Abstract: A method for determining a height of a feature of an object is provided. The method includes generating, using a computing device, on an image of a scan volume that includes the object, a marker that crosses an edge of the feature, calculating, using the computing device, for each of a plurality of laminographic images, a profile along the generated marker, each laminographic image having an associated height, computing, using the computing device, an edge slope associated with the feature for each of the plurality of profiles, identifying, using the computing device, a focused laminographic image as the laminographic image of the plurality of laminographic images having the steepest edge slope, and determining the height of the object as the height associated with the focused laminographic image.

Abstract: An integrated X-ray source is provided. The integrated X-ray source includes a target for emitting X-rays upon being struck by one or more excitation beams, and one or more total internal reflection multilayer optic devices in physical contact with the target to transmit at least a portion of the X rays through total internal reflection to produce X-ray beams, wherein the optic device comprises an input face for receiving the X rays and an output face through which the X-ray beams exit the integrated X-ray source.

Abstract: An X-ray imaging system that produces one or more fan-shaped beams is described. The system includes a target for emitting X rays that includes at least one target focal spot, and one or more graded multilayer optic devices in optical communication with the target. The optics transmits at least a portion of the source X rays to produce the one or more fan-shaped beams. The graded multilayer optic devices include at least a first graded multilayer section for redirecting and transmitting X rays through total internal reflection. The graded multilayer section includes a high-index layer of material having a first complex refractive index n1, a low-index layer of material having a second complex refractive index n2, and a grading zone disposed between the high-index and low-index layers of material. The grading zone includes a grading layer having a third complex refractive index n3 such that Re(n1)>Re(n2)>Re(n3).

Abstract: An integrated X-ray source is provided. The integrated X-ray source includes a target for emitting X-rays upon being struck by one or more excitation beams, and one or more total internal reflection multilayer optic devices in physical contact with the target to transmit at least a portion of the X rays through total internal reflection to produce X-ray beams, wherein the optic device comprises an input face for receiving the X rays and an output face through which the X-ray beams exit the integrated X-ray source.

Abstract: Intra-detector scatter correction methods to improve X-ray images. The method of correcting an X-ray image includes: receiving an original two-dimensional X-ray image; calculating a theoretical scattered image for a array of detector pixels by generating a theoretical point spread (TPS) function of a single pixel for a single line array of detector pixels, based on a system parameter; aggregating the TPS function into a full rotation of line arrays, so as to generating a TPS function for a 2-dimensional array of pixels; and applying the TPS function for a 2-dimensional array of pixels to a plurality of pixels in the detector; and then subtracting the theoretical scattered image from the original two-dimensional X-ray image, so as to create an improved X-ray image.

Abstract: A system for producing at least one high flux photon beam is provided. The system includes two or more photon sources configured to produce photon beams, and at least one first stage optic device coupled to at least one of the photon sources and providing at least one focused photon beam through total internal reflection, wherein at least one of the photon beams and the focused photon beams are combined at a virtual focal spot.

Abstract: An imaging technique is provided for acquiring scatter free images of an object. The technique includes acquiring a plurality of projection images of the object using a source and a detector oriented at a plurality of projection angles relative to the object, and generating a plurality of scatter free projection images by correcting the plurality of projection images based on respective ones of a plurality of stored scatter images. The scatter images are generated and stored for each of the projection angles by positioning a scatter rejection plate between the object and the detector. The technique further includes reconstructing a three-dimensional image of the object based on the scatter free projection images.

Abstract: An X-ray imaging system that produces one or more fan-shaped beams is described. The system includes a target for emitting X rays that includes at least one target focal spot, and one or more graded multilayer optic devices in optical communication with the target. The optics transmits at least a portion of the source X rays to produce the one or more fan-shaped beams. The graded multilayer optic devices include at least a first graded multilayer section for redirecting and transmitting X rays through total internal reflection. The graded multilayer section includes a high-index layer of material having a first complex refractive index n1, a low-index layer of material having a second complex refractive index n2, and a grading zone disposed between the high-index and low-index layers of material. The grading zone includes a grading layer having a third complex refractive index n3 such that Re(n1)>Re(n2)>Re(n3).

Abstract: Imaging systems including a multiple focal spot x-ray source adapted to irradiate an object with a series of angularly displaced x-ray beams, one at a time, without substantial rotation or translation of the multiple focal spot x-ray source are provided. Such systems also includes a detector adapted to receive at least a fraction of the angularly displaced x-ray beams after being attenuated by the object to produce at least two x-ray projection images of the object. The imaging systems also include a processor adapted to shift and add the at least two x-ray projection images to bring at least two planes of the object into focus, one at a time.

Abstract: A method is provided for processing an image. The method comprises identifying one or more contours or surfaces in a two-dimensional or three-dimensional image generated from a set of projection data. The set of projection data is differentially processed based on the identification of those data points that largely define one or more contours or surfaces. An enhanced image set is reconstructed from the set of processed projection data.

Abstract: A system for producing at least one high flux photon beam is provided. The system includes two or more photon sources configured to produce photon beams, and at least one first stage optic device coupled to at least one of the photon sources and providing at least one focused photon beam through total internal reflection, wherein at least one of the photon beams and the focused photon beams are combined at a virtual focal spot.

Abstract: An inspection system is provided. The inspection system includes at least one source configured to emit a beam of radiation onto an object. The inspection system also includes at least two area detectors having different characteristics configured to receive a reflected beam of radiation from the object and output a plurality of image data streams corresponding to the different characteristics, wherein the at least two area detectors disposed in at least one of a cascaded arrangement or separated by a pre-determined distance along a direction parallel or perpendicular to a scan direction of the object.

Abstract: A system and method for ascertaining the identity of an object within an enclosed article. The system includes an acquisition subsystem, a reconstruction subsystem, a computer-aided detection (CAD) subsystem, and an alarm resolution subsystem. The acquisition subsystem communicates view data to the reconstruction subsystem, which reconstructs it into image data and communicates it to the CAD subsystem. The CAD subsystem analyzes the image data to ascertain whether it contains any area of interest. A feedback loop between the reconstruction and CAD subsystems allows for continued, more extensive analysis of the object. Other information, such as risk variables or trace chemical detection information may be communicated to the CAD subsystem to dynamically adjust the computational load of the analysis.

Abstract: An integrated, multi-sensor, Level 1 screening device is described, which system provides a next-generation Explosives Detection System (EDS) that enables high throughput, while drastically reducing false alarms. In exemplary embodiments, the present system comprises a non-rotational, Computed Tomography (CT) system and a non-translational, X-ray diffraction (XRD) system, both in an inline configuration.

Abstract: Disclosed herein is a method for detecting high atomic number elements in an article by using radiation having two different energies. The detecting of high atomic number elements can be accomplished by using an algorithm, curve fitting or using a data table. Disclosed herein too is a radiation system that uses the aforementioned method for detecting high atomic number elements.

Abstract: Disclosed herein is a method for detecting high atomic number elements in an article by using radiation having two different energies. The detecting of high atomic number elements can be accomplished by using an algorithm, curve fitting or using a data table. Disclosed herein too is a radiation system that uses the aforementioned method for detecting high atomic number elements.

Abstract: A multi-energy imaging system and method for selectively generating high-energy X-rays and low-energy X-ray beams are described. A pair of optic devices are used, one optic device being formed to emit high X-ray energies and the other optic device being formed to emit low X-ray energies. A selective filtering mechanism is used to filter the high X-ray energies from the low X-ray energies. The optic devices have at least a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a second photon transmission property. The first and second layers are conformal to each other.

Abstract: An imaging technique is provided for acquiring scatter free images of an object. The technique includes acquiring a plurality of projection images of the object using a source and a detector oriented at a plurality of projection angles relative to the object, and generating a plurality of scatter free projection images by correcting the plurality of projection images based on respective ones of a plurality of stored scatter images. The scatter images are generated and stored for each of the projection angles by positioning a scatter rejection plate between the object and the detector. The technique further includes reconstructing a three-dimensional image of the object based on the scatter free projection images.

Abstract: A cargo container inspection radiation detector apparatus is disclosed. The apparatus includes a support, and a plurality of area radiation detectors disposed upon the support arranged corresponding to a height of the cargo container, each area radiation detector comprising an active area defined by a matrix of pixels.

Abstract: An inspection system is provided. The inspection system includes at least one radiation source including single or multiple energies and configured to transmit a radiation beam through an object under inspection. The inspection system further includes an array of detectors configured to receive multiple radiation beams transmitted through the object, wherein the array of detectors are oriented at different angles with respect to the radiation beam and wherein at least one of the radiation source, and the array of detectors or the object is configured to be actuated in a translational direction relative to each other. The inspection system further includes processing circuitry coupled to the array of detectors and configured to generate a three dimensional image of the object.