Patents by Inventor Francis X. Bostick, Jr.

Francis X. Bostick, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method using a d.c. source for determining resistivity distribution of the earth as a function of depth
    Patent number: 4835473
    Abstract: An electromagnetic survey method for geophysical exploration, in which the variations in the earth's magnetic field are measured in two, non-parallel directions at one point in the survey area. Simultaneously, the variations in the earth's electrical field parallel to the survey line are measured at a number of points along the survey line. These measured variations are transformed to the frequency domain, and then the horizontal component of the magnetic field orthogonal to the direction of the measured electrical field is calculated. The impedance at each measurement point on the survey line is calculated as a function of frequency, and weighted averages of the impedance for predetermined frequencies using a zero phase length weight function corresponding to a low pass filter applied to the electric field are used to calculate the subsurface conductivity distribution.
    Type: Grant
    Filed: April 15, 1988
    Date of Patent: May 30, 1989
    Assignee: Board of Regents, The University of Texas System
    Inventor: Francis X. Bostick, Jr.
  • Method for geophysical exploration using electromagnetic array
    Patent number: 4757262
    Abstract: An electromagnetic survey method for geophysical exploration, in which the variations in the earth's magnetic field are measured in two, non-parallel directions at one point in the survey area. Simultaneously, the variations in the earth's electrical field parallel to the survey line are measured at a number of points along the survey line. These measured variations are transformed to the frequency domain, and then the horizontal component of the magnetic field orthogonal to the direction of the measured electrical field is calculated. The impedance at each measurement point on the survey line is calculated as a function of frequency, and weighted averages of the impedances for predetermined frequencies using a zero phase length weight function corresponding to a low pass filter applied to the electric field are used to calculate the subsurface conductivity distribution.
    Type: Grant
    Filed: April 25, 1986
    Date of Patent: July 12, 1988
    Assignee: Board of Regents, The University of Texas System
    Inventor: Francis X. Bostick, Jr.
  • Electromagnetic array profiling survey method
    Patent number: 4591791
    Abstract: An electromagnetic survey method for geophysical exploration, in which the variations in the earth's magnetic field are measured in two, non-parallel directions at one point in the survey area. Simultaneously, the variations in the earth's electrical field parallel to the survey line are measured at a number of points along the survey line. These measured variations are transformed to the frequency domain, and then the horizontal component of the magnetic field orthogonal to the direction of the measured electrical field is calculated. The impedance at each measurement point on the survey line is calculated as a function of frequency, and weighted averages of the impedances for predetermined frequencies using a zero phase length weight function corresponding to a low pass filter are used to calculate the subsurface conductivity distribution.
    Type: Grant
    Filed: July 31, 1984
    Date of Patent: May 27, 1986
    Assignee: Board of Regents, University of Texas System
    Inventor: Francis X. Bostick, Jr.