Patents by Inventor Florian BAYER

Florian BAYER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11218095
    Abstract: A method of controlling an actuator comprising an electric motor and an actuator coupled to the electric motor, the method comprising controlling the electric motor to move the actuator in a direction towards an absolute mechanical end stop until a last registered soft reference position has been reached and then to overtravel the last registered soft reference position by a predetermined distance, detecting the load of the actuator, and updating the registered soft reference position on the basis of the detected load.
    Type: Grant
    Filed: November 12, 2019
    Date of Patent: January 4, 2022
    Assignee: MINEBEA MITSUMI INC.
    Inventors: Daniel Nickel, Ullrich Kreiensen, Biancuzzi Giovanni, Fabian Armbruster, Florian Bayer
  • Publication number: 20200153369
    Abstract: A method of controlling an actuator comprising an electric motor and an actuator coupled to the electric motor, the method comprising controlling the electric motor to move the actuator in a direction towards an absolute mechanical end stop until a last registered soft reference position has been reached and then to overtravel the last registered soft reference position by a predetermined distance, detecting the load of the actuator, and updating the registered soft reference position on the basis of the detected load.
    Type: Application
    Filed: November 12, 2019
    Publication date: May 14, 2020
    Inventors: Daniel NICKEL, Ullrich Kreiensen, Biancuzzi Giovanni, Fabian Armbruster, Florian Bayer
  • Publication number: 20180051983
    Abstract: Measurement system for the three-dimensional optical measurement of a work-piece, comprising: (i) a camera for recording image data of the workpiece; (ii) a control unit which is configured to evaluate the image data recorded by the camera and deter-mine 3D data of the workpiece therefrom; and (iii) a projector for projecting a test pattern onto the workpiece. The control unit is configured to control the projector during a setup mode in such a way that the projector actively modifies, depending on a distance between the workpiece and the camera, the shape of the test pattern projected onto the workpiece in order, by way of the test pattern, to assist a user of the measurement system within the scope of positioning the camera relative to the workpiece.
    Type: Application
    Filed: August 16, 2017
    Publication date: February 22, 2018
    Inventors: Florian BAYER, Christian CONRAD, Heiko GOLLER, Ivan KAUSZ
  • Patent number: 9498171
    Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: November 22, 2016
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Gisela Anton, Florian Bayer, Jürgen Durst, Thilo Michel, Georg Pelzer, Jens Rieger, Thomas Weber
  • Patent number: 9500602
    Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: November 22, 2016
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Gisela Anton, Florian Bayer, Jürgen Durst, Thilo Michel, Georg Pelzer, Jens Rieger, Thomas Weber
  • Publication number: 20150092914
    Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.
    Type: Application
    Filed: September 17, 2014
    Publication date: April 2, 2015
    Inventors: Gisela ANTON, Florian BAYER, Jürgen DURST, Thilo MICHEL, Georg PELZER, Jens RIEGER, Thomas WEBER
  • Publication number: 20150092915
    Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.
    Type: Application
    Filed: September 17, 2014
    Publication date: April 2, 2015
    Inventors: Gisela ANTON, Florian BAYER, Jürgen DURST, Thilo MICHEL, Georg PELZER, Jens RIEGER, Thomas WEBER