Abstract: An electrical panel adapter for an enclosure that is formed of at least one panel includes a main unit having a front portion and a rear portion. The rear portion is positioned inside the enclosure and includes a first plurality of electrical connections adapted to connect to electrical wires and/or equipment located inside the enclosure. The front portion extends through an aperture in the at least one panel and includes a second plurality of electrical connections adapted to connect to one or more electrical devices located outside the enclosure for measurement of both voltage and current inside the enclosure. The second plurality of electrical connections are electrically coupled to the first plurality of electrical connections. The electrical panel adapter enables electrical devices outside the enclosure to be electrically coupled to the electrical wires and/or equipment inside the enclosure without requiring the enclosure to be opened.

Abstract: Systems and methods are provided for measuring electrical parameters in an insulated conductor without requiring a galvanic connection. A sensor probe is provided that includes a body and a flexible arm or strap that is movable between an open position that allows a conductor to be moved into and out of a measurement area of the probe, and a closed position that secures the insulated conductor within the measurement area so that one or more measurements may be obtained. The electrical parameter sensor probe may include a non-contact sensor coupled to at least one of the body or the flexible arm. A user may apply a force to an actuator (e.g., slide switch) which moves the flexible arm from the closed position into the open position against a bias force so that the insulated conductor under test may be positioned and secured in the measurement area of the sensor probe.

Abstract: An electrical panel adapter for an enclosure that is formed of at least one panel includes a main unit having a front portion and a rear portion. The rear portion is positioned inside the enclosure and includes a first plurality of electrical connections adapted to connect to electrical wires and/or equipment located inside the enclosure. The front portion extends through an aperture in the at least one panel and includes a second plurality of electrical connections adapted to connect to one or more electrical devices located outside the enclosure for measurement of both voltage and current inside the enclosure. The second plurality of electrical connections are electrically coupled to the first plurality of electrical connections. The electrical panel adapter enables electrical devices outside the enclosure to be electrically coupled to the electrical wires and/or equipment inside the enclosure without requiring the enclosure to be opened.

Abstract: Systems and methods are provided for measuring electrical parameters in an insulated conductor without requiring a galvanic connection. A sensor probe is provided that includes a body and a flexible arm or strap that is movable between an open position that allows a conductor to be moved into and out of a measurement area of the probe, and a closed position that secures the insulated conductor within the measurement area so that one or more measurements may be obtained. The electrical parameter sensor probe may include a non-contact sensor coupled to at least one of the body or the flexible arm. A user may apply a force to an actuator (e.g., slide switch) which moves the flexible arm from the closed position into the open position against a bias force so that the insulated conductor under test may be positioned and secured in the measurement area of the sensor probe.