Patents by Inventor Fengyan Zhang

Fengyan Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9371226
    Abstract: Single source precursors or pre-copolymers of single source precursors are subjected to microwave radiation to form particles of a I-III-VI2 material. Such particles may be formed in a wurtzite phase and may be converted to a chalcopyrite phase by, for example, exposure to heat. The particles in the wurtzite phase may have a substantially hexagonal shape that enables stacking into ordered layers. The particles in the wurtzite phase may be mixed with particles in the chalcopyrite phase (i.e., chalcopyrite nanoparticles) that may fill voids within the ordered layers of the particles in the wurtzite phase thus produce films with good coverage. In some embodiments, the methods are used to form layers of semiconductor materials comprising a I-III-VI2 material. Devices such as, for example, thin-film solar cells may be fabricated using such methods.
    Type: Grant
    Filed: February 2, 2011
    Date of Patent: June 21, 2016
    Assignee: Battelle Energy Alliance, LLC
    Inventors: Robert V. Fox, Fengyan Zhang, Rene G. Rodriguez, Joshua J. Pak, Chivin Sun
  • Patent number: 8242482
    Abstract: An electroluminescence (EL) device and a method are provided for fabricating said device with a nanotip electrode. The method comprises: forming a bottom electrode with nanotips; forming a Si phosphor layer adjacent the nanotips; and, forming a transparent top electrode. The Si phosphor layer is interposed between the bottom and top electrodes. The nanotips may have a tip base size of about 50 nanometers, or less, a tip height in the range of 5 to 50 nm, and a nanotip density of greater than 100 nanotips per square micrometer. Typically, the nanotips are formed from iridium oxide (IrOx) nanotips. A MOCVD process forms the Ir bottom electrode. The IrOx nanotips are grown from the Ir. In one aspect, the Si phosphor layer is a SRSO layer. In response to an SRSO annealing step, nanocrystalline SRSO is formed with nanocrystals having a size in the range of 1 to 10 nm.
    Type: Grant
    Filed: March 5, 2008
    Date of Patent: August 14, 2012
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Sheng Teng Hsu, Fengyan Zhang, Gregory M. Stecker, Robert A. Barrowcliff
  • Publication number: 20120192930
    Abstract: Single source precursors or pre-copolymers of single source precursors are subjected to microwave radiation to form particles of a I-III-VI2 material. Such particles may be formed in a wurtzite phase and may be converted to a chalcopyrite phase by, for example, exposure to heat. The particles in the wurtzite phase may have a substantially hexagonal shape that enables stacking into ordered layers. The particles in the wurtzite phase may be mixed with particles in the chalcopyrite phase (i.e., chalcopyrite nanoparticles) that may fill voids within the ordered layers of the particles in the wurtzite phase thus produce films with good coverage. In some embodiments, the methods are used to form layers of semiconductor materials comprising a I-III-VI2 material. Devices such as, for example, thin-film solar cells may be fabricated using such methods.
    Type: Application
    Filed: February 2, 2011
    Publication date: August 2, 2012
    Applicant: BATTELLE ENERGY ALLIANCE, LLC
    Inventors: ROBERT V. FOX, FENGYAN ZHANG, RENE G. RODRIGUEZ, JOSHUA J. PAK, CHIVIN SUN
  • Patent number: 7905013
    Abstract: An iridium oxide (IrOx) nanowire neural sensor array and associated fabrication method are provided. The method provides a substrate with a conductive layer overlying the substrate, and a dielectric layer overlying the conductive layer. The substrate can be a material such as Si, SiO2, quartz, glass, or polyimide, and the conductive layer is a material such as ITO, SnO2, ZnO, TiO2, doped ITO, doped SnO2, doped ZnO, doped TiO2, TiN, TaN, Au, Pt, or Ir. The dielectric layer is selectively wet etched, forming contact holes with sloped walls in the dielectric layer and exposing regions of the conductive layer. IrOx nanowire neural interfaces are grown from the exposed regions of the conductive layer. The IrOx nanowire neural interfaces each have a cross-section in a range of 0.5 to 10 micrometers, and may be shaped as a circle, rectangle, or oval.
    Type: Grant
    Filed: June 4, 2007
    Date of Patent: March 15, 2011
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Fengyan Zhang, Bruce D. Ulrich, Wei Gao, Sheng Teng Hsu
  • Patent number: 7816753
    Abstract: An optical device with an iridium oxide (IrOx) electrode neural interface, and a corresponding fabrication method are provided. The method provides a substrate and forms a first conductive electrode overlying the substrate. A photovoltaic device having a first electrical interface is connected to the first electrode. A second electrical interface of the photovoltaic device is connected to a second conductive electrode formed overlying the photovoltaic device. An array of neural interface single-crystal IrOx nanostructures are formed overlying the second electrode, where x?4. The IrOx nanostructures can be partially coated with an electrical insulator, such as SiO2, SiN, TiO2, or spin on glass (SOG), leaving the IrOx distal ends exposed. In one aspect, a buffer layer is formed overlying the second electrode surface, made from a material such as LiNbO3, LiTaO3, or SA, for the purpose of orienting the growth direction of the IrOx nanostructures.
    Type: Grant
    Filed: September 29, 2008
    Date of Patent: October 19, 2010
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Fengyan Zhang, Sheng Teng Hsu
  • Patent number: 7759150
    Abstract: A nanorod sensor with a single plane of horizontally-aligned electrodes and an associated fabrication method are provided. The method provides a substrate and forms an intermediate electrode overlying a center region of the substrate. The intermediate electrode is a patterned bottom noble metal/Pt/Ti multilayered stack. TiO2 nanorods are formed over the substrate and intermediate electrode, and a TiO2 film may be formed overlying the TiO2 nanorods. The TiO2 nanorods and TiO2 film are formed in-situ, in the same process, by varying the substrate temperature. In other aspects, the TiO2 film is formed between the nanorods and the intermediate electrode. In yet another aspect, the TiO2 film is formed both above and below the nanorods. A single plane of top electrodes is formed overlying the TiO2 film from a top noble metal/Pt/Ti multilayered stack overlying the TiO2 film, which has been selectively etched to form separate top electrodes.
    Type: Grant
    Filed: May 22, 2007
    Date of Patent: July 20, 2010
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Fengyan Zhang, Bruce D. Ulrich, Wei Pan, Lawrence J. Charneski, Sheng Teng Hsu
  • Patent number: 7727897
    Abstract: A method of etching a top electrode/ferroelectric stack using an etch stop layer includes forming a first layer of a first dielectric material on a substrate; forming a bottom electrode in the first layer of a first dielectric material; depositing an etch stop layer on the first layer of the first dielectric material and the bottom electrode, including forming a hole therein; depositing a layer of ferroelectric material and depositing top electrode material on the ferroelectric material to form a top electrode/ferroelectric stack; stack etching the top electrode and ferroelectric material; depositing a layer of a second dielectric material encapsulating the top electrode and ferroelectric material; etching the layer of the second dielectric material to form a sidewall about the top electrode and ferroelectric material; and depositing a second and third layers of the first dielectric material.
    Type: Grant
    Filed: August 30, 2005
    Date of Patent: June 1, 2010
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Bruce D. Ulrich, Lisa H. Stecker, Fengyan Zhang, Sheng Teng Hsu
  • Patent number: 7645669
    Abstract: A nanotip capacitor and associated fabrication method are provided. The method provides a bottom electrode and grows electrically conductive nanotips overlying the bottom electrode. An electrically insulating dielectric is deposited overlying the nanotips, and an electrically conductive top electrode is deposited overlying dielectric-covered nanotips. Typically, the dielectric is deposited by forming a thin layer of dielectric overlying the nanotips using an atomic layer deposition (ALD) process. In one aspect, the electrically insulating dielectric covering the nanotips forms a three-dimensional interface of dielectric-covered nanotips. Then, the electrically conductive top electrode overlying the dielectric-covered nanotips forms a three-dimensional top electrode interface, matching the first three-dimensional interface of the dielectric-covered nanotips.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: January 12, 2010
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Sheng Teng Hsu, Fengyan Zhang
  • Patent number: 7635600
    Abstract: A photovoltaic (PV) structure is provided, along with a method for forming a PV structure with a conductive nanowire array electrode. The method comprises: forming a bottom electrode with conductive nanowires; forming a first semiconductor layer of a first dopant type (i.e., n-type) overlying the nanowires; forming a second semiconductor layer of a second dopant type, opposite of the first dopant type (i.e., p-type), overlying the first semiconductor layer; and, forming a top electrode overlying the second semiconductor layer. The first and second semiconductor layers can be a material such as a conductive polymer, a conjugated polymer with a fullerene derivative, and inorganic materials such as CdSe, CdS, Titania, or ZnO. The conductive nanowires can be a material such as IrO2, In2O3, SnO2, or indium tin oxide (ITO).
    Type: Grant
    Filed: November 16, 2005
    Date of Patent: December 22, 2009
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Fengyan Zhang, Robert A. Barrowcliff, Sheng Teng Hsu
  • Patent number: 7494840
    Abstract: An optical device with an iridium oxide (IrOx) electrode neural interface, and a corresponding fabrication method are provided. The method provides a substrate and forms a first conductive electrode overlying the substrate. A photovoltaic device having a first electrical interface is connected to the first electrode. A second electrical interface of the photovoltaic device is connected to a second conductive electrode formed overlying the photovoltaic device. An array of neural interface single-crystal IrOx nanostructures are formed overlying the second electrode, where x?4. The IrOx nanostructures can be partially coated with an electrical insulator, such as SiO2, SiN, TiO2, or spin on glass (SOG), leaving the IrOx distal ends exposed. In one aspect, a buffer layer is formed overlying the second electrode surface, made from a material such as LiNbO3, LiTaO3, or SA, for the purpose of orienting the growth direction of the IrOx nanostructures.
    Type: Grant
    Filed: July 31, 2006
    Date of Patent: February 24, 2009
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Fengyan Zhang, Sheng Teng Hsu
  • Publication number: 20090024182
    Abstract: An optical device with an iridium oxide (IrOx) electrode neural interface, and a corresponding fabrication method are provided. The method provides a substrate and forms a first conductive electrode overlying the substrate. A photovoltaic device having a first electrical interface is connected to the first electrode. A second electrical interface of the photovoltaic device is connected to a second conductive electrode formed overlying the photovoltaic device. An array of neural interface single-crystal IrOx nanostructures are formed overlying the second electrode, where x?4. The IrOx nanostructures can be partially coated with an electrical insulator, such as SiO2, SiN, TiO2, or spin on glass (SOG), leaving the IrOx distal ends exposed. In one aspect, a buffer layer is formed overlying the second electrode surface, made from a material such as LiNbO3, LiTaO3, or SA, for the purpose of orienting the growth direction of the IrOx nanostructures.
    Type: Application
    Filed: September 29, 2008
    Publication date: January 22, 2009
    Inventors: Fengyan Zhang, Sheng Teng Hsu
  • Publication number: 20090017197
    Abstract: An iridium oxide (IrOx) nanowire protein sensor and associated fabrication method are presented. The method provides a substrate and forms overlying working and counter electrodes. A dielectric layer is deposited over the working and counter electrodes and contact holes are formed in the dielectric layer, exposing regions of the working and counter electrodes. IrOx nanowires (where 0?X?2) are grown from exposed regions of the working electrode. In one aspect, the IrOx nanowires are additionally grown on the dielectric, and subsequently etched from the dielectric. In another aspect, IrOx nanowires are grown from exposed regions of the counter electrode.
    Type: Application
    Filed: July 12, 2007
    Publication date: January 15, 2009
    Inventors: Fengyan Zhang, Ravi K. Reddy, Bruce D. Ulrich, Shalini Prasad, Sheng Teng Hsu
  • Publication number: 20090011536
    Abstract: An optical device with an iridium oxide (IrOx) electrode neural interface, and a corresponding fabrication method are provided. The method provides a substrate and forms a first conductive electrode overlying the substrate. A photovoltaic device having a first electrical interface is connected to the first electrode. A second electrical interface of the photovoltaic device is connected to a second conductive electrode formed overlying the photovoltaic device. An array of neural interface single-crystal IrOx nanostructures are formed overlying the second electrode, where x?4. The IrOx nanostructures can be partially coated with an electrical insulator, such as SiO2, SiN, TiO2, or spin on glass (SOG), leaving the IrOx distal ends exposed. In one aspect, a buffer layer is formed overlying the second electrode surface, made from a material such as LiNbO3, LiTaO3, or SA, for the purpose of orienting the growth direction of the IrOx nanostructures.
    Type: Application
    Filed: July 31, 2006
    Publication date: January 8, 2009
    Inventors: Fengyan Zhang, Sheng Teng Hsu
  • Publication number: 20080299381
    Abstract: An iridium oxide (IrOx) nanowire neural sensor array and associated fabrication method are provided. The method provides a substrate with a conductive layer overlying the substrate, and a dielectric layer overlying the conductive layer. The substrate can be a material such as Si, SiO2, quartz, glass, or polyimide, and the conductive layer is a material such as ITO, SnO2, ZnO, TiO2, doped ITO, doped SnO2, doped ZnO, doped TiO2, TiN, TaN, Au, Pt, or Ir. The dielectric layer is selectively wet etched, forming contact holes with sloped walls in the dielectric layer and exposing regions of the conductive layer. IrOx nanowire neural interfaces are grown from the exposed regions of the conductive layer. The IrOx nanowire neural interfaces each have a cross-section in a range of 0.5 to 10 micrometers, and may be shaped as a circle, rectangle, or oval.
    Type: Application
    Filed: June 4, 2007
    Publication date: December 4, 2008
    Inventors: Fengyan Zhang, Bruce D. Ulrich, Wei Gao, Sheng Teng Hsu
  • Publication number: 20080290431
    Abstract: A nanorod sensor with a single plane of horizontally-aligned electrodes and an associated fabrication method are provided. The method provides a substrate and forms an intermediate electrode overlying a center region of the substrate. The intermediate electrode is a patterned bottom noble metal/Pt/Ti multilayered stack. TiO2 nanorods are formed over the substrate and intermediate electrode, and a TiO2 film may be formed overlying the TiO2 nanorods. The TiO2 nanorods and TiO2 film are formed in-situ, in the same process, by varying the substrate temperature. In other aspects, the TiO2 film is formed between the nanorods and the intermediate electrode. In yet another aspect, the TiO2 film is formed both above and below the nanorods. A single plane of top electrodes is formed overlying the TiO2 film from a top noble metal/Pt/Ti multilayered stack overlying the TiO2 film, which has been selectively etched to form separate top electrodes.
    Type: Application
    Filed: May 22, 2007
    Publication date: November 27, 2008
    Inventors: Fengyan Zhang, Bruce D. Ulrich, Wei Pan, Lawrence J. Charneski, Sheng Teng Hsu
  • Publication number: 20080277746
    Abstract: A nanowire sensor with a self-aligned top electrode support insulator, and associated fabrication process are provided. The method begins with a doped silicon-containing substrate. A growth-promotion metal is deposited overlying the substrate. A silicon nitride electrode support is formed overlying the growth-promotion metal. Nanowires are grown from exposed regions of the growth-promotion metal and an insulator is deposited over the nanowires. A top insulator layer is removed to expose tips of the nanowires, and a top electrode metal is deposited overlying the nanowire tips and silicon nitride electrode support. Next, a stack etch is selectively performed, etching down to the level of the growth-promotion metal. A top electrode island is left that is centered on the silicon nitride electrode support and connected to the growth-promotion metal via the nanowires. Then, the sensor is dipped in a buffered hydrofluoric (BHF) solution, to remove any remaining insulator and to expose the nanowires.
    Type: Application
    Filed: January 9, 2007
    Publication date: November 13, 2008
    Inventors: Sheng Teng Hsu, Fengyan Zhang
  • Patent number: 7446014
    Abstract: A method is provided for forming a NanoElectroChemical (NEC) cell. The method provides a bottom electrode with a top surface. Nanowire shells are formed. Each nanowire shell has a nanowire and a sleeve, with the nanowire connected to the bottom electrode top surface. A top electrode is formed overlying the nanowire shells. A main cavity is formed between the top electrode and bottom electrodes, partially displaced by a first plurality of nanowire shells. Electrolyte cavities are formed between the sleeves and nanowires by etching the first sacrificial layer. In one aspect, electrolyte cavities are formed between the bottom electrode top surface and a shell coating layer joining the sleeve bottom openings. Then, the main and electrolyte cavities are filled with either a liquid or gas phase electrolyte. In a different aspect, the first sacrificial layer is a solid phase electrolyte that is not etched away.
    Type: Grant
    Filed: October 12, 2006
    Date of Patent: November 4, 2008
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Fengyan Zhang, David R. Evans, Sheng Teng Hsu
  • Patent number: 7438759
    Abstract: An ambient environment nanowire sensor and corresponding fabrication method have been provided. The method includes: forming a substrate such as Silicon (Si) or glass; growing nanowires; depositing an insulator layer overlying the nanowires; etching to expose tips of the nanowires; forming a patterned metal electrode, with edges, overlying the tips of the nanowires; and, etching to expose the nanowires underlying the electrode edges. The nanowires can be a material such as IrO2, TiO2, InO, ZnO, SnO2, Sb2O3, or In2O3, to mane just a few examples. The insulator layer can be a spin-on glass (SOG) or low-k dielectric. In one aspect, the resultant structure includes exposed nanowires grown from the doped substrate regions and an insulator core with embedded nanowires. In a different aspect, the method forms a growth promotion layer overlying the substrate. The resultant structure includes exposed nanowires grown from the selectively formed growth promotion layer.
    Type: Grant
    Filed: November 1, 2005
    Date of Patent: October 21, 2008
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Fengyan Zhang, Robert A. Barrowcliff, Jong-Jan Lee, Sheng Teng Hsu
  • Publication number: 20080197399
    Abstract: A nanotip capacitor and associated fabrication method are provided. The method provides a bottom electrode and grows electrically conductive nanotips overlying the bottom electrode. An electrically insulating dielectric is deposited overlying the nanotips, and an electrically conductive top electrode is deposited overlying dielectric-covered nanotips. Typically, the dielectric is deposited by forming a thin layer of dielectric overlying the nanotips using an atomic layer deposition (ALD) process. In one aspect, the electrically insulating dielectric covering the nanotips forms a three-dimensional interface of dielectric-covered nanotips. Then, the electrically conductive top electrode overlying the dielectric-covered nanotips forms a three-dimensional top electrode interface, matching the first three-dimensional interface of the dielectric-covered nanotips.
    Type: Application
    Filed: February 16, 2007
    Publication date: August 21, 2008
    Inventors: Sheng Teng Hsu, Fengyan Zhang
  • Publication number: 20080191636
    Abstract: An electroluminescence (EL) device and a method are provided for fabricating said device with a nanotip electrode. The method comprises: forming a bottom electrode with nanotips; forming a Si phosphor layer adjacent the nanotips; and, forming a transparent top electrode. The Si phosphor layer is interposed between the bottom and top electrodes. The nanotips may have a tip base size of about 50 nanometers, or less, a tip height in the range of 5 to 50 nm, and a nanotip density of greater than 100 nanotips per square micrometer. Typically, the nanotips are formed from iridium oxide (IrOx) nanotips. A MOCVD process forms the Ir bottom electrode. The IrOx nanotips are grown from the Ir. In one aspect, the Si phosphor layer is a SRSO layer. In response to an SRSO annealing step, nanocrystalline SRSO is formed with nanocrystals having a size in the range of 1 to 10 nm.
    Type: Application
    Filed: March 5, 2008
    Publication date: August 14, 2008
    Inventors: Sheng Teng Hsu, Fengyan Zhang, Gregory M. Stecker, Robert A. Barrowcliff