Abstract: An optoelectronic system for measuring physical parameters comprising: two narrow band light sources with different peak frequencies coupled together into a combined light using a coupler. The combined light is split into a first Fabry-Pérot interferometer arranged to be exposed to both temperature and physical parameter of interest and a second Fabry-Pérot interferometer arranged to be exposed only to temperature. The system further comprises first and second optical detectors arranged to receive light reflected from the cavities of the first and second Fabry-Pérot interferometers respectively through an optical path comprising a combination of lenses and/or mirrors and a Fizeau interferometer. A processor is arranged to analyze the data received by the first optical detector and second optical detector and calculate a value for temperature and the physical parameter of interest.