Abstract: A spectrometer system comprises a housing provided with a window, an illumination source, a spectrometer and a standard for internal recalibration being disposed in said housing. Specific absorption bands of a filling gas present in the housing are identified in a reference spectrum, which was recorded using the standard, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the absorption bands. A test spectrum is recorded by the spectrometer using the standard. The specific absorption bands of the filling gas are identified in the test spectrum, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the specific absorption bands.

Abstract: In accordance with a method for calibrating structurally identical spectrometers for constituent analysis, a multiplicity of samples are provided and concentrations of one constituent in the individual samples are measured using a reference measuring method. Spectra of the individual samples are measured using one spectrometer selected from the structurally identical spectrometers to determine a preliminary regression model. At least one spectrum is selected from the measured spectra and/or a mean value spectrum formed from the measured spectra. A multiplicity of error spectra are generated using a mathematical model of the structurally identical spectrometers. The individual error spectra are added in each case to the individual selected spectra to obtain simulated spectra.

Abstract: A spectrometer system comprises a housing provided with a window, an illumination source, a spectrometer and a standard for internal recalibration being disposed in said housing. Specific absorption bands of a filling gas present in the housing are identified in a reference spectrum, which was recorded using the standard, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the absorption bands. A test spectrum is recorded by the spectrometer using the standard. The specific absorption bands of the filling gas are identified in the test spectrum, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the specific absorption bands.

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract: A spectrometer including an entrance slit and the production of the entrance slit. The spectrometer includes a housing, an entrance slit, and an imaging diffraction grating inside the housing for splitting and imaging the light onto an optoelectric detector. The detector is arranged inside the housing. The housing and the base plate are connected to each other by mutually cooperating positioning members. The entrance slit, the positioning members of the base plate and the holding members for receiving and mounting the detecting device are integral parts of the base plate and are produced from the base plate in a precise manner, in a suitable form and in defined mutual positions by, for example, laser cutting or liquid jet cutting. The positioning members of the base plate and/or the holding members for the detecting device can be provided as resilient elements.

Abstract: The invention relates to a spectrometric assembly and method for determining a temperature value for a detector of a spectrometer. It is conventional to record the detector temperature in an optoelectronic detector using a thermal temperature sensor in order to compensate for temperature fluctuations. Due to the finite distance between the detector and the temperature sensor, the accuracy of the temperature detection is limited. According to the invention, the detector temperature should be recordable at high accuracy and with little effort. In addition to means for spectral division of incident tight and an optical detector for spectrally resolved detection of a spectral range of the divided light, a second optical detector is provided for detection of a partial range of this spectral range as a reference detector, wherein sensitivity of the reference detector is substantially temperature-independent.

Abstract: The invention relates to an arrangement for measuring the reflectivity of the direct or scattered reflection of a sample (8), having a light source for separately lighting the sample (8) and of comparative surfaces. The arrangement comprises, in addition to the light source, preferably a reflector lamp (2), —a white standard (6), a black standard (7), and the surface of the sample (8) for embodying a measurement surface, wherein the exchange of the white standard (6), the black standard (7) and the sample (8) is provided in a prescribed sequence relative to each other, —means for measuring the intensity of the light reflected from an internal white surface (10) and for measuring the intensity of the light reflected from each measuring surface, and—an evaluation circuit designed for registering the measured intensity values and for linking the same mathematically to the reflectivity.

Abstract: The disclosure provides a device for optical spectrometry, wherein the reference beam and the measuring beam between the deflector and the detector input, in particular between the deflector output and the detector or between a device connecting the optical paths and the detector exhibit the same (the identical) etendue and the same (the identical) optical axis.

Abstract: The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monochromator spectrometer arrangements.

Abstract: The present invention is directed to an arrangement and the associated method for the compensation of the temperature dependency of detectors in spectrometers. In the solution according to the invention, the arrangement for compensation of the temperature dependency of detectors in spectrometers comprises an illumination unit, an entrance slit, an imaging grating, a detector and a controlling and evaluating unit. A second temperature gauge for the ambient temperature is provided in addition to an existing first temperature gauge and a temperature regulating unit. In the method according to the invention, a temperature regulating unit is controlled in such a way by a controlling and evaluating unit in the evaluation of the measurement values determined by two temperature gauges that the temperature of the detector remains constant.

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract: A spectrometer including an entrance slit and the production of the entrance slit. The spectrometer includes a housing, an entrance slit, and an imaging diffraction grating inside the housing for splitting and imaging the light onto an optoelectric detector. The detector is arranged inside the housing. The housing and the base plate are connected to each other by mutually cooperating positioning members. The entrance slit, the positioning members of the base plate and the holding members for receiving and mounting the detecting device are integral parts of the base plate and are produced from the base plate in a precise manner, in a suitable form and in defined mutual positions by, for example, laser cutting or liquid jet cutting. The positioning members of the base plate and/or the holding members for the detecting device can be provided as resilient elements.

Abstract: The invention is directed to an arrangement for detecting coatings which are arranged on surfaces of structural component parts or objects and for determining the chemical characteristics and surface properties of these coatings. It comprises a light source for illuminating the coating to be analyzed on the surface of the structural component part and means for imaging the light source on an entrance slit over the surface of the coating to be analyzed. The entrance slit is imaged in a wavelength-dependent manner on a two-dimensional detector unit by a grating. An evaluating unit which is electrically connected to the detector unit serves to evaluate and process the signals supplied by the exposed detector elements of the detector unit.

Abstract: The present invention is directed to a spectrometer in which the electrical and optical components are connected to one another in a compact construction. A minimal expenditure on assembly and adjustment is achieved through a small quantity of individual parts. The compact spectrometer comprises an entrance slit, an imaging grating, one or more detector elements in rows or matrices, and elements of a controlling and evaluating unit. The detector elements and the entrance slit are arranged on a shared support, the elements of the controlling and evaluating unit being arranged on the free surfaces of the support. The entrance slit and the detector elements and the imaging spherical grating recessed into the spectrometer housing are arranged symmetric to an imaginary center axis of the support. Due to its compact size and the minimized expenditure on adjustment and assembly for its manufacture, the inventive spectrometer has numerous applications.

Abstract: The invention is directed to an arrangement for detecting coatings which are arranged on surfaces of structural component parts or objects and for determining the chemical characteristics and surface properties of these coatings. It comprises a light source for illuminating the coating to be analyzed on the surface of the structural component part and means for imaging the light source on an entrance slit over the surface of the coating to be analyzed. The entrance slit is imaged in a wavelength-dependent manner on a two-dimensional detector unit by a grating. An evaluating unit which is electrically connected to the detector unit serves to evaluate and process the signals supplied by the exposed detector elements of the detector unit.

Abstract: The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monocluomator spectrometer arrangements.

Abstract: The present invention is directed to an arrangement and the associated method for the compensation of the temperature dependency of detectors in spectrometers. In the solution according to the invention, the arrangement for compensation of the temperature dependency of detectors in spectrometers comprises an illumination unit, an entrance slit, an imaging grating, a detector and a controlling and evaluating unit. A second temperature gauge for the ambient temperature is provided in addition to an existing first temperature gauge and a temperature regulating unit. In the method according to the invention, a temperature regulating unit is controlled in such a way by a controlling and evaluating unit in the evaluation of the measurement values determined by two temperature gauges that the temperature of the detector remains constant.

Abstract: In order to provide an arrangement for pressure compensation for optical devices, particularly spectrometers or the like optical devices, for compensating pressure differences caused by changes in temperature and air pressure between the internal pressure and the external pressure at a housing of an optical device enclosing optical units, which arrangement prevents a contamination of optical functional surfaces of the optical units of the optical device and ensures a constant pressure balance between the interior space and the external surroundings of the housing of an optical device with its optical units while economizing on manufacturing costs, it is proposed that the arrangement for pressure compensation comprises at least one pressure compensating element which is constructed on both sides so as to be permeable to air and which is arranged in a housing opening of the housing wall of the optical device enclosing the optical units.

Abstract: The present invention is directed to a spectrometer in which the electrical and optical components are connected to one another in a compact construction. A minimal expenditure on assembly and adjustment is achieved through a small quantity of individual parts. The compact spectrometer comprises an entrance slit, an imaging grating, one or more detector elements in rows or matrices, and elements of a controlling and evaluating unit. The detector elements and the entrance slit are arranged on a shared support, the elements of the controlling and evaluating unit being arranged on the free surfaces of the support. The entrance slit and the detector elements and the imaging spherical grating recessed into the spectrometer housing are arranged symmetric to an imaginary center axis of the support.