Abstract: A test and/or measurement instrument includes at least three ports and at least three measurement circuits connected to the at least three ports, respectively. The test and/or measurement instrument further includes at least one signal generator circuit and a control circuit. The control circuit is configured to set a first calibration mode and carry out a first test of the instrument by measuring the calibration signal travelling from the signal generator circuit to the respective port as well as a signal traveling from the respective port to the signal generator circuit. The control circuit is configured to set a second calibration mode and carry out a second test of the instrument by measuring the calibration signal forwarded only to the main port in the first sub-mode and the calibration signal received by the respective port from the signal generator circuit via the main port in the first sub-mode.

Abstract: A measurement device, e.g., a vector network analyzer, for analyzing a device-under-test, DUT is provided. The measurement device comprises a signal generator to generate a test signal; test ports, connected to the DUT, which forward the test signal to the DUT, and/or receive a response signal from the DUT; and signal paths electrically connected the signal generator by one of the test ports. At least one of the signal paths comprises: a measurement unit to measure RF signals; a reference coupler to forward a decoupled portion of the test signal; a first measurement coupler to forward a first decoupled portion of the response signal; and a second measurement coupler to forward a second decoupled portion of the response signal. The second measurement coupler adapts a characteristic of the second decoupled portion of the response signal to differ from the first decoupled portion of the response signal.

Abstract: The present disclosure relates to a test and/or measurement device, comprising a housing; and a connection port which is mounted to the housing and which is connectable to an external connector. The connection port comprises: at least one signal conductor configured to transmit and/or receive a signal to and/or from the external connector, and a nut comprising a screw thread for screwing on the external connector, wherein the nut is arranged rotatably around the at least one signal conductor. The test and/or measurement device further comprises an electric motor which is coupled to the nut and configured to rotate the nut.

Abstract: A test and/or measurement instrument includes at least three ports and at least three measurement circuits connected to the at least three ports, respectively. The test and/or measurement instrument further includes at least one signal generator circuit and a control circuit. The control circuit is configured to set a first calibration mode and carry out a first test of the instrument by measuring the calibration signal travelling from the signal generator circuit to the respective port as well as a signal traveling from the respective port to the signal generator circuit. The control circuit is configured to set a second calibration mode and carry out a second test of the instrument by measuring the calibration signal forwarded only to the main port in the first sub-mode and the calibration signal received by the respective port from the signal generator circuit via the main port in the first sub-mode.

Abstract: The present disclosure provides a measurement application device comprising a measurement signal interface configured to acquire a measurement signal, a display coupled to the measurement signal interface, and configured to display the acquired measurement signal, a graphics acquisition interface configured to acquire graphical data, and a data processor coupled to the graphics acquisition interface and the display, and configured to extract a graph from the graphical data, and to display the extracted graph with the measurement signal on the display. Further, the present disclosure provides a respective method, and a respective computer program product.

Abstract: The present disclosure relates to a test and/or measurement device, comprising a housing; and a connection port which is mounted to the housing and which is connectable to an external connector. The connection port comprises: at least one signal conductor configured to transmit and/or receive a signal to and/or from the external connector, and a nut comprising a screw thread for screwing on the external connector, wherein the nut is arranged rotatably around the at least one signal conductor. The test and/or measurement device further comprises an electric motor which is coupled to the nut and configured to rotate the nut.

Abstract: A measurement device, e.g., a vector network analyzer, for analyzing a device-under-test, DUT is provided. The measurement device comprises a signal generator to generate a test signal; test ports, connected to the DUT, which forward the test signal to the DUT, and/or receive a response signal from the DUT; and signal paths electrically connected the signal generator by one of the test ports. At least one of the signal paths comprises: a measurement unit to measure RF signals; a reference coupler to forward a decoupled portion of the test signal; a first measurement coupler to forward a first decoupled portion of the response signal; and a second measurement coupler to forward a second decoupled portion of the response signal. The second measurement coupler adapts a characteristic of the second decoupled portion of the response signal to differ from the first decoupled portion of the response signal.

Abstract: The measurement circuit includes a clock input, a frequency converter circuit, and a first signal generator circuit. The clock input is configured to receive a reference clock signal. The first signal generator circuit includes a first clock generator circuit configured to generate a first clock signal having an adaptable frequency based on the reference clock signal. The first signal generator circuit further includes a first direct digital synthesizer (DDS) circuit configured to generate a local oscillator (LO) signal based on the first clock signal and based on an adaptable frequency tuning word (FTW) of the first DDS circuit. The adaptable frequency of the first clock signal and the adaptable FTW of the first DDS circuit are configured such that an IF signal is free of spurs emitted by the first DDS circuit at least in a predetermined frequency band.