Patents by Inventor Felice de Jong

Felice de Jong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method to correct ion source inefficiencies makes sample-to-sample normalization possible
    Patent number: 11977008
    Abstract: In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that once corrected for ion losses, a sample-to-sample normalization of the analytical sample to the internal standard is possible. By normalizing to a standard sample the analytical sample becomes completely comparable to any similarly treated sample.
    Type: Grant
    Filed: June 15, 2022
    Date of Patent: May 7, 2024
    Assignee: IROA TECHNOLOGIES, LLC.
    Inventors: Christopher William Ward Beecher, Felice de Jong
  • METHOD TO CORRECT ION SOURCE INEFFICIENCIES MAKES SAMPLE-TO-SAMPLE NORMALIZATION POSSIBLE
    Publication number: 20220317000
    Abstract: In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that once corrected for ion losses, a sample-to-sample normalization of the analytical sample to the internal standard is possible. By normalizing to a standard sample the analytical sample becomes completely comparable to any similarly treated sample.
    Type: Application
    Filed: June 15, 2022
    Publication date: October 6, 2022
    Applicant: IROA Technologies LLC
    Inventors: Christopher William Ward Beecher, Felice de Jong
  • Method to correct ion source inefficiencies makes sample-to-sample normalization possible
    Patent number: 11371918
    Abstract: In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that once corrected for ion losses, a sample-to-sample normalization of the analytical sample to the internal standard is possible. By normalizing to a standard sample the analytical sample becomes completely comparable to any similarly treated sample.
    Type: Grant
    Filed: June 24, 2019
    Date of Patent: June 28, 2022
    Assignee: Iroa Technologies, LLC
    Inventors: Christopher William Ward Beecher, Felice de Jong
  • METHOD TO CORRECT ION SOURCE INEFFICIENCIES MAKES SAMPLE-TO-SAMPLE NORMALIZATION POSSIBLE
    Publication number: 20190391054
    Abstract: In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that once corrected for ion losses, a sample-to-sample normalization of the analytical sample to the internal standard is possible. By normalizing to a standard sample the analytical sample becomes completely comparable to any similarly treated sample.
    Type: Application
    Filed: June 24, 2019
    Publication date: December 26, 2019
    Inventors: Christopher William Ward Beecher, Felice de Jong