Patents by Inventor Fran Byrnes

Fran Byrnes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10330563
    Abstract: A system and method to substantiate safe-life criteria of a structure with an anomaly includes a flaw in a critical loaded region of a test structure; a processor; and memory having instructions stored thereon that, when executed by the processor, cause the system to receive first signals indicative of strain energy release rates (SERR) for the flaw at the critical loaded region of a test structure; fit the first signals for the flaw SERR to a Benzeggah-Kenane (B-K) mixed mode curve shape; determine values indicative of B-K criteria of the test structure in response to the fitting of the first signals; receive second signals indicative of SERR for the production structure; and compare the second signals with the B-K criteria of the test structure to substantiate the safe-life criteria.
    Type: Grant
    Filed: March 26, 2014
    Date of Patent: June 25, 2019
    Assignee: SIKORSKY AIRCRAFT CORPORATION
    Inventors: Yih-Farn Chen, Leon M. Meyer, Fran Byrnes
  • Publication number: 20170108402
    Abstract: A system and method to substantiate safe-life criteria of a structure with an anomaly includes a flaw in a critical loaded region of a test structure; a processor; and memory having instructions stored thereon that, when executed by the processor, cause the system to receive first signals indicative of strain energy release rates (SERR) for the flaw at the critical loaded region of a test structure; fit the first signals for the flaw SERR to a Benzeggah-Kenane (B-K) mixed mode curve shape; determine values indicative of B-K criteria of the test structure in response to the fitting of the first signals; receive second signals indicative of SERR for the production structure; and compare the second signals with the B-K criteria of the test structure to substantiate the safe-life criteria.
    Type: Application
    Filed: March 26, 2014
    Publication date: April 20, 2017
    Inventors: Yih-Farn Chen, Leon M. Meyer, Fran Byrnes