Patents by Inventor Florin Munteanu

Florin Munteanu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9752868
    Abstract: A portion of the surface of a cylindrical part with a machined groove is mapped with an optical profilometer during the manufacturing process and the height map is fitted to a virtual cylindrical configuration that best fits the data. Two-dimensional Fourier Transfer analysis of the map data is advantageously used to find the orientation of the groove on the part. The orientation of the groove is then compared to the longitudinal axis of such virtual cylinder to calculate the groove's lead angle. If the measured lead angle is outside a predetermined design tolerance deemed acceptable for manufacturing purposes, the part is removed from the fabrication line.
    Type: Grant
    Filed: October 8, 2016
    Date of Patent: September 5, 2017
    Assignee: BRUKER NANO INC.
    Inventors: Erik Novak, Florin Munteanu
  • Publication number: 20170023356
    Abstract: A portion of the surface of a cylindrical part with a machined groove is mapped with an optical profilometer during the manufacturing process and the height map is fitted to a virtual cylindrical configuration that best fits the data. Two-dimensional Fourier Transfer analysis of the map data is advantageously used to find the orientation of the groove on the part. The orientation of the groove is then compared to the longitudinal axis of such virtual cylinder to calculate the groove's lead angle. If the measured lead angle is outside a predetermined design tolerance deemed acceptable for manufacturing purposes, the part is removed from the fabrication line.
    Type: Application
    Filed: October 8, 2016
    Publication date: January 26, 2017
    Inventors: ERIK NOVAK, FLORIN MUNTEANU
  • Patent number: 9282304
    Abstract: A true-color image of a sample is obtained from interference data captured with a color camera. The irradiance of each color on the respective photo-sensor represents the sum of DC components received from the object and the reference surface and a modulated interference component. The color is determined at each pixel by removing the interference component and the reference-surface component from the irradiance data. The color map so derived is then combined with the height map produced with the same data to yield a true-color 3D map of the sample.
    Type: Grant
    Filed: June 2, 2014
    Date of Patent: March 8, 2016
    Assignee: BRUKER NANO INC.
    Inventors: Joanna Schmit, Florin Munteanu
  • Patent number: 8482741
    Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.
    Type: Grant
    Filed: June 20, 2012
    Date of Patent: July 9, 2013
    Assignee: Bruker Nano Inc.
    Inventors: Dong Chen, Florin Munteanu, Erik Novak, G. Lawrence Best
  • Patent number: 8416425
    Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.
    Type: Grant
    Filed: June 20, 2012
    Date of Patent: April 9, 2013
    Assignee: Bruker Nano Inc.
    Inventors: Florin Munteanu, Dong Chen, Erik Novak, G. Lawrence Best
  • Publication number: 20120257216
    Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.
    Type: Application
    Filed: June 20, 2012
    Publication date: October 11, 2012
    Applicant: BRUKER NANO INC.
    Inventors: DONG CHEN, Florin Munteanu, Erik Novak, G. Lawrence Best
  • Publication number: 20120257215
    Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.
    Type: Application
    Filed: June 20, 2012
    Publication date: October 11, 2012
    Applicant: BRUKER NANO INC.
    Inventors: Dong Chen, FLORIN MUNTEANU, Erik L. Novak, G. Lawrence Best
  • Patent number: 8275573
    Abstract: An adaptive algorithm is tailored to fit the local fringe frequency of single-frame spatial-carrier data under analysis. Each set of data points used sequentially by the algorithm is first processed with a Fourier Transform to find the local frequency of the fringes being analyzed. That information is then used to adapt the algorithm to the correct phase step thus calculated, thereby optimizing the efficiency and precision with which the algorithm profiles the local surface area. As a result, defects are identified and measured with precision even when the slope of the surface varies locally to the point where the algorithm without adaptive modification would not be effective to measure them. Once so identified, the defects may be measured again locally with greater accuracy by conventional temporal PSI.
    Type: Grant
    Filed: November 23, 2009
    Date of Patent: September 25, 2012
    Assignee: Bruker Nano, Inc.
    Inventors: Joanna Schmit, Florin Munteanu
  • Patent number: 8213021
    Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.
    Type: Grant
    Filed: June 29, 2007
    Date of Patent: July 3, 2012
    Assignee: Veeco Metrology, Inc.
    Inventors: Dong Chen, Florin Munteanu, Erik Novak, G. Lawrence Best
  • Publication number: 20120105864
    Abstract: A portion of the surface of a cylindrical part with a machined groove is mapped with an optical profilometer and the height map is fitted to a virtual cylindrical configuration that best fits the data. Two-dimensional Fourier Transfer analysis of the map data is advantageously used to find the orientation of the groove on the part. The orientation of the groove is then compared to the longitudinal axis of such virtual cylinder to calculate the groove's lead angle.
    Type: Application
    Filed: October 29, 2010
    Publication date: May 3, 2012
    Applicant: BRUKER NANO INC
    Inventors: ERIK NOVAK, Florin Munteanu
  • Patent number: 7808652
    Abstract: An explicit relationship is developed between the ratio of average interferometric modulation produced by diamond-like carbon (DLC)-coated magnetic-head surfaces and the thickness of the DLC layer. Accordingly, the thickness of the DLC layer is calculated in various manners from modulation data acquired for the system using object surfaces of known optical parameters.
    Type: Grant
    Filed: January 18, 2008
    Date of Patent: October 5, 2010
    Assignee: Veeco Instruments, Inc.
    Inventors: Florin Munteanu, Dong Chen, Erik Novak, G. Lawrence Best
  • Publication number: 20090185193
    Abstract: An explicit relationship is developed between the ratio of average interferometric modulation produced by diamond-like carbon (DLC)-coated magnetic-head surfaces and the thickness of the DLC layer. Accordingly, the thickness of the DLC layer is calculated in various manners from modulation data acquired for the system using object surfaces of known optical parameters.
    Type: Application
    Filed: January 18, 2008
    Publication date: July 23, 2009
    Applicant: VEECO INSTRUMENTS, INC.
    Inventors: Florin Munteanu, Dong Chen, Erik L. Novak, G. Lawrence Best
  • Patent number: 7505863
    Abstract: An interferometric intensity equation includes parameters that depend on bandwidth and numerical aperture. An error function based on the difference between actual intensities produced by interferometry and the intensities predicted by the equation is minimized iteratively with respect to the parameters. The scan positions (i.e., the step sizes between frames) that minimized the error function are then used to calculate the phase for each pixel, from which the height can also be calculated in conventional manner. As a result, the phase map generated by the procedure is corrected to a degree of precision significantly better than previously possible.
    Type: Grant
    Filed: July 13, 2007
    Date of Patent: March 17, 2009
    Assignee: Veeco Instruments, Inc.
    Inventors: Florin Munteanu, Joanna Schmit
  • Publication number: 20090018786
    Abstract: An interferometric intensity equation includes parameters that depend on bandwidth and numerical aperture. An error function based on the difference between actual intensities produced by interferometry and the intensities predicted by the equation is minimized iteratively with respect to the parameters. The scan positions (i.e., the step sizes between frames) that minimized the error function are then used to calculate the phase for each pixel, from which the height can also be calculated in conventional manner. As a result, the phase map generated by the procedure is corrected to a degree of precision significantly better than previously possible.
    Type: Application
    Filed: July 13, 2007
    Publication date: January 15, 2009
    Applicant: VEECO INSTRUMENTS, INC.
    Inventors: Florin Munteanu, Joanna Schmit
  • Publication number: 20090002775
    Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.
    Type: Application
    Filed: June 29, 2007
    Publication date: January 1, 2009
    Applicant: VEECO INSTRUMENTS, INC.
    Inventors: Dong Chen, Florin Munteanu, Erik L. Novak, G. Lawrence Best