Patents by Inventor Fatima Frakso

Fatima Frakso has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for in situ stress measurement within a thin film upon its deposition on a substrate
    Patent number: 5745240
    Abstract: In situ stress measurement is carried out within a thin film upon its deposition on a substrate. The substrate is supported on a rotatable collective holder having a plurality of sites therefor and the thin film is deposited in the course of rotation of the collective holder. An individual holder is provided for carrying a test sample at one of a plurality of sites on the collective holder. A sensor is adapted to measure deformation of the test sample, thereby to determine the stress within the film deposited along the test sample and hence the stress within the film deposited on the substrate.
    Type: Grant
    Filed: June 3, 1996
    Date of Patent: April 28, 1998
    Assignee: Essilor International Compagnie Generale d'Optique
    Inventors: Fatima Frakso, Richard Bosmans, Luc Nouvelot