Abstract: A hardware emulation system for emulating an integrated circuit design under test (DUT) includes a switch system, FPGAs and serial transmitter and receiver circuitry. The switch system has input and output ports and is configurable to change which ports are connected to each other. The FPGAs are configurable to emulate a functionality of the DUT. The functionality of the DUT is partitioned across multiple FPGAs. The serial transmitter circuitry transmits data from the FPGAs on serial lines to the ports of the switch system. The serial receiver circuitry receives data for the FPGAs on serial lines from the ports of the switch system.

Abstract: A hardware emulation system for emulating an integrated circuit design under test (DUT) includes a switch system, FPGAs and serial transmitter and receiver circuitry. The switch system has input and output ports and is configurable to change which ports are connected to each other. The FPGAs are configurable to emulate a functionality of the DUT. The functionality of the DUT is partitioned across multiple FPGAs. The serial transmitter circuitry transmits data from the FPGAs on serial lines to the ports of the switch system. The serial receiver circuitry receives data for the FPGAs on serial lines from the ports of the switch system.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: A method for generating a circuit description for a multi-die field-programmable gate array, FPGA, comprising a first FPGA die and at least one further FPGA die is described. The method is performed in an FPGA design tool and comprises automatically evaluating a first and a second partition of a partitioned circuit description, the partitions being associated with respective ones of the FPGA dies. At least one multiplexing element is inserted into the first partition and a corresponding de-multiplexing element is inserted into the second partition based on the automated evaluation.

Abstract: The method of emulating the design under test associated with a test environment comprises two distinct generating phases comprising a first phase of generating (80) a first file (FCH1) for configuring the test environment, and a second phase of generating (81) a second file (FCH2) for configuring at least a part of the design under test, the delivery of the first configuration file to a first reconfigurable hardware part (BTR) forming a reconfigurable test bench so as to configure the test bench, and the delivery of the second configuration file to a second reconfigurable hardware part (EML) so as to configure an emulator of the design under test, the two hardware parts being distinct and mutually connected.

Abstract: The method of emulating the design under test associated with a test environment comprises two distinct generating phases comprising a first phase of generating (80) a first file (FCH1) for configuring the test environment, and a second phase of generating (81) a second file (FCH2) for configuring at least a part of the design under test, the delivery of the first configuration file to a first reconfigurable hardware part (BTR) forming a reconfigurable test bench so as to configure the test bench, and the delivery of the second configuration file to a second reconfigurable hardware part (EML) so as to configure an emulator of the design under test, the two hardware parts being distinct and mutually connected.