Patents by Inventor Franciscus Godefridus Bijnen

Franciscus Godefridus Bijnen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150370174
    Abstract: A patterning device, for use in forming a marker on a substrate by optical projection, the patterning device including a marker pattern having a density profile that is periodic with a fundamental spatial frequency corresponding to a desired periodicity of the marker to be formed. The density profile is modulated (such as sinusoidally) so as to suppress one or more harmonics of the fundamental frequency, relative to a simple binary profile having the fundamental frequency.
    Type: Application
    Filed: March 6, 2014
    Publication date: December 24, 2015
    Applicant: ASML Netherlands B.V.
    Inventors: Johannes Jacobus Matheus BASELMANS, Franciscus Godefridus BIJNEN, Daniƫlle Elisabeth Maria PALMEN
  • Publication number: 20120127452
    Abstract: A method for alignment of a substrate, in which the substrate includes a mark in a scribe lane, and the scribe lane extends along a longitudinal direction as a first direction. The mark has a periodic structure in the first direction. The method includes providing an illumination beam for scanning the mark in a direction perpendicular to a direction of the mark's periodic structure along a first scan path across the mark, scanning the spot of the illumination beam along a second scan path across the mark, the second scan path being parallel to the first scan path, wherein the second scan path is shifted relative to the first scan path over a first shift that corresponds to a fraction of the repeating distance of the periodic structure.
    Type: Application
    Filed: January 27, 2012
    Publication date: May 24, 2012
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Patrick WARNAAR, Franciscus Godefridus Bijnen
  • Publication number: 20070252994
    Abstract: An alignment apparatus for a substrate bonding system is provided with a first optical arm arranged to direct onto a detector radiation from a first alignment mark on a first substrate, and a second optical arm arranged to direct onto the detector radiation from a second alignment mark on a second substrate. The first alignment mark has a known location relative to a functional pattern provided on an opposite side of the first substrate, and the second alignment mark has a known location relative to a functional pattern provided on an opposite side of the second substrate. The substrate bonding system can be further provided with first and second substrate tables arranged to hold the first and second substrates such that they face one another, at least one of the substrate tables being movable in response to a signal output from the detector, thereby allowing the first and second substrates to be aligned with respect to each other for bonding.
    Type: Application
    Filed: April 27, 2006
    Publication date: November 1, 2007
    Applicant: ASML Netherlands B.V.
    Inventors: Franciscus Godefridus Bijnen, Roy Werkman
  • Publication number: 20070070311
    Abstract: Provided are microdevices, e.g. integrated circuits, with contact bumps and processes for making the same. The microdevices may have contact bumps on two or more sides of the microdevices. Also provided are stacks of microdevices.
    Type: Application
    Filed: September 23, 2005
    Publication date: March 29, 2007
    Applicant: ASML Netherlands B.V.
    Inventors: Franciscus Godefridus Bijnen, Willem Weenink