Abstract: A system for optically scanning a region comprising a sample of which a chemical composition is to be determined, comprising: a pulsed laser source for emitting a pulsed laser beam; a focusing device for adjusting the position of the waist of the laser beam along an optical path of the laser beam; a deflector for adjusting a propagation direction of the laser beam to a given direction; a controller for varying, via the beam deflector, the propagation direction of the pulsed laser beam according to a predefined beam path and varying, via the focusing device, the given position of the waist of the laser beam along the optical path; and a photodetector for detecting light emitted by a plasma created when a given one of laser pulses has an irradiance is greater than a breakdown threshold, the detected light being indicative of the chemical composition of the sample.

Abstract: The present invention provides a method and compact apparatus for laser induced breakdown atomic emission spectroscopy from a targeted sample having a laser generating a laser beam, the laser beam directed to the sample, optical means for manipulating the laser beam in order maximize laser fluency at the target surface of the sample, the laser beam generating ablation and plasma emission from the sample at the target surface, an emission spectrometer having a detector for detecting a plasma plume from the plasma emission.

Abstract: An excitation assembly comprises a symmetrical OMT and two splitters respectively connected to two pathways of the OMT. The OMT comprises a cross junction comprising a central waveguide parallel to an axis Z and four lateral ports oriented in two directions X, Y, the first splitter consisting of an input waveguide and of two output ports coupled to two lateral ports, oriented in the direction X, by respective connection waveguides. The first splitter is located on a lateral side of the OMT, orthogonally to the direction X, and its two output ports are formed one above the other in a lateral wall of the input waveguide, the upper output port being placed facing a first lateral port of the OMT to which it is connected by the first connection waveguide. The difference in electrical length between the two connection waveguides is equal to ?/2.

Abstract: The invention discloses an apparatus and method for use with Laser Induced Breakdown Spectroscopy (LIBS) systems that can be applied to the real time analysis of various materials. The invention, in one aspect, provides a layer-by-layer method to remove the undesired coating layer of a material in which a pulsed laser is coupled with high speed scanning optics. To prepare the surface for LIBS, (i) a pulsed laser beam is scanned over an area of the surface to ablate the surface coating layer; (ii) the laser parameters are changed (i.e. pulse duration is made smaller) and the area scanned again to polish the surface; and (iii) the laser parameters are changed again (i.e. pulse duration is made smaller yet again) and the area scanned again with spectrometric analysis of the plasma plume created by the laser (i.e. LIBS is performed).

Abstract: The present invention provides a method and compact apparatus for laser induced breakdown atomic emission spectroscopy from a targeted sample having a laser generating a laser beam, the laser beam directed to the sample, optical means for manipulating the laser beam in order maximize laser fluency at the target surface of the sample, the laser beam generating ablation and plasma emission from the sample at the target surface, an emission spectrometer having a detector for detecting a plasma plume from the plasma emission.

Abstract: A system for optically scanning a region comprising a sample of which a chemical composition is to be determined, comprising: a pulsed laser source for emitting a pulsed laser beam; a focusing device for adjusting the position of the waist of the laser beam along an optical path of the laser beam; a deflector for adjusting a propagation direction of the laser beam to a given direction; a controller for varying, via the beam deflector, the propagation direction of the pulsed laser beam according to a predefined beam path and varying, via the focusing device, the given position of the waist of the laser beam along the optical path; and a photodetector for detecting light emitted by a plasma created when a given one of laser pulses has an irradiance is greater than a breakdown threshold, the detected light being indicative of the chemical composition of the sample.

Abstract: An excitation assembly comprises a symmetrical OMT and two splitters respectively connected to two pathways of the OMT. The OMT comprises a cross junction comprising a central waveguide parallel to an axis Z and four lateral ports oriented in two directions X, Y, the first splitter consisting of an input waveguide and of two output ports coupled to two lateral ports, oriented in the direction X, by respective connection waveguides. The first splitter is located on a lateral side of the OMT, orthogonally to the direction X, and its two output ports are formed one above the other in a lateral wall of the input waveguide, the upper output port being placed facing a first lateral port of the OMT to which it is connected by the first connection waveguide. The difference in electrical length between the two connection waveguides is equal to ?/2.

Abstract: The invention discloses an apparatus and method for use with Laser Induced Breakdown Spectroscopy (LIBS) systems that can be applied to the real time analysis of various materials. The invention, in one aspect, provides a layer-by-layer method to remove the undesired coating layer of a material in which a pulsed laser is coupled with high speed scanning optics. To prepare the surface for LIBS, (i) a pulsed laser beam is scanned over an area of the surface to ablate the surface coating layer; (ii) the laser parameters are changed (i.e. pulse duration is made smaller) and the area scanned again to polish the surface; and (iii) the laser parameters are changed again (i.e. pulse duration is made smaller yet again) and the area scanned again with spectrometric analysis of the plasma plume created by the laser (i.e. LIBS is performed).