Abstract: A device adapted for examining and detecting foreign objects in a flat plate-shaped material comprises a transport device for transporting a flat plate-shaped material to be examined through the device in a transport direction. The device comprising a first X-ray source and a second X-ray source adapted for, in operation, emitting a first X-ray beam and a second X-ray beam. The device comprising a first sensor unit and a second sensor unit arranged to detect the first and second X-ray beam. The first and second sensor unit being adapted for detecting data indicative of the presence and the indirect or direct position in the transport direction of a foreign object in a flat plate-shaped material. The first and second sensor unit comprise or are connected to a data processing unit adapted for processing the detected data to determine the presence of a foreign object in the flat plate-shaped material.