Patents by Inventor Francois Dupis

Francois Dupis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9088260
    Abstract: A method of controlling operating parameters of a radio frequency power amplifier amplifying an input signal applied in bursts with controlled input power to an input of the power amplifier, comprising responding to gain variation parameters relating to variations in the scalar gain of said amplifier starting during an initial ramp-up period of a first burst to control supply voltage and quiescent current parameters for said amplifier during a subsequent burst.
    Type: Grant
    Filed: December 3, 2008
    Date of Patent: July 21, 2015
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Francois Dupis, Jacques Trichet
  • Patent number: 8311494
    Abstract: A test unit for testing the frequency characteristics of one or more components of a transmitter of modulated signals. The test unit includes a data source for generating a test pattern of data. A test unit output is connected to the data source and connectable to an input of one or more of the components, for inputting the test pattern of data to the one or more components. The test unit includes a memory in which a first predetermined data sequence and a second predetermined data sequence are stored. The data source is connected with an data input to the memory, and the data source is arranged to generating the test pattern of data including the predetermined data sequences.
    Type: Grant
    Filed: December 15, 2006
    Date of Patent: November 13, 2012
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Francois Dupis, Xavier Hue, Lionel Mongin, Jacques Trichet
  • Publication number: 20110221523
    Abstract: A method of controlling operating parameters of a radio frequency power amplifier amplifying an input signal applied in bursts with controlled input power to an input of the power amplifier, comprising responding to gain variation parameters relating to variations in the scalar gain of said amplifier starting during an initial ramp-up period of a first burst to control supply voltage and quiescent current parameters for said amplifier during a subsequent burst.
    Type: Application
    Filed: December 3, 2008
    Publication date: September 15, 2011
    Inventors: Francois Dupis, Jacques Trichet
  • Publication number: 20100014570
    Abstract: A test unit for testing the frequency characteristics of one or more components of a transmitter of modulated signals. The test unit includes a data source for generating a test pattern of data. A test unit output is connected to the data source and connectable to an input of one or more of the components, for inputting the test pattern of data to the one or more components. The test unit includes a memory in which a first predetermined data sequence and a second predetermined data sequence are stored. The data source is connected with an data input to the memory, and the data source is arranged to generating the test pattern of data including the predetermined data sequences.
    Type: Application
    Filed: December 15, 2006
    Publication date: January 21, 2010
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Francois Dupis, Xavier Hue, Lionel Mongin, Jacques Trichet