Abstract: An optical system includes a spatial encoding arrangement for generating spatially encoded light with an initial spatial distribution; a coded aperture defining a mask pattern based on the initial spatial distribution of the spatially encoded light; and—an image sensor. The spatial encoding arrangement—directs the spatially encoded light onto the object, and the object reflects at least a portion of the spatially encoded light to form reflected light. The reflected light is directed through the coded aperture to form spatially decoded light. The spatially decoded light is directed onto the image sensor to form an image thereon, and the image sensor detects the image. The spatial encoding arrangement includes optical emitters spatially arranged, defining the initial spatial pattern of the spatially encoded light. The mask pattern is the inverse of the initial spatial pattern of the spatially encoded light defined by the spatial arrangement of the optical emitters.

Abstract: An optical module includes a display including light emitting elements that emit visible light. The optical module also includes an image sensor layer including infra-red light sensitive elements. The optical module further includes a mask layer configured to block infra-red light having a wavelength in one or more portions of the infra-red optical spectrum and pass visible light. The optical module is lensless.

Abstract: A substantially planar light replication or re-transmission component having an incident light receiving surface and an opposed light emitting surface. The component comprises a substantially transparent planar substrate, one or more bipolar junction transistors provided on said substrate, the or each transistor comprising a collector region adjacent to said light receiving surface, an emitter region adjacent to said light emitting surface, and a base region between said collector region and said emitter region, and circuitry for biasing the bipolar transistors in use. The or each transistor is configured and biased in use so that said collector and base regions of the transistor operate as a photodiode whilst said base and emitter regions operate as a light emitting diode.

Abstract: A sensing system may include a first coded aperture configured to receive incident light and transmit a coded image of an object. The sensing system comprises a light replication component configured to detect the coded image and emit a replicated coded image. The sensing system may include a second coded aperture configured to receive the replicated coded image and transmit a decoded image. The sensing system may include a sensor configured to detect the decoded image.

Abstract: A method of calibrating a driving parameter of an optical component across an operating wavelength range of the component. The method comprises placing a layer of material in a light path, the layer of material being substantially planar and substantially transparent and having a thickness of the order of wavelengths in said range and operating said component to vary said driving parameter whilst detecting light transmitted through said layer of material to obtain driving parameter versus light intensity data. The obtained data is then compared with characterizing data previously derived for said layer of material in order to calibrate said driving parameter.

Abstract: According to a first aspect of the present invention there is provided a method of measuring the optical reflectance R of a target using a detection system comprising a light emitter and a light detector spaced apart from one another. The method comprises illuminating the target with the light emitter, detecting light reflected from the target using the light detector, wherein the light detector provides an electrical output signal SS indicative of the intensity of the detected light, and determining the optical reflectance R of the target according to (Formula 1), where RR is the spectral reflectance of a reference standard, SR is the detector electrical output signal with the reference standard in place, SH is the detector electrical output signal with no target in front of the light emitter and light detector, and M is a calibration factor.

Abstract: A spectral sensor comprising a Fabry-Perot interferometer having a pair of reflectors, a photodetector located beneath the Fabry-Perot interferometer, a capacitance measurement circuit configured to measure a capacitance of the Fabry-Perot interferometer, and a controller configured to control a voltage applied across the reflectors of the Fabry-Perot interferometer.