Patents by Inventor Feng-Cheng Chu

Feng-Cheng Chu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240178271
    Abstract: Various examples of an integrated circuit device and a method for forming the device are disclosed herein. In an example, a method includes receiving a workpiece that includes a substrate, and a device fin extending above the substrate. The device fin includes a channel region. A portion of the device fin adjacent the channel region is etched, and the etching creates a source/drain recess and forms a dielectric barrier within the source/drain recess. The workpiece is cleaned such that a bottommost portion of the dielectric barrier remains within a bottommost portion of the source/drain recess. A source/drain feature is formed within the source/drain recess such that the bottommost portion of the dielectric barrier is disposed between the source/drain feature and a remainder of the device fin.
    Type: Application
    Filed: February 5, 2024
    Publication date: May 30, 2024
    Inventors: Feng-Ching Chu, Wei-Yang Lee, Yen-Ming Chen, Feng-Cheng Yang
  • Patent number: 11937426
    Abstract: The present disclosure provides a semiconductor structure and a method for forming a semiconductor structure. The semiconductor structure includes a substrate, and a dielectric stack over the substrate. The dielectric stack includes a first layer over the substrate and a second layer over the first layer. The semiconductor structure further includes a gate layer including a first portion traversing the second layer and a second portion extending between the first layer and the second layer.
    Type: Grant
    Filed: May 3, 2021
    Date of Patent: March 19, 2024
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Feng-Ching Chu, Feng-Cheng Yang, Katherine H. Chiang, Chung-Te Lin, Chieh-Fang Chen
  • Patent number: 11917803
    Abstract: A semiconductor device according to the present disclosure includes a gate-all-around (GAA) transistor in a first device area and a fin-type field effect transistor (FinFET) in a second device area. The GAA transistor includes a plurality of vertically stacked channel members and a first gate structure over and around the plurality of vertically stacked channel members. The FinFET includes a fin-shaped channel member and a second gate structure over the fin-shaped channel member. The fin-shaped channel member includes semiconductor layers interleaved by sacrificial layers.
    Type: Grant
    Filed: July 7, 2022
    Date of Patent: February 27, 2024
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Feng-Ching Chu, Wei-Yang Lee, Feng-Cheng Yang, Yen-Ming Chen
  • Patent number: 11412201
    Abstract: A photo-detecting apparatus includes an image sensor and a 3D image generator. The image sensor having a plurality of 3D photodetectors is configured to output a raw data. The 3D image generator having a storage medium for storing a calibration data is configured to output a 3D image according to the raw data and the calibration data. The calibration data includes at least one of an IQ-mismatch calibration data, a non-linearity calibration data, a temperature calibration data and an offset calibration data.
    Type: Grant
    Filed: September 25, 2020
    Date of Patent: August 9, 2022
    Assignee: ARTILUX, INC.
    Inventors: Pai-Chuan Wu, Pai-Ting Huang, Feng-Cheng Chu, Yun-Chung Na, Chien-Lung Chen
  • Publication number: 20210099688
    Abstract: A photo-detecting apparatus includes an image sensor and a 3D image generator. The image sensor having a plurality of 3D photodetectors is configured to output a raw data. The 3D image generator having a storage medium for storing a calibration data is configured to output a 3D image according to the raw data and the calibration data. The calibration data includes at least one of an IQ-mismatch calibration data, a non-linearity calibration data, a temperature calibration data and an offset calibration data.
    Type: Application
    Filed: September 25, 2020
    Publication date: April 1, 2021
    Inventors: Pai-Chuan Wu, Pai-Ting Huang, Feng-Cheng Chu, Yun-Chung Na, Chien-Lung Chen