Patents by Inventor Ferenc Korsos

Ferenc Korsos has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Photoluminescence mapping of passivation defects for silicon photovoltaics
    Patent number: 9685906
    Abstract: Methods for fast and accurate mapping of passivation defects in a silicon wafer involve capturing of photoluminescence (PL) images while the wafer is moving, for instance, when the wafer is transported on a belt in a fabrication line. The methods can be applied to in-line diagnostics of silicon wafers in solar cell fabrication. Example embodiments include a procedure for obtaining the whole wafer images of passivation defects from a single image (map) of photoluminescence intensity, and can provide rapid feedback for process control.
    Type: Grant
    Filed: June 26, 2014
    Date of Patent: June 20, 2017
    Assignee: Semilab SDI LLC
    Inventors: Jacek Lagowski, Marshall D. Wilson, Ferenc Korsos, György Nádudvari
  • PHOTOLUMINESCENCE MAPPING OF PASSIVATION DEFECTS FOR SILICON PHOTOVOLTAICS
    Publication number: 20150008952
    Abstract: Methods for fast and accurate mapping of passivation defects in a silicon wafer involve capturing of photoluminescence (PL) images while the wafer is moving, for instance, when the wafer is transported on a belt in a fabrication line. The methods can be applied to in-line diagnostics of silicon wafers in solar cell fabrication. Example embodiments include a procedure for obtaining the whole wafer images of passivation defects from a single image (map) of photoluminescence intensity, and can provide rapid feedback for process control.
    Type: Application
    Filed: June 26, 2014
    Publication date: January 8, 2015
    Inventors: Jacek Lagowski, Marshall D. Wilson, Ferenc Korsos, György Nádudvari