Abstract: Disclosed is a sensor arrangement, manufacturing apparatus, and measurement method for an additive manufacture apparatus The sensor arrangement includes a sensor module which is configured to detect oxygen molecules in a gas sample permeating into the sensor module and to generate an electrical sensor signal based on the quantity of the oxygen molecules, a control module which is configured, by means of a comparison of the sensor signal or a variable derived from the sensor signal with a specified threshold value, to determine whether the sensor module is measuring outside a predetermined action range and if this is the case, to generate a control signal which is configured to initiate a predetermined countermeasure which is intended to modify the conditions in the apparatus in a manner such that the sensor module is again measuring in the action range.

Abstract: A stack of crystals as a bright source of polarization-entangled photons, including: a plurality of first birefringent phase-matched crystals having a first optical axis; and a corresponding plurality of second birefringent phase-matched crystals having a second optical axis; wherein the plurality of the first and second crystals are alternately stacked to form a periodic crystal structure, with the first optical axis being offset from the second optical axis by a desired angle.

Abstract: The invention concerns a sensor arrangement (9) for an apparatus (1) for the additive manufacture of a component (2) in a manufacturing process in which build material (13), preferably comprising a metal powder, is consolidated on a construction area (8) in a processing area (3) by means of irradiation of the build material (13) with at least one energy beam (AL), the sensor arrangement (9) comprising: a sensor module (90) which is configured to detect oxygen molecules in a gas sample (P) permeating into the sensor module (90) and to generate an electrical sensor signal (S) based on the quantity of the oxygen molecules, a selective filter element (F) configured to filter the gas sample (P) so that at least hydrogen molecules and/or hydrogen ions and/or water molecules and/or hydroxide ions are filtered out of the gas sample (P). The invention further concerns a manufacturing apparatus as well as a measurement method with such a sensor arrangement.

Abstract: A method of controlling an actuator comprising an electric motor and an actuator coupled to the electric motor, the method comprising controlling the electric motor to move the actuator in a direction towards an absolute mechanical end stop until a last registered soft reference position has been reached and then to overtravel the last registered soft reference position by a predetermined distance, detecting the load of the actuator, and updating the registered soft reference position on the basis of the detected load.

Abstract: A method of controlling an actuator comprising an electric motor and an actuator coupled to the electric motor, the method comprising controlling the electric motor to move the actuator in a direction towards an absolute mechanical end stop until a last registered soft reference position has been reached and then to overtravel the last registered soft reference position by a predetermined distance, detecting the load of the actuator, and updating the registered soft reference position on the basis of the detected load.

Abstract: Measurement system for the three-dimensional optical measurement of a work-piece, comprising: (i) a camera for recording image data of the workpiece; (ii) a control unit which is configured to evaluate the image data recorded by the camera and deter-mine 3D data of the workpiece therefrom; and (iii) a projector for projecting a test pattern onto the workpiece. The control unit is configured to control the projector during a setup mode in such a way that the projector actively modifies, depending on a distance between the workpiece and the camera, the shape of the test pattern projected onto the workpiece in order, by way of the test pattern, to assist a user of the measurement system within the scope of positioning the camera relative to the workpiece.

Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.

Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.

Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.

Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.