Patents by Inventor Florian STARZER
Florian STARZER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11719802Abstract: A radar method is described. According to one exemplary embodiment, the method includes generating a first RF oscillator signal in a first chip and supplying the first RF oscillator signal to a transmission (TX) channel of the first chip and transmitting the first RF oscillator signal from the TX channel of the first chip to the second chip via a transmission line.Type: GrantFiled: August 16, 2021Date of Patent: August 8, 2023Assignee: Infineon Technologies AGInventors: Florian Starzer, Helmut Kollmann, Alexander Melzer, Rainer Stuhlberger, Roland Vuketich, Mathias Zinnoecker
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Publication number: 20210382159Abstract: A radar method is described. According to one exemplary embodiment, the method includes generating a first RF oscillator signal in a first chip and supplying the first RF oscillator signal to a transmission (TX) channel of the first chip and transmitting the first RF oscillator signal from the TX channel of the first chip to the second chip via a transmission line.Type: ApplicationFiled: August 16, 2021Publication date: December 9, 2021Applicant: Infineon Technologies AGInventors: Florian STARZER, Helmut KOLLMANN, Alexander MELZER, Rainer STUHLBERGER, Roland VUKETICH, Mathias ZINNOECKER
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Patent number: 11137489Abstract: A radar system includes a first chip having a first radio frequency (RF) contact; a second chip having a second RF contact; a first RF oscillator integrated in the first chip and has an output coupled to the first RF contact; a second RF oscillator integrated in the second chip; a transmission line connecting the first RF contact to the second RF contact; a demodulator that is arranged in the second chip and has a first RF input; wherein the first RF oscillator is configured to generate a first RF oscillator signal that is transmitted to the first RF input of the demodulator via the first RF contact, the transmission line, and the second RF contact, and wherein a controller is configured to determine a first propagation delay of the first RF oscillator signal arriving at the second chip on a basis of information obtained from the demodulator.Type: GrantFiled: May 8, 2020Date of Patent: October 5, 2021Inventors: Florian Starzer, Helmut Kollmann, Alexander Melzer, Rainer Stuhlberger, Roland Vuketich, Mathias Zinnoecker
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Publication number: 20200301001Abstract: A radar method is described. According to one exemplary embodiment, the method includes generating a first RF oscillator signal in a first chip and supplying the first RF oscillator signal to a transmission (TX) channel of the first chip and transmitting the first RF oscillator signal from the TX channel of the first chip to the second chip via a transmission line.Type: ApplicationFiled: May 8, 2020Publication date: September 24, 2020Applicant: Infineon Technologies AGInventors: Florian Starzer, Helmut KOLLMANN, Alexander MELZER, Rainer STUHLBERGER, Roland VUKETICH, Mathias ZINNOECKER
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Patent number: 10761186Abstract: A radar device comprises a test signal generator including a digital harmonic oscillator that generates a digital oscillator signal with a first spectral component; a first digital-to-analog-converter that generates an analog oscillator signal based on the digital oscillator signal. Furthermore, the radar device comprises at least one radar channel receiving the analog oscillator signal during one or more self-tests.Type: GrantFiled: December 7, 2017Date of Patent: September 1, 2020Assignee: Infineon Technologies AGInventors: Jochen O. Schrattenecker, Florian Starzer, Oliver Frank, Michael Kropfitsch, Georg Krebelder, Helmut Kollmann, Thomas Sailer
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Method for producing a semiconductor device by means of computer-aided development of test scenarios
Patent number: 10761140Abstract: A method for producing a semiconductor device is described. In accordance with one example embodiment, the method comprises providing a virtual DUT in the form of a behavior model of the semiconductor device and developing at least one test in a test development environment for an automatic test equipment (ATE). In this case, commands are generated by means of the test development environment, which commands are converted into test signals by means of a software interface, which test signals are fed to the virtual DUT and are processable by the latter. The software interface processes response signals of the virtual DUT and reports information dependent on the response signals back to the test development environment.Type: GrantFiled: July 18, 2018Date of Patent: September 1, 2020Assignee: Infineon Technologies AGInventors: Oliver Frank, Christoph Hazott, Georg Krebelder, Bruno Mariacher, Otto Pfabigan, Sebastian Pointner, Ralf Reiterer, Florian Starzer -
Patent number: 10684363Abstract: A radar method is described. According to one exemplary embodiment, the method includes generating a first RF oscillator signal in a first chip and supplying the first RF oscillator signal to a transmission (TX) channel of the first chip and transmitting the first RF oscillator signal from the TX channel of the first chip to the second chip via a transmission line.Type: GrantFiled: August 20, 2018Date of Patent: June 16, 2020Assignee: Infineon Technologies AGInventors: Florian Starzer, Helmut Kollmann, Alexander Melzer, Rainer Stuhlberger, Roland Vuketich, Mathias Zinnoecker
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Patent number: 10670698Abstract: A method for estimating phase noise of an RF oscillator signal in a frequency-modulated continuous-wave (FMCW) radar system and related radar devices are provided. The method includes applying the RF oscillator signal to an artificial radar target composed of circuitry, which applies a delay and a gain to the RF oscillator signal, to generate an RF radar signal. Furthermore, the method includes down-converting the RF radar signal received from the artificial radar target from an RF frequency band to a base band, digitizing the down-converted RF radar signal to generate a digital radar signal, and calculating a decorrelated phase noise signal from the digital radar signal. A power spectral density of the decorrelated phase noise is then calculated from the decorrelated phase noise signal, and the power spectral density of the decorrelated phase noise is converted into a power spectral density of the phase noise of an RF oscillator signal.Type: GrantFiled: November 22, 2016Date of Patent: June 2, 2020Assignee: Infineon Technologies AGInventors: Alexander Melzer, Mario Huemer, Alexander Onic, Florian Starzer, Rainer Stuhlberger
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Patent number: 10615832Abstract: An RF front-end circuit of an RF transceiver is described herein. In accordance with one exemplary embodiment, the fronted circuit includes a local oscillator (LO) configured to generate an RF transmit signal, an RF output port coupled to the local oscillator, wherein the RF transmit signal is output at the RF output port, and a monitoring circuit receiving an input signal and configured to determine the phase of the input signal or the power of the input signal or both. A directional coupler is coupled to the RF output port and configured to direct a reflected signal incoming at the RF output port as input signal to the monitoring circuit, and a controller is configured to detect, based on the determined phase or power or both, a defect in a signal path operably connected to the RF output port.Type: GrantFiled: February 7, 2019Date of Patent: April 7, 2020Assignee: Infineon Technologies AGInventors: Helmut Kollmann, Jochen O. Schrattenecker, Florian Starzer
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Patent number: 10574367Abstract: One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signal during calibration operation of the circuit. The circuit node is coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal.Type: GrantFiled: October 30, 2018Date of Patent: February 25, 2020Assignee: Infineon Technologies AGInventors: Karl Dominizi, Oliver Frank, Herbert Jaeger, Herbert Knapp, Hao Li, Florian Starzer, Rainer Stuhlberger, Jonas Kammerer
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Publication number: 20200025899Abstract: A radar method is described. According to one exemplary embodiment, the method includes generating a first RF oscillator signal in a first chip and supplying the first RF oscillator signal to a transmission (TX) channel of the first chip and transmitting the first RF oscillator signal from the TX channel of the first chip to the second chip via a transmission line.Type: ApplicationFiled: August 20, 2018Publication date: January 23, 2020Applicant: Infineon Technologies AGInventors: Florian STARZER, Helmut KOLLMANN, Alexander MELZER, Rainer STUHLBERGER, Roland VUKETICH, Mathias ZINNOECKER
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Patent number: 10371800Abstract: Exemplary embodiments disclosed herein relate to a radar device. The radar device may transmit an RF oscillator signal to a radar channel and receive a respective first RF radar signal from the radar channel. The radar device may further generate a second RF radar signal. Frequency conversion circuits are also disclosed to down-convert the first RF radar signal and the second RF radar signal. An analog-to digital conversion unit may digitize the down-converted first RF radar signal and the down-converted second RF radar signal to generate a first digital signal and a second digital signal, respectively. A digital signal processing unit is disclosed to estimate a phase noise signal included in the second digital signal and to generate a cancellation signal based on the estimated phase noise signal. The cancellation signal is subtracted from the first digital radar signal to obtain a noise compensated digital radar signal.Type: GrantFiled: January 12, 2016Date of Patent: August 6, 2019Assignee: Infineon Technologies AGInventors: Mario Huemer, Alexander Melzer, Alexander Onic, Florian Starzer, Rainer Stuhlberger
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Publication number: 20190181902Abstract: An RF front-end circuit of an RF transceiver is described herein. In accordance with one exemplary embodiment, the fronted circuit includes a local oscillator (LO) configured to generate an RF transmit signal, an RF output port coupled to the local oscillator, wherein the RF transmit signal is output at the RF output port, and a monitoring circuit receiving an input signal and configured to determine the phase of the input signal or the power of the input signal or both. A directional coupler is coupled to the RF output port and configured to direct a reflected signal incoming at the RF output port as input signal to the monitoring circuit, and a controller is configured to detect, based on the determined phase or power or both, a defect in a signal path operably connected to the RF output port.Type: ApplicationFiled: February 7, 2019Publication date: June 13, 2019Applicant: Infineon Technologies AGInventors: Helmut KOLLMANN, Jochen O. SCHRATTENECKER, Florian STARZER
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Patent number: 10305610Abstract: A radio frequency (RF) transmitter for self-sensing power and phase of an RF signal is provided. A local oscillator (LO) is configured to generate a LO signal. A power amplifier is configured to generate the RF signal from the LO signal, wherein the LO and RF signals are periodic signals sharing a waveform and a frequency. An IQ de-modulator is configured to down convert the LO signal and the RF signal into an in-phase (I) signal and a quadrature (Q) signal, wherein direct current (DC) voltages respectively of the I and Q signals define power and phase of the RF signal. A method for self-sensing power and/or phase of an RF signal, and a radar system within which the RF transmitter is arranged, are also provided.Type: GrantFiled: April 13, 2018Date of Patent: May 28, 2019Assignee: Infineon Technologies AGInventors: Helmut Kollmann, Jochen Oliver Schrattenecker, Florian Starzer
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Patent number: 10284248Abstract: An RF front-end circuit of an RF transceiver is described herein. In accordance with one exemplary embodiment, the fronted circuit includes a local oscillator (LO) configured to generate an RF transmit signal, an RF output port coupled to the local oscillator, wherein the RF transmit signal is output at the RF output port, and a monitoring circuit receiving an input signal and configured to determine the phase of the input signal or the power of the input signal or both. A directional coupler is coupled to the RF output port and configured to direct a reflected signal incoming at the RF output port as input signal to the monitoring circuit, and a controller is configured to detect, based on the determined phase or power or both, a defect in a signal path operably connected to the RF output port.Type: GrantFiled: December 8, 2017Date of Patent: May 7, 2019Assignee: Infineon Technologies AGInventors: Helmut Kollmann, Jochen O. Schrattenecker, Florian Starzer
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Patent number: 10278084Abstract: A radar sensor includes a mixer configured to receive an radio frequency (RF) input signal to down-convert the RF input signal into a base-band or intermediate frequency (IF) band, an analog-to-digital converter (ADC), and a signal processing chain coupled between the mixer and the ADC. The radar sensor further includes an oscillator circuit that is configured to generate a test signal. The ADC is coupled to an output of the signal processing chain, and is configured to generate a digital signal by digitizing an output signal of the signal processing chain, the output signal being derived from the test signal. The radar sensor further includes a digital signal processing circuit coupled to the ADC downstream thereof, the digital signal processing circuit being configured to perform a spectral analysis on frequency values of the digital signal.Type: GrantFiled: July 13, 2018Date of Patent: April 30, 2019Assignee: Infineon Technologies AGInventors: Florian Starzer, Peter Bogner, Oliver Frank, Guenter Haider, Michael Kropfitsch, Thomas Sailer, Jochen O. Schrattenecker, Rainer Stuhlberger
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Publication number: 20190068295Abstract: One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signal during calibration operation of the circuit. The circuit node is coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal.Type: ApplicationFiled: October 30, 2018Publication date: February 28, 2019Inventors: Karl DOMINIZI, Oliver FRANK, Herbert JAEGER, Herbert KNAPP, Hao LI, Florian STARZER, Rainer STUHLBERGER, Jonas WURSTHORN
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METHOD FOR PRODUCING A SEMICONDUCTOR DEVICE BY MEANS OF COMPUTER-AIDED DEVELOPMENT OF TEST SCENARIOS
Publication number: 20190033373Abstract: A method for producing a semiconductor device is described. In accordance with one example embodiment, the method comprises providing a virtual DUT in the form of a behavior model of the semiconductor device and developing at least one test in a test development environment for an automatic test equipment (ATE). In this case, commands are generated by means of the test development environment, which commands are converted into test signals by means of a software interface, which test signals are fed to the virtual DUT and are processable by the latter. The software interface processes response signals of the virtual DUT and reports information dependent on the response signals back to the test development environment.Type: ApplicationFiled: July 18, 2018Publication date: January 31, 2019Inventors: Oliver FRANK, Christoph HOZOTT, Georg KREBELDER, Bruno MARIACHER, Otto PFABIGAN, Sebastian POINTNER, Ralf REITERER, Florian STARZER -
Publication number: 20180332488Abstract: A radar sensor includes a mixer configured to receive an radio frequency (RF) input signal to down-convert the RF input signal into a base-band or intermediate frequency (IF) band, an analog-to-digital converter (ADC), and a signal processing chain coupled between the mixer and the ADC. The radar sensor further includes an oscillator circuit that is configured to generate a test signal. The ADC is coupled to an output of the signal processing chain, and is configured to generate a digital signal by digitizing an output signal of the signal processing chain, the output signal being derived from the test signal. The radar sensor further includes a digital signal processing circuit coupled to the ADC downstream thereof, the digital signal processing circuit being configured to perform a spectral analysis on frequency values of the digital signal.Type: ApplicationFiled: July 13, 2018Publication date: November 15, 2018Applicant: Infineon Technologies AGInventors: Florian STARZER, Peter BOGNER, Oliver FRANK, Guenter HAIDER, Michael KROPFITSCH, Thomas SAILER, Jochen O. SCHRATTENECKER, Rainer STUHLBERGER
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Patent number: 10128962Abstract: One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signal during calibration operation of the circuit. The circuit node is coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal.Type: GrantFiled: May 3, 2016Date of Patent: November 13, 2018Assignee: Infineon Technologies AGInventors: Karl Dominizi, Oliver Frank, Herbert Jaeger, Herbert Knapp, Hao Li, Florian Starzer, Rainer Stuhlberger, Jonas Wursthorn