Patents by Inventor Filip Christiaens

Filip Christiaens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5927853
    Abstract: A method for evaluating the thermal impedance of packaged semiconductor chips. A measuring apparatus includes a thermostatic bath filled with a dielectric liquid and a temperature sensor for measuring the temperature of the bath. The semiconductor chip is subjected to a calibration step followed by a thermal response measurement step. Increasing the power pulse length allows measurement of the steady-state junction-to-case thermal resistance. The measuring apparatus and method is further used for tracing in-situ degradation of packaged semiconductor chips due to power cycling.
    Type: Grant
    Filed: November 27, 1996
    Date of Patent: July 27, 1999
    Inventors: Filip Christiaens, Luc Tielemans, Luc De Schepper, Eric Beyne
  • Patent number: 5795063
    Abstract: A system for evaluating the thermal impedance of packaged semiconductor chips. The measuring apparatus includes a thermostatic bath filled with a dielectric liquid and a temperature sensor for measuring the temperature of the bath. The semiconductor chip is subjected to a calibration step followed by a thermal response measurement step. Increasing the power pulse length allows measurement of the steady-state junction-to-case thermal resistance. The measuring apparatus and method is further used for tracing in-situ degradation of packaged semiconductor chips due to power cycling.
    Type: Grant
    Filed: October 19, 1995
    Date of Patent: August 18, 1998
    Assignee: Interuniversitair Micro-Elektronica Centrum VZW
    Inventors: Filip Christiaens, Luc Tielemans, Luc De Schepper, Eric Beyne