Patents by Inventor Floyd F. Schemmel

Floyd F. Schemmel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for determining a position error in a wafer handling device
    Patent number: 6718227
    Abstract: A system for determining a position error in a wafer handling device includes a control module, an image acquisition module, and an image analysis module. The control module moves a workpiece having one or more reference marks, and the image acquisition module captures an image of at least one reference mark. The image analysis module, which is coupled to the image acquisition module, compares the captured image to stored target information to determine a position error.
    Type: Grant
    Filed: October 12, 2000
    Date of Patent: April 6, 2004
    Assignee: Texas Instruments Incorporated
    Inventors: Floyd F. Schemmel, George W. Reeves, Troy W. Hoehner
  • Adjustable probe for probe assembly
    Patent number: 4973903
    Abstract: An adjustable probe to be utilized in probe card technology during the multiprobe electrical testing of integrated circuits. The adjustable probe includes a pair of slots for expansion/contraction and adjustment to obtain a high degree of planarization and placement accuracy of the probe needle.
    Type: Grant
    Filed: November 8, 1989
    Date of Patent: November 27, 1990
    Assignee: Texas Instruments Incorporated
    Inventor: Floyd F. Schemmel