Abstract: A processing device in a memory sub-system identifies a set of parameters associated with one or more errors detected with respect to a memory device of a memory sub-system. A vector representing the set of parameters is generated. Based on the vector, a classification value corresponding to the one or more errors is generated. Based on the classification value, a set of error recovery operations is selected from a plurality of sets of error recovery operations, and the set of error recovery operations is executed.

Abstract: A memory sub-system causing execution of a first wordline leakage test of a first wordline group of a set of wordline groups of a memory block in response to determining a temperature of the memory block is within a threshold temperature range. A first result of the first wordline leakage test is determined. A second wordline leakage test of a second wordline group is caused to be executed and a second result is determined. A determination is made that the first result of the first wordline leakage test of the first wordline group satisfies a first condition. A determination is made that the second result of the second wordline leakage test of the second wordline group satisfies a second condition. In response to satisfaction of the conditions, an action is executed.

Abstract: A processing device in a memory sub-system determines whether a media endurance metric associated with a memory block of a memory device satisfies one or more conditions. In response to the one or more conditions being satisfied, a temperature of the memory block is compared to a threshold temperature range. In response to determining the temperature of the memory block is within the threshold temperature range, the processing device causes execution of a wordline leakage test of a wordline group of a set of wordline groups of the memory block. A result of the wordline leakage test of the target wordline group is determined and an action is executed based on the result of the wordline leakage test.

Abstract: A processing device in a memory sub-system identifies a set of parameters associated with one or more errors detected with respect to a memory device of a memory sub-system. A vector representing the set of parameters is generated. Based on the vector, a classification value corresponding to the one or more errors is generated. Based on the classification value, a set of error recovery operations is selected from a plurality of sets of error recovery operations, and the set of error recovery operations is executed.

Abstract: A processing device in a memory sub-system determines whether a media endurance metric associated with a memory block of a memory device satisfies one or more conditions. In response to the one or more conditions being satisfied, a temperature of the memory block is compared to a threshold temperature range. In response to determining the temperature of the memory block is within the threshold temperature range, the processing device causes execution of a wordline leakage test of a wordline group of a set of wordline groups of the memory block. A result of the wordline leakage test of the target wordline group is determined and an action is executed based on the result of the wordline leakage test.