Abstract: A memory management method and apparatus, and a computing device are disclosed. The method is executed by a GMEM system. After receiving a physical memory range, memory management unit operations, and an accelerator device address of an accelerator device, the GMEM system configures a memory management unit operations interface for the accelerator device. This allows a device in which the GMEM system is located to manage a memory management unit and physical memory of the accelerator device by using a driver of the accelerator device through the memory management unit operations interface of the accelerator device, to read and write data. The GMEM system in this application expands a native memory management interface of an operating system into a heterogeneous memory management interface.

Abstract: This application provides a memory fault processing method: a faulty first storage cell is determined, the first storage cell is isolated, a pressure test is performed on the first storage cell to obtain a fault level of the first storage cell, and a corresponding operation is performed on the first storage cell based on the fault level of the first storage cell, where when the fault level of the first storage cell indicates that the first storage cell is at a first risk level, the operation performed on the first storage cell includes de-isolating the first storage cell. After a faulty storage cell is isolated, a pressure test may be performed on the storage cell to obtain a real fault level of the storage cell. When the fault level of the first storage cell is the first risk level, the first storage cell may continue to be used.

Abstract: A capacitive proximity measurement system may include a sensor electrode configured to be positioned proximate to a conductive measurement area on a test surface of a sample, a plate connector configured to provide an electrical connection between a system ground and a conductive plate parallel to the test surface, and a controller. A measurement circuit may be formed between the sensor electrode and the conductive plate, where the test surface is electrically floating with respect to the sensor electrode and the conductive plate. The controller may further adjust a voltage of the sensor electrode with respect to the conductive plate, determine a capacitance associated with the measurement circuit, and determine a distance between the electrode and the measurement area based on the capacitance associated with the measurement circuit.

Abstract: A capacitive proximity measurement system may include a sensor electrode configured to be positioned proximate to a conductive measurement area on a test surface of a sample, a plate connector configured to provide an electrical connection between a system ground and a conductive plate parallel to the test surface, and a controller. A measurement circuit may be formed between the sensor electrode and the conductive plate, where the test surface is electrically floating with respect to the sensor electrode and the conductive plate. The controller may further adjust a voltage of the sensor electrode with respect to the conductive plate, determine a capacitance associated with the measurement circuit, and determine a distance between the electrode and the measurement area based on the capacitance associated with the measurement circuit.