Abstract: An analysis device for analysing a transparent or specular surface of a substrate, the device including a raster located opposite the surface of the substrate to be measured, a video camera for capturing at least one image of the raster deformed by the measured substrate, a raster lighting system, and an image-processing and digital analysis mechanism connected to the video camera. The video camera is a matrix array camera, the raster is provided on a substrate having an oblong shape and is bidirectional including a first pattern extending along a first direction and along a smallest extension of the substrate, the first pattern being transversely periodical to the smallest extension, and a second pattern extending in a second direction perpendicular to the first pattern and along a largest extension of the substrate.

Abstract: The invention relates to a device (1) for analyzing the optical quality of one or more at least partially transparent substrates (2), for example a glass ribbon, run past the device (1), comprising: an illuminating system (4, 6) for forming an image in transmission through the substrate (2) and/or in reflection from the substrate (2); a camera (12) for acquiring the image transmitted and/or reflected by the one or more substrates (2); and a control unit (14) comprising a memory (15) in which programs for controlling the acquisition of the images by the camera (12) are stored, in which: the illuminating system (4, 6) can simultaneously produce illumination of different types in separate illumination zones (8A, 8B, 8C, 10A, 10B, 10C) through which the or each substrate (2) is intended to run; the camera (12) is a matrix camera and can acquire an image with a plurality of rows of pixels, the device (1) being configured such that the camera (12) can simultaneously acquire images with a plurality of groups of a

Abstract: A device for analyzing a transparent surface of a substrate including a reference pattern facing a surface of the substrate to be measured. The reference pattern is formed on a support of short and long extents. A camera is provided for taking at least one image of the reference pattern distorted by the measured substrate. A reference pattern illumination system and a processor for processing the image and digital analysis are connected to the camera. The support is of oblong shape and the reference pattern is a one-directional pattern that extends along the shortest extent of the support. The pattern is transversely periodic to the short extent, and the camera is a linear camera.

Abstract: A device for analyzing a transparent surface of a substrate including a reference pattern facing a surface of the substrate to be measured. The reference pattern is formed on a support of short and long extents. A camera is provided for taking at least one image of the reference pattern distorted by the measured substrate. A reference pattern illumination system and a processor for processing the image and digital analysis are connected to the camera. The support is of oblong shape and the reference pattern is a one-directional pattern that extends along the shortest extent of the support. The pattern is transversely periodic to the short extent, and the camera is a linear camera.

Abstract: An analysis device for analysing a transparent or specular surface of a substrate, the device including a raster located opposite the surface of the substrate to be measured, a video camera for capturing at least one image of the raster deformed by the measured substrate, a raster lighting system, and an image-processing and digital analysis mechanism connected to the video camera. The video camera is a matrix array camera, the raster is provided on a substrate having an oblong shape and is bidirectional including a first pattern extending along a first direction and along a smallest extension of the substrate, the first pattern being transversely periodical to the smallest extension, and a second pattern extending in a second direction perpendicular to the first pattern and along a largest extension of the substrate.