Abstract: A microelectromechanical gyroscope includes a die of semiconductor material forming a substrate and a detection structure suspended over the substrate. The detection structure has a main extension in a horizontal plane, is symmetrical with respect to a central axis of symmetry, and is provided, for each gyroscope detection axis, with: a first pair of detection masses arranged on a first side of the central axis of symmetry; and a second pair of detection masses arranged on a second side of the central axis of symmetry, opposite to the first side in the horizontal plane. The detection masses of each pair are capacitively coupled to respective stator electrodes according to a differential detection scheme. The stator electrodes are arranged symmetrically with respect to one another on opposite sides of the central axis of symmetry.

Abstract: Microelectromechanical device comprising a supporting body, containing semiconductor material and a movable mass, constrained to the supporting body with a relative degree of freedom with respect to at least one motion direction, within a range of admissible positions. The device also comprises stopper elements, operable by the movable mass due to movements along the at least one motion direction and configured to apply stop forces to opposite sides of the movable mass, transversely to the at least one motion direction, when the movable mass reaches a respective endpoint of the range of admissible positions, so as to prevent the movable mass from exceeding the respective endpoint.

Abstract: A surface-consistent refraction analysis method to automatically derive near surface corrections for seismic data processing. The method uses concepts from surface-consistent analysis applied to refracted arrivals. The method includes the use of CMP-offset-azimuth binning, evaluation of mean travel time and standard deviation for each bin, rejection of anomalous first break (FB) picks, derivation of CMP-based travel time-offset functions, conversion to velocity-depth functions, evaluation of long wavelength statics and calculation of surface-consistent residual statics through waveform cross-correlation. Residual time lags are evaluated in multiple CMP-offset-azimuth bins by similarity analysis with a pilot trace for all the other traces in the gather where the correlation window is centered at the refracted arrival. The similarity analysis may take the form of computerized cross-correlation, or other criteria such as semblance.