Patents by Inventor Florian Hardy
Florian Hardy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12216086Abstract: A readout circuit for an electromagnetic inspection system for nondestructive testing of a test object is disclosed. The inspection system includes a plurality of sensors for sensing an electromagnetic response from the test object and generating therefrom a plurality of response signals. The readout circuit can include a plurality of anti-aliasing filters, each configured to receive the response signal from one of the sensors and bandlimit the response signal to produce one of a plurality of bandlimited signals. The readout circuit can also include a time-division multiplexer configured to multiplex the bandlimited signals into a time-division multiplexed (TDM) signal including a sequence of frames outputted at a TDM frame rate, each frame including a plurality of time slots, each time slot assigned to one of the bandlimited signals, wherein the anti-aliasing filters are configured to operate based on the TDM frame rate to attenuate aliasing artifacts in the TDM signal.Type: GrantFiled: December 7, 2022Date of Patent: February 4, 2025Assignee: EDDYFI CANADA INC.Inventors: Francis Jeanson, Florian Hardy
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Publication number: 20230314373Abstract: A method for identifying indications in an object via non-destructive testing using inspection equipment comprising a probe is described. The method includes: recording test data corresponding to a signal measurement acquired by the probe; processing the test data using a first analysis machine learning algorithm trained to output a list of detected landmarks; processing the list of detected landmarks to identify regions in the object based on the landmarks; processing the test data and the identified regions using a second analysis machine learning algorithm to output a list of detected indications; processing the list of indications to automatically classify each indication according to one of a plurality of predefined indication types; and outputting the classified indications in a report specifying positions of the classified indications in the object. A corresponding system and non-transitory computer-readable medium are also described.Type: ApplicationFiled: October 27, 2022Publication date: October 5, 2023Applicant: Eddyfi Canada Inc.Inventors: Philippe MACKAY, Vincent GAUDREAULT, Florian HARDY, Marco Michele SISTO
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Publication number: 20230176013Abstract: A readout circuit for an electromagnetic inspection system for nondestructive testing of a test object is disclosed. The inspection system includes a plurality of sensors for sensing an electromagnetic response from the test object and generating therefrom a plurality of response signals. The readout circuit can include a plurality of anti-aliasing filters, each configured to receive the response signal from one of the sensors and bandlimit the response signal to produce one of a plurality of bandlimited signals. The readout circuit can also include a time-division multiplexer configured to multiplex the bandlimited signals into a time-division multiplexed (TDM) signal including a sequence of frames outputted at a TDM frame rate, each frame including a plurality of time slots, each time slot assigned to one of the bandlimited signals, wherein the anti-aliasing filters are configured to operate based on the TDM frame rate to attenuate aliasing artifacts in the TDM signal.Type: ApplicationFiled: December 7, 2022Publication date: June 8, 2023Applicant: Eddyfi Canada Inc.Inventors: Francis JEANSON, Florian HARDY
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Publication number: 20230138975Abstract: A method for identifying indications in an object via non-destructive testing using inspection equipment comprising a probe is described. The method includes: recording test data corresponding to a signal measurement acquired by the probe; processing the test data using a first analysis machine learning algorithm trained to output a list of detected landmarks; processing the list of detected landmarks to identify regions in the object based on the landmarks; processing the test data and the identified regions using a second analysis machine learning algorithm to output a list of detected indications; processing the list of indications to automatically classify each indication according to one of a plurality of predefined indication types; and outputting the classified indications in a report specifying positions of the classified indications in the object. A corresponding system and non-transitory computer-readable medium are also described.Type: ApplicationFiled: October 27, 2022Publication date: May 4, 2023Applicant: Eddyfi Canada Inc.Inventors: Philippe MACKAY, Vincent GAUDREAULT, Florian HARDY, Marco Michele SISTO
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Publication number: 20190041361Abstract: A Pulsed Eddy Current (PEC) probe for PEC testing of a ferromagnetic object covered with a ferromagnetic protective jacket, the PEC probe comprising: at least one coil for at least one of generating an inspection magnetic field and detecting an induced magnetic field; at least one permanent magnet for magnetically saturating the ferromagnetic protective jacket; and means for selectively reducing an attraction between the at least one magnet and the ferromagnetic protective jacket.Type: ApplicationFiled: August 2, 2018Publication date: February 7, 2019Applicant: EDDYFI NDT INC.Inventors: Marco Michele SISTO, Maxime ROCHETTE, Florian HARDY, Louis-Philippe DION
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Patent number: 9880130Abstract: A Pulsed Eddy Current device for inspecting an object made of an electrically conductive material comprising: at least one dual-purpose coil serving a dual purpose of producing a supplied magnetic field in the object and measuring a produced magnetic field emitted by the object, a transmitter circuit driving the dual-purpose coil(s) with an electrical signal, a shut-off current circuit for the transmitter circuit for cutting-off a current in the dual-purpose coil(s) during a cut-off phase of the electrical signal, the shut-off current circuit applying a voltage inversion on the dual-purpose coil(s) and a receiver circuit for reading the produced magnetic field from the dual-purpose coil(s). A method for inspecting an object comprising supplying a voltage on at least one dual-purpose coil, cutting-off a current in the dual-purpose coil(s) by applying a voltage inversion on the dual-purpose coil(s) and receiving, at the dual-purpose coil(s), a produced magnetic field.Type: GrantFiled: December 14, 2016Date of Patent: January 30, 2018Assignee: EDDYFI NDT INC.Inventors: Florian Hardy, Maxime Rochette, Marc Grenier, Vincent Demers-Carpentier
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Publication number: 20170168016Abstract: A Pulsed Eddy Current device for inspecting an object made of an electrically conductive material comprising: at least one dual-purpose coil serving a dual purpose of producing a supplied magnetic field in the object and measuring a produced magnetic field emitted by the object, a transmitter circuit driving the dual-purpose coil(s) with an electrical signal, a shut-off current circuit for the transmitter circuit for cutting-off a current in the dual-purpose coil(s) during a cut-off phase of the electrical signal, the shut-off current circuit applying a voltage inversion on the dual-purpose coil(s) and a receiver circuit for reading the produced magnetic field from the dual-purpose coil(s). A method for inspecting an object comprising supplying a voltage on at least one dual-purpose coil, cutting-off a current in the dual-purpose coil(s) by applying a voltage inversion on the dual-purpose coil(s) and receiving, at the dual-purpose coil(s), a produced magnetic field.Type: ApplicationFiled: December 14, 2016Publication date: June 15, 2017Inventors: Florian HARDY, Maxime ROCHETTE, Marc GRENIER, Vincent DEMERS-CARPENTIER
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Publication number: 20150177191Abstract: An eddy current array probe comprising a probe body adapted to be displaced along a scan direction; a plurality of coils arranged in a linear configuration on the surface of the probe body, the coils being adapted to be operated in one mode among a transmit mode, an inactive mode and a receive mode at each of a plurality of time-spaced instances, at least two adjacent coils of the plurality being adapted to be operated in the inactive mode between a coil adapted to be in transmit mode and a coil adapted to be in receive mode in the linear configuration at each of the time-spaced instances; at least one conductor extending from the probe body; each coil of the plurality being connected to one of the at least one conductor and a common return path. In one embodiment, the coils have an elongated shape.Type: ApplicationFiled: June 20, 2013Publication date: June 25, 2015Inventors: Florian Hardy, Marc Grenier
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Publication number: 20150143910Abstract: A transmitter circuit and method for an ultrasonic thickness measurement system having an ultrasonic transducer and a cable with known cable impedance, the cable connecting at least the transmitter circuit to the ultrasonic transducer, the transmitter circuit comprising: an electrical pulse voltage signal emitter for producing an electrical pulse voltage signal to be propagated over the cable to the ultrasonic transducer, the electrical pulse voltage signal having a pulse nominal voltage value; a matched impedance circuit for matching a cable impedance of the cable at the transmitter circuit for an electrical parasitic reflection signal of the electrical pulse voltage signal, the electrical parasitic reflection signal being caused by an impedance mismatch between the cable and the ultrasonic transducer, a parasitic nominal voltage value of the electrical parasitic reflection signal being at most the pulse nominal voltage value.Type: ApplicationFiled: July 23, 2013Publication date: May 28, 2015Applicant: EDDYFI NDT INC.Inventors: Florian Hardy, Eric Morissette
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Patent number: 7733084Abstract: An eddy current acquisition system integrates traditional elements of a nuclear steam generator tubing inspection into a single modular system comprising three subsystems: the take-up reel subsystem, the acquisition instrument, which is located in the hub of the take-up reel, and the pusher head subsystem. All of the control electronics are respectively enclosed in bases of the pusher head and the take-up reel subsystems in water-resistant and dust proof enclosures. Simplified setup is achieved by employing a single communication bus linking an identification (“ID”) chip in each component to a host computer. The ID chip stores and reports product part numbers, descriptions and serial numbers and revision or upgrade status and may also store statistical information such as device duty cycles, performance statistics, repair history, and the like.Type: GrantFiled: July 19, 2006Date of Patent: June 8, 2010Inventors: Tom O'Dell, Florian Hardy
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Patent number: 6344739Abstract: In an eddy current testing probe, efficiency is improved by multiplexing, at the probe head, signals to and from a large number of coils on the probe head onto a reduced number of signal conductors, and by reusing coils in different measurement configurations in order to provide a higher density of inspection coverage.Type: GrantFiled: July 9, 1999Date of Patent: February 5, 2002Assignee: R/D Tech Inc.Inventors: Florian Hardy, Rock Samson