Patents by Inventor Florin Munteanu
Florin Munteanu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9752868Abstract: A portion of the surface of a cylindrical part with a machined groove is mapped with an optical profilometer during the manufacturing process and the height map is fitted to a virtual cylindrical configuration that best fits the data. Two-dimensional Fourier Transfer analysis of the map data is advantageously used to find the orientation of the groove on the part. The orientation of the groove is then compared to the longitudinal axis of such virtual cylinder to calculate the groove's lead angle. If the measured lead angle is outside a predetermined design tolerance deemed acceptable for manufacturing purposes, the part is removed from the fabrication line.Type: GrantFiled: October 8, 2016Date of Patent: September 5, 2017Assignee: BRUKER NANO INC.Inventors: Erik Novak, Florin Munteanu
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Publication number: 20170023356Abstract: A portion of the surface of a cylindrical part with a machined groove is mapped with an optical profilometer during the manufacturing process and the height map is fitted to a virtual cylindrical configuration that best fits the data. Two-dimensional Fourier Transfer analysis of the map data is advantageously used to find the orientation of the groove on the part. The orientation of the groove is then compared to the longitudinal axis of such virtual cylinder to calculate the groove's lead angle. If the measured lead angle is outside a predetermined design tolerance deemed acceptable for manufacturing purposes, the part is removed from the fabrication line.Type: ApplicationFiled: October 8, 2016Publication date: January 26, 2017Inventors: ERIK NOVAK, FLORIN MUNTEANU
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Patent number: 9282304Abstract: A true-color image of a sample is obtained from interference data captured with a color camera. The irradiance of each color on the respective photo-sensor represents the sum of DC components received from the object and the reference surface and a modulated interference component. The color is determined at each pixel by removing the interference component and the reference-surface component from the irradiance data. The color map so derived is then combined with the height map produced with the same data to yield a true-color 3D map of the sample.Type: GrantFiled: June 2, 2014Date of Patent: March 8, 2016Assignee: BRUKER NANO INC.Inventors: Joanna Schmit, Florin Munteanu
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Patent number: 8482741Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.Type: GrantFiled: June 20, 2012Date of Patent: July 9, 2013Assignee: Bruker Nano Inc.Inventors: Dong Chen, Florin Munteanu, Erik Novak, G. Lawrence Best
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Patent number: 8416425Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.Type: GrantFiled: June 20, 2012Date of Patent: April 9, 2013Assignee: Bruker Nano Inc.Inventors: Florin Munteanu, Dong Chen, Erik Novak, G. Lawrence Best
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Publication number: 20120257216Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.Type: ApplicationFiled: June 20, 2012Publication date: October 11, 2012Applicant: BRUKER NANO INC.Inventors: DONG CHEN, Florin Munteanu, Erik Novak, G. Lawrence Best
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Publication number: 20120257215Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.Type: ApplicationFiled: June 20, 2012Publication date: October 11, 2012Applicant: BRUKER NANO INC.Inventors: Dong Chen, FLORIN MUNTEANU, Erik L. Novak, G. Lawrence Best
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Patent number: 8275573Abstract: An adaptive algorithm is tailored to fit the local fringe frequency of single-frame spatial-carrier data under analysis. Each set of data points used sequentially by the algorithm is first processed with a Fourier Transform to find the local frequency of the fringes being analyzed. That information is then used to adapt the algorithm to the correct phase step thus calculated, thereby optimizing the efficiency and precision with which the algorithm profiles the local surface area. As a result, defects are identified and measured with precision even when the slope of the surface varies locally to the point where the algorithm without adaptive modification would not be effective to measure them. Once so identified, the defects may be measured again locally with greater accuracy by conventional temporal PSI.Type: GrantFiled: November 23, 2009Date of Patent: September 25, 2012Assignee: Bruker Nano, Inc.Inventors: Joanna Schmit, Florin Munteanu
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Patent number: 8213021Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.Type: GrantFiled: June 29, 2007Date of Patent: July 3, 2012Assignee: Veeco Metrology, Inc.Inventors: Dong Chen, Florin Munteanu, Erik Novak, G. Lawrence Best
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Publication number: 20120105864Abstract: A portion of the surface of a cylindrical part with a machined groove is mapped with an optical profilometer and the height map is fitted to a virtual cylindrical configuration that best fits the data. Two-dimensional Fourier Transfer analysis of the map data is advantageously used to find the orientation of the groove on the part. The orientation of the groove is then compared to the longitudinal axis of such virtual cylinder to calculate the groove's lead angle.Type: ApplicationFiled: October 29, 2010Publication date: May 3, 2012Applicant: BRUKER NANO INCInventors: ERIK NOVAK, Florin Munteanu
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Patent number: 7808652Abstract: An explicit relationship is developed between the ratio of average interferometric modulation produced by diamond-like carbon (DLC)-coated magnetic-head surfaces and the thickness of the DLC layer. Accordingly, the thickness of the DLC layer is calculated in various manners from modulation data acquired for the system using object surfaces of known optical parameters.Type: GrantFiled: January 18, 2008Date of Patent: October 5, 2010Assignee: Veeco Instruments, Inc.Inventors: Florin Munteanu, Dong Chen, Erik Novak, G. Lawrence Best
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Publication number: 20090185193Abstract: An explicit relationship is developed between the ratio of average interferometric modulation produced by diamond-like carbon (DLC)-coated magnetic-head surfaces and the thickness of the DLC layer. Accordingly, the thickness of the DLC layer is calculated in various manners from modulation data acquired for the system using object surfaces of known optical parameters.Type: ApplicationFiled: January 18, 2008Publication date: July 23, 2009Applicant: VEECO INSTRUMENTS, INC.Inventors: Florin Munteanu, Dong Chen, Erik L. Novak, G. Lawrence Best
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Patent number: 7505863Abstract: An interferometric intensity equation includes parameters that depend on bandwidth and numerical aperture. An error function based on the difference between actual intensities produced by interferometry and the intensities predicted by the equation is minimized iteratively with respect to the parameters. The scan positions (i.e., the step sizes between frames) that minimized the error function are then used to calculate the phase for each pixel, from which the height can also be calculated in conventional manner. As a result, the phase map generated by the procedure is corrected to a degree of precision significantly better than previously possible.Type: GrantFiled: July 13, 2007Date of Patent: March 17, 2009Assignee: Veeco Instruments, Inc.Inventors: Florin Munteanu, Joanna Schmit
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Publication number: 20090018786Abstract: An interferometric intensity equation includes parameters that depend on bandwidth and numerical aperture. An error function based on the difference between actual intensities produced by interferometry and the intensities predicted by the equation is minimized iteratively with respect to the parameters. The scan positions (i.e., the step sizes between frames) that minimized the error function are then used to calculate the phase for each pixel, from which the height can also be calculated in conventional manner. As a result, the phase map generated by the procedure is corrected to a degree of precision significantly better than previously possible.Type: ApplicationFiled: July 13, 2007Publication date: January 15, 2009Applicant: VEECO INSTRUMENTS, INC.Inventors: Florin Munteanu, Joanna Schmit
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Publication number: 20090002775Abstract: Correction factors for the ALR and PTR parameters of magnetic-head sliders are determined by calculating an effective reflectivity and a corresponding PCOR at each pixel of the air-bearing surface. The absolute value of reflectivity at each pixel of the AlTiC air-bearing surface is obtained from an empirical equation relating it to modulation. The ratio of Al2O3 and TiC in the AlTiC surface is then calculated at every pixel assuming a linear relationship between the absolute value of AlTiC reflectivity and the theoretical reflectivity of each constituent. The linear relationship is then also used to calculate the effective (complex) reflectivity for the AlTiC material from the relative concentrations of Al2O3 and TiC at each pixel.Type: ApplicationFiled: June 29, 2007Publication date: January 1, 2009Applicant: VEECO INSTRUMENTS, INC.Inventors: Dong Chen, Florin Munteanu, Erik L. Novak, G. Lawrence Best