Abstract: A method and a system for analyzing distinct light or radiation sources affecting a scene are provided. The method may include: sensing at least one image of a scene containing surfaces and objects, wherein the scene is illuminated by at least one distinct radiation or source; maintaining a database of the scene which stores approximate positions of at least some of the objects in the scene; identifying at least one candidate silhouette suspected to be cast by the at least one distinct light or radiation source, deriving properties of the at least one distinct light or radiation source, based on the at least one identified silhouette, based on data derived from the database.

Abstract: Methods and a system for identifying reflective surfaces in a scene are provided herein. The system may include a sensing device configured to capture a scene. The system may further include a storage device configured to store three-dimensional positions of at least some of the objects in the scene. The system may further include a computer processor configured to attempt to obtain a reflective surface representation for one or more candidate surfaces selected from the surfaces in the scene. In a case that the attempted obtaining is successful, computer processor is further configured to determine that the candidate reflective surface is indeed a reflective surface defined by the obtained surface representation. According to some embodiments of the present invention, in a case the attempted calculation is unsuccessful, determining that the recognized portion of the object is an object that is independent of the stored objects.

Abstract: Methods and a system for identifying reflective surfaces in a scene are provided herein. The system may include a sensing device configured to capture a scene. The system may further include a storage device configured to store three-dimensional positions of at least some of the objects in the scene. The system may further include a computer processor configured to attempt to obtain a reflective surface representation for one or more candidate surfaces selected from the surfaces in the scene. In a case that the attempted obtaining is successful, computer processor is further configured to determine that the candidate reflective surface is indeed a reflective surface defined by the obtained surface representation. According to some embodiments of the present invention, in a case the attempted calculation is unsuccessful, determining that the recognized portion of the object is an object that is independent of the stored objects.

Abstract: A method and a system for analyzing distinct light or radiation sources affecting a scene are provided. The method may include: sensing at least one image of a scene containing surfaces and objects, wherein the scene is illuminated by at least one distinct radiation or source; maintaining a database of the scene which stores approximate positions of at least some of the objects in the scene; identifying at least one candidate silhouette suspected to be cast by the at least one distinct light or radiation source, deriving properties of the at least one distinct light or radiation source, based on the at least one identified silhouette, based on data derived from the database.

Abstract: Methods and a system for identifying reflective surfaces in a scene are provided herein. The system may include a sensing device configured to capture a scene. The system may further include a storage device configured to store three-dimensional positions of at least some of the objects in the scene. The system may further include a computer processor configured to attempt to obtain a reflective surface representation for one or more candidate surfaces selected from the surfaces in the scene. In a case that the attempted obtaining is successful, computer processor is further configured to determine that the candidate reflective surface is indeed a reflective surface defined by the obtained surface representation. According to some embodiments of the present invention, in a case the attempted calculation is unsuccessful, determining that the recognized portion of the object is an object that is independent of the stored objects.

Abstract: A method and a system for analyzing distinct light or radiation sources affecting a scene are provided. The method may include: sensing at least one image of a scene containing surfaces and objects, wherein the scene is illuminated by at least one distinct radiation or source; maintaining a database of the scene which stores approximate positions of at least some of the objects in the scene; identifying at least one candidate silhouette suspected to be cast by the at least one distinct light or radiation source, deriving properties of the at least one distinct light or radiation source, based on the at least one identified silhouette, based on data derived from the database.

Abstract: Methods and a system for identifying reflective surfaces in a scene are provided herein. The system may include a sensing device configured to capture a scene. The system may further include a storage device configured to store three-dimensional positions of at least some of the objects in the scene. The system may further include a computer processor configured to attempt to obtain a reflective surface representation for one or more candidate surfaces selected from the surfaces in the scene. In a case that the attempted obtaining is successful, computer processor is further configured to determine that the candidate reflective surface is indeed a reflective surface defined by the obtained surface representation. According to some embodiments of the present invention, in a case the attempted calculation is unsuccessful, determining that the recognized portion of the object is an object that is independent of the stored objects.

Abstract: Methods and a system for identifying reflective surfaces in a scene are provided herein. The system may include a sensing device configured to capture a scene. The system may further include a storage device configured to store three-dimensional positions of at least some of the objects in the scene. The system may further include a computer processor configured to attempt to obtain a reflective surface representation for one or more candidate surfaces selected from the surfaces in the scene. In a case that the attempted obtaining is successful, computer processor is further configured to determine that the candidate reflective surface is indeed a reflective surface defined by the obtained surface representation. According to some embodiments of the present invention, in a case the attempted calculation is unsuccessful, determining that the recognized portion of the object is an object that is independent of the stored objects.

Abstract: A method and a system for analyzing distinct light or radiation sources affecting a scene are provided. The method may include: sensing at least one image of a scene containing surfaces and objects, wherein the scene is illuminated by at least one distinct radiation or source; maintaining a database of the scene which stores approximate positions of at least some of the objects in the scene; identifying at least one candidate silhouette suspected to be cast by the at least one distinct light or radiation source, deriving properties of the at least one distinct light or radiation source, based on the at least one identified silhouette, based on data derived from the database.

Abstract: A method and a system for analyzing distinct light or radiation sources affecting a scene are provided. The method may include: sensing at least one image of a scene containing surfaces and objects, wherein the scene is illuminated by at least one distinct radiation or source; maintaining a database of the scene which stores approximate positions of at least some of the objects in the scene; identifying at least one candidate silhouette suspected to be cast by the at least one distinct light or radiation source, deriving properties of the at least one distinct light or radiation source, based on the at least one identified silhouette, based on data derived from the database.

Abstract: A method and a system for analyzing distinct light or radiation sources affecting a scene are provided. The method may include: sensing at least one image of a scene containing surfaces and objects, wherein the scene is illuminated by at least one distinct radiation or source; maintaining a database of the scene which stores approximate positions of at least some of the objects in the scene; identifying at least one candidate silhouette suspected to be cast by the at least one distinct light or radiation source, deriving properties of the at least one distinct light or radiation source, based on the at least one identified silhouette, based on data derived from the database.

Abstract: Methods and a system for identifying reflective surfaces in a scene are provided herein. The system may include a sensing device configured to capture a scene. The system may further include a storage device configured to store three-dimensional positions of at least some of the objects in the scene. The system may further include a computer processor configured to attempt to obtain a reflective surface representation for one or more candidate surfaces selected from the surfaces in the scene. In a case that the attempted obtaining is successful, computer processor is further configured to determine that the candidate reflective surface is indeed a reflective surface defined by the obtained surface representation. According to some embodiments of the present invention, in a case the attempted calculation is unsuccessful, determining that the recognized portion of the object is an object that is independent of the stored objects.