Abstract: A public key cryptography (PKI or other similar system) is used to sent partial or multiple of encryption or decryption algorithm (cipher or decipher) to the data sender or receiver to encrypt or decrypt the data to be sent or received and destroy itself after each or multiple use. Since the encryption algorithm is protected, it can be devised very small in size in compare to the data to be sent and the user can afford to use large key size in it's transmission to increase protection without significant compact to the overall speed. Without knowing the encryption algorithm, which may also be changing from time to time, it will be impossible to use brut force to break the code provided that the algorithm scheme is designed properly. It is due to that there are unlimited numbers of new or old algorithms with countless variations and it takes years of supper fast computing time to break even few algorithms.

Abstract: A method is used for configuring an electronic device to reduce a skew of a parameter. The method includes a step of incorporating a plurality of controllable built-in parameter variation adjusting circuits for effecting a small step-change in the parameter at different points of the electronic device for reducing said skew of the parameter. A specific example of the method is to incorporate one or a plurality of field programmable gate arrays for reducing the skew of time delays. Another method is using the capability of programmable data path and loading of FPGA to create programmable delay line and controllable delays.

Abstract: A method for configuring a testing system that includes a step of connecting a commercially available computer (CACMP) for directly controlling transmission of a plurality of test vectors to a test head. The method further includes a step of connecting a test vector memory between the CACMP and the formatter unit (FTM) with response unit (RP) for providing a required data width for storing the test vectors therein.

Abstract: A method for generating test pattern signals weighted by the fault probability to greatly simplify the test process and to reduce the number of test vectors required for conducting the integrated circuit functionality tests. The method takes into consideration that the electrical short conditions occur mostly between adjacent nodes. The “fault coverage” concept is revised to test faults occurred between adjacent nodes and the test vectors are generated based a fault-probability weighted algorithm such that tests are conducted mostly on connections between adjacent nodes either on a same horizontal layer of between vertical nodes having vertical overlapping areas.

Abstract: A method for testing an integrated circuit (IC) that includes a step of mechanically turning on off an electrical connection to a test pin disposed on an electronic test head. The method further includes a step of rotating a driving rod to engage a switching wheel or other similar means for turning on-off of an electrical connection.

Abstract: A method for configuring a testing system that includes a step of connecting a commercially available computer (CACMP) for directly controlling transmission of a plurality of test vectors to a test head. The method further includes a step of connecting a test vector memory between the CACMP and the formatter unit (FTM) with response unit (RP) for providing a required data width for storing the test vectors therein.

Abstract: A method is used for configuring an electronic device to reduce a skew of a parameter. The method includes a step of incorporating a plurality of controllable built-in parameter variation adjusting circuits for effecting a small step-change in the parameter at different points of the electronic device for reducing said skew of the parameter. A specific example of the method is to incorporate one or a plurality of field programmable gate arrays for reducing the skew of time delays. Another method is using the capability of programmable data path and loading of FPGA to create programmable delay line and controllable delays.

Abstract: A method for generating test pattern signals weighted by the fault probability to greatly simplify the test process and to reduce the number of test vectors required for conducting the integrated circuit functionality tests. The method takes into consideration that the electrical short conditions occur mostly between adjacent nodes. The “fault coverage” concept is revised to test faults occurred between adjacent nodes and the test vectors are generated based a fault-probability weighted algorithm such that tests are conducted mostly on connections between adjacent nodes either on a same horizontal layer of between vertical nodes having vertical overlapping areas.

Abstract: A method for generating test pattern signals weighted by the fault probability to greatly simplify the test process and to reduce the number of test vectors required for conducting the integrated circuit functionality tests. The method takes into consideration that the electrical short conditions occur mostly between adjacent nodes. The “fault coverage” concept is revised to test faults occurred between adjacent nodes and the test vectors are generated based a fault-probability weighted algorithm such that tests are conducted mostly on connections between adjacent nodes either on a same horizontal layer or on adjacent vertical layer having vertical overlapping areas.

Abstract: A public key cryptography (PKI or other similar system) is used to sent partial or multiple of encryption or decryption algorithm (cipher or decipher) to the data sender or receiver to encrypt or decrypt the data to be sent or received and destroy itself after each or multiple use. Since the encryption algorithm is protected, it can be devised very small in size in compare to the data to be sent and the user can afford to use large key size in it's transmission to increase protection without significant compact to the overall speed. Without knowing the encryption algorithm, which may also be changing from time to time, it will be impossible to use brut force to break the code provided that the algorithm scheme is designed properly. It is due to that there are unlimited numbers of new or old algorithms with countless variations and it takes years of supper fast computing time to break even few algorithms.

Abstract: A method for arranging a plurality of seats in a moving vehicle, e.g., an airplane cabinet, is disclosed in this invention. The method includes a step of arranging at least two adjacent seats having two different elevation levels relative to a floor of said airplane cabinet. In a preferred embodiment, seats between two adjacent rows in the airplane cabinet having two different elevation levels. In another preferred embodiment, the method further includes a step of providing a space below a row of seats having a higher elevation to store a luggage therein.

Abstract: A method for testing an integrated circuit (IC) that includes a step of mechanically turning on off an electrical connection to a test pin disposed on an electronic test head. The method further includes a step of rotating a driving rod to engage a switching wheel or other similar means for turning on-off of an electrical connection.

Abstract: An integrated circuit (IC) testing system is provided by the present invention. The IC testing system is for testing a device under test (DUT) IC. The IC testing system includes an interface to a target system. The target system incorporates a known good IC (KGIC) which is identical to the DUT. The KGIC is implemented on the target system as it is designed to be used during the normal operation of the target system. The target system will then exercise the KGIC by running the diagnostic programs or by sending appropriate instructions or commands to invoke the KGIC to perform different functions for the target system. The interface system provided by the present invention for performing an IC test will then capture the signals to and from the KGIC on-the-fly. The testing system of the present invention will redirect the KGIC input signals to the DUT as testing input signals, i.e., input stimuli.

Abstract: A data processing system using a prefetch mechanism with high speed cache memory to increase the processing speed. Data is prefetched from a low speed main memory to the cache memory for data transfer instructions via multiple ports. For a program control transfer instruction, the prefetch mechanism prefetches instruction for each possible program path, stores them in the cache memory and continues with the prefetch processes.