Patents by Inventor Fengkai KE

Fengkai KE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11823383
    Abstract: Provided are a computer system for automatically searching for a mental disorder diagnosis protocol and an method thereof that may determine at least one test region to be examined for a predetermined mental disorder diagnosis in a brain image of a patient based on a first artificial neural network, may determine a test process for the mental disorder diagnosis for the patient based on a second artificial neural network, and may provide a test protocol for the mental disorder diagnosis for the patient based on the test region and the test process. The computer system may visualize at least one of a position, a shape, a size, and an importance of the test region in the brain image. The test process may include test order of a plurality of test stages in which the brain image is to be used for the mental disorder diagnosis.
    Type: Grant
    Filed: April 13, 2021
    Date of Patent: November 21, 2023
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Sang Wan Lee, Young Ho Kang, Fengkai Ke
  • Publication number: 20220164948
    Abstract: Provided are a computer system for automatically searching for a mental disorder diagnosis protocol and an method thereof that may determine at least one test region to be examined for a predetermined mental disorder diagnosis in a brain image of a patient based on a first artificial neural network, may determine a test process for the mental disorder diagnosis for the patient based on a second artificial neural network, and may provide a test protocol for the mental disorder diagnosis for the patient based on the test region and the test process. The computer system may visualize at least one of a position, a shape, a size, and an importance of the test region in the brain image. The test process may include test order of a plurality of test stages in which the brain image is to be used for the mental disorder diagnosis.
    Type: Application
    Filed: April 13, 2021
    Publication date: May 26, 2022
    Inventors: Sang Wan LEE, Young Ho KANG, Fengkai KE