point is determined to belong to a normal cluster, assigning the received data point to the determined cluster, updating the cluster, and updating a history for the cluster, when the received data point is determined to belong to an anomalous cluster, raising an anomaly, updating the cluster, and updating a history for the cluster, and when the received data point is determined to not belong to any cluster, raising an anomaly.
    Type: Application
    Filed: September 30, 2020
    Publication date: March 31, 2022
    Inventors: Srikanth Venkata Tenneti, Arvindh Krishnaswamy, Karim Helwani, Mehmet Umut Isik, Ritwik Giri, Fangzhou Cheng, Aparna Pandey
  • Patent number: 11220999
    Abstract: One embodiment provides a system for facilitating fault diagnosis. During operation, the system collects current signals associated with a physical object which comprises a rotating machine. The system demodulates the collected signals to obtain current envelope signals, which eliminates fundamental frequencies and retains fault-related frequencies. The system resamples the current envelope signals, which converts the fault-related frequencies to constant frequency components. The system enlarges, by a fault-amplifying convolution layer, the resampled envelope signals to obtain fault information. The system provides the fault information as input to a deep convolutional neural network (CNN). The system generates, by the deep CNN, an output which comprises the fault diagnosis for the physical object.
    Type: Grant
    Filed: September 2, 2020
    Date of Patent: January 11, 2022
    Assignee: Palo Alto Research Center Incorporated
    Inventor: Fangzhou Cheng
  • Patent number: 11125653
    Abstract: One embodiment can provide a system for detecting faults in a machine. During operation, the system can obtain a dynamic signal associated with the machine, apply one or more signal-processing techniques to the dynamic signal to obtain frequency, amplitude, and/or time-frequency information associated with the dynamic signal, extract motion-insensitive features from the obtained frequency, amplitude, and/or time-frequency information associated with the dynamic signal, and determine whether a fault occurs in the machine based on the extracted features.
    Type: Grant
    Filed: October 11, 2018
    Date of Patent: September 21, 2021
    Assignee: PALO ALTO RESEARCH CENTER INCORPORATED
    Inventors: Fangzhou Cheng, Ajay Raghavan, Deokwoo Jung
  • Publication number: 20200386656
    Abstract: One embodiment can provide a system for detecting anomaly for high-dimensional sensor data associated with one or more machines. During operation, the system can obtain sensor data from a set of sensor associated with one or machines, apply data exploration techniques on the sensor data to automatically process sensor data to identify a subset of feature sensors from the available set of feature sensors, apply an unsupervised machine-learning technique to the identified subset of feature sensors and the target sensor to learn a set of pair-wise univariate models, and determine whether and how an anomaly occurs in the operation of the one or more machines based on the set of pair-wise univariate models.
    Type: Application
    Filed: June 4, 2019
    Publication date: December 10, 2020
    Applicants: Palo Alto Research Center Incorporated, Panasonic Corporation
    Inventors: Deokwoo Jung, Fangzhou Cheng, Ajay Raghavan, Yukinori Sasaki, Akira Minegishi, Tetsuyoshi Ogura, Yosuke Tajika
  • Publication number: 20200116594
    Abstract: One embodiment can provide a system for detecting faults in a machine. During operation, the system can obtain a dynamic signal associated with the machine, apply one or more signal-processing techniques to the dynamic signal to obtain frequency, amplitude, and/or time-frequency information associated with the dynamic signal, extract motion-insensitive features from the obtained frequency, amplitude, and/or time-frequency information associated with the dynamic signal, and determine whether a fault occurs in the machine based on the extracted features.
    Type: Application
    Filed: October 11, 2018
    Publication date: April 16, 2020
    Applicant: Palo Alto Research Center Incorporated
    Inventors: Fangzhou Cheng, Ajay Raghavan, Deokwoo Jung