Patents by Inventor Floyd W. Spencer

Floyd W. Spencer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10001457
    Abstract: Methods and apparatus for enhancing performance curve generation, damage monitoring, and improving non-destructive testing performance. Damage standards used for performance curve generation are monitored using a non-destructive testing (NDT) sensor during a damage evolution test performed with the standard. The evolution test may be intermittently paused to permit ground truth data to be collected in addition to the NDT sensor data. A damage evolution model may be used to estimate ground truth data during the intervening periods of the damage evolution test. The NDT sensor data and ground truth data are used to generate performance curves for the NDT system. Multiple sensors may be monitored at multiple locations on the damage standard and multiple damage evolution tests may be performed with multiple damage standards.
    Type: Grant
    Filed: April 19, 2012
    Date of Patent: June 19, 2018
    Assignee: JENTEK SENSORS, INC.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Floyd W. Spencer, David A. Jablonski, David C. Grundy, Darrell E. Schlicker
  • Patent number: 8494810
    Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.
    Type: Grant
    Filed: June 7, 2010
    Date of Patent: July 23, 2013
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Zilberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
  • Publication number: 20120271824
    Abstract: Methods and apparatus for enhancing performance curve generation, damage monitoring, and improving non-destructive testing performance. Damage standards used for performance curve generation are monitored using a non-destructive testing (NDT) sensor during a damage evolution test performed with the standard. The evolution test may be intermittently paused to permit ground truth data to be collected in addition to the NDT sensor data. A damage evolution model may be used to estimate ground truth data during the intervening periods of the damage evolution test. The NDT sensor data and ground truth data are used to generate performance curves for the NDT system. Multiple sensors may be monitored at multiple locations on the damage standard and multiple damage evolution tests may be performed with multiple damage standards.
    Type: Application
    Filed: April 19, 2012
    Publication date: October 25, 2012
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Floyd W. Spencer, David A. Jablonski, David C. Grundy, Darrell E. Schlicker
  • Publication number: 20110060568
    Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.
    Type: Application
    Filed: June 7, 2010
    Publication date: March 10, 2011
    Applicant: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Zilberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
  • Publication number: 20110054806
    Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.
    Type: Application
    Filed: June 7, 2010
    Publication date: March 3, 2011
    Applicant: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Ziberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer