Abstract: A method and apparatus for measuring an opening defined within object using an optical sensor system is provided. The method includes positioning an illumination source adjacent the opening, illuminating a perimeter circumscribing the opening, receiving an image of the illuminated boundary, and calculating an area within the received boundary. The system includes a light source oriented to project a first sheet of light intersected by a first portion of the opening perimeter, the light source projecting a second sheet of light intersected by a second portion of the opening perimeter, a light detector receiving a portion of the sheet of light intersected by the object opening perimeter and reflected toward the light detector, and an image processor communicatively coupled to the light detector, the image processor programmed to sample an image from the detector and programmed determine the dimensions of the object opening from the sampled image.

Abstract: The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.

Abstract: The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.

Abstract: A non-contact measurement system employing a non-contact optical sensor and an edge detection sensor with a positioning system for moving the sensors over the surface and edges of a part (A) held in a predetermined, fixed position. The part is aligned in a co-ordinate system for obtaining accurate measurements of the part's surface (S) and edges (E). For parts smaller than the optical sensor's field of view, the part is rotated about an axis so both sides of the part are viewed by the sensor. If required, the part can also be shifted linearly along a horizontal axis (X) parallel to the sensor. For parts larger in size than the sensor's field of view, the part is moved along a vertical axis (Y) in predetermined segments so all of the part is exposed to viewing by the sensor.

Abstract: An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.

Abstract: A collimator for an X-ray inspection apparatus is provided comprising a carrier having a planar top surface; an arcuate base disposed on the carrier, comprising at least one arcuate bar section made from a radio-opaque material; and a plurality of radio-opaque collimator plates disposed on the arcuate base in a radial array with a bottom edge of each collimator plate in contact with the top surface of the arcuate base. A method for assembling such a collimator is also provided, as well as an alignment fixture useful for practicing the described method. The described structure, method, and alignment fixture permit the construction of large collimator assemblies while maintaining precision and minimizing cost.

Abstract: A collimator for an X-ray inspection apparatus is provided comprising a carrier having a planar top surface; an arcuate base disposed on the carrier, comprising at least one arcuate bar section made from a radio-opaque material; and a plurality of radio-opaque collimator plates disposed on the arcuate base in a radial array with a bottom edge of each collimator plate in contact with the top surface of the arcuate base. A method for assembling such a collimator is also provided, as well as an alignment fixture useful for practicing the described method. The described structure, method, and alignment fixture permit the construction of large collimator assemblies while maintaining precision and minimizing cost.

Abstract: An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.

Abstract: An eddy current inspection probe for inspecting a preselected surface. The eddy current inspection probe includes an expandable element at least partially defining an interior space which is expandable by introducing a pressurized fluid into the interior space from a collapsed position to an expanded position for contacting the preselected surface of the component for inspecting the surface. The probe also includes an eddy current array positioned over the expandable element for generating and detecting magnetic fields in the component to inspect the preselected surface.

Abstract: An eddy current inspection probe for inspecting a preselected surface. The eddy current inspection probe includes an expandable element at least partially defining an interior space which is expandable by introducing a pressurized fluid into the interior space from a collapsed position to an expanded position for contacting the preselected surface of the component for inspecting the surface. The probe also includes an eddy current array positioned over the expandable element for generating and detecting magnetic fields in the component to inspect the preselected surface.

Abstract: A detector (20) for high voltage x-rays includes a plurality of sensor elements (22) with each sensor element being aligned along a respective focal axis (25) with respect to a high voltage x-ray source (24). A fiber optic scintillator (34) is optically coupled to each of said sensor elements and is disposed to receive incident x-ray radiation passing from the object to be imaged. Optical fibers of the scintillator are positioned such that their optical axes are perpendicular to incident x-rays. Each sensor element has a length along the focal axis sufficiently long for the fibers to absorb substantially all incident x-rays. Each sensor element comprises an array of amorphous silicon photosensors disposed to detect light generated by the scintillator.