Patents by Inventor Fook C. Cheong

Fook C. Cheong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9810894
    Abstract: In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium.
    Type: Grant
    Filed: July 29, 2014
    Date of Patent: November 7, 2017
    Assignee: NEW YORK UNIVERSITY
    Inventors: David G. Grier, Sang-Hyuk Lee, Fook C. Cheong
  • Publication number: 20140333935
    Abstract: In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium.
    Type: Application
    Filed: July 29, 2014
    Publication date: November 13, 2014
    Inventors: David G. Grier, Sang-Hyuk Lee, Fook C. Cheong
  • Patent number: 8791985
    Abstract: In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium.
    Type: Grant
    Filed: October 30, 2008
    Date of Patent: July 29, 2014
    Assignee: New York University
    Inventors: David G. Grier, Sang-Hyuk Lee, Fook C. Cheong
  • Publication number: 20110043607
    Abstract: In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium.
    Type: Application
    Filed: October 30, 2008
    Publication date: February 24, 2011
    Inventors: David G. Grier, Sang-Hyuk Lee, Fook C. Cheong