Abstract: A vehicle seat, in particular a motor vehicle seat, having a first structural part (4), a second structural part (6) and at least one fitting (10) that can be locked and unlocked, the fitting (10) having a first fitting part (11), which is at least indirectly connected to the first structural part (4), and a second fitting part (12), which is at least indirectly connected to the second structural part (6). When the fitting (10) is unlocked, an angular position of the second structural part (6) relative to the first structural part (4) can be varied about an axis (A). In at least one angular position of the second structural part (6) relative to the first structural part (4), a spring element (100, 100.1, 200) braces the first fitting part (11) and the second fitting part (12) with respect to each other in the radial direction.

Abstract: A vehicle seat, in particular a motor vehicle seat, having a first structural part (4), a second structural part (6) and at least one fitting (10) that can be locked and unlocked, the fitting (10) having a first fitting part (11), which is at least indirectly connected to the first structural part (4), and a second fitting part (12), which is at least indirectly connected to the second structural part (6). When the fitting (10) is unlocked, an angular position of the second structural part (6) relative to the first structural part (4) can be varied about an axis (A). In at least one angular position of the second structural part (6) relative to the first structural part (4), a spring element (100, 100.1, 200) braces the first fitting part (11) and the second fitting part (12) with respect to each other in the radial direction.

Abstract: Disclosed is a device for the directed capillary transport of liquids, comprising at least two capillaries (8, 9, 33, 54, 55), the at least two capillaries (8, 9, 33, 54, 55) being designed such that the liquid can be transported in at least some regions in a passive, directed and capillary manner, characterised in that at least two of the capillaries (8, 9, 33, 54, 55) are interconnected in the direction of transport of the liquid via at least one capillary passage conduit (20, 23, 28, 29, 34, 40, 41, 59, 63). The invention is intended for use in the separation of components from a fluidic substance and/or in oil/water separation. A production method is characterised in that at least one part of the capillary structure is generated by means of laser irradiation, by means of a moulding tool, in particular a sintering mould, by means of a milling process, in particular by means of a micro-milling process, or by means of EDM.

Abstract: The present invention concerns an antenna (20) with a layered structure, in particular a single or double layer antenna (20) integrated into vehicle-windshield having a conformal foil structure comprising a monopole arm (21) and ground plane arms (22, 23), wherein the antenna (20) has a transparency of 70%-90%.

Abstract: A dielectric interlayer, especially for a storage capacitor, is formed from a layer sequence subjected to a temperature process, wherein the layer sequence has at least a first metal oxide layer and a second metal oxide layer formed by completely oxidizing a metal nitride layer to higher valency.

Abstract: A dielectric interlayer, especially for a storage capacitor, is formed from a layer sequence subjected to a temperature process, wherein the layer sequence has at least a first metal oxide layer and a second metal oxide layer formed by completely oxidizing a metal nitride layer to higher valency.

Abstract: A dielectric interlayer, especially for a storage capacitor, is formed from a layer sequence subjected to a temperature process, wherein the layer sequence has at least a first metal oxide layer and a second metal oxide layer formed by completely oxidizing a metal nitride layer to higher valency.

Abstract: A dielectric interlayer, especially for a storage capacitor, is formed from a layer sequence subjected to a temperature process, wherein the layer sequence has at least a first metal oxide layer and a second metal oxide layer formed by completely oxidizing a metal nitride layer to higher valency.

Abstract: The invention relates to an arrangement for transporting and inspecting semiconductor substrates (6), having at least three workstations (8, 10, 12), a changer (14), which has at least three arms (14a, 14b, 14c) which are designed to load the individual workstations (8, 10, 12) with semiconductor substrates (6). A measuring device (15) is assigned to the second workstation (10), determines the deviation of the current position of the semiconductor substrate (6) and makes it available to the arrangement (3) for the further inspection of the semiconductor substrate (6). In addition, the changer (14) is not equipped with means for exact positioning of the semiconductor substrates (6) in the workstations (8, 10, 12).

Abstract: An arrangement for the identification of a substrate (S) having at least one identification marking (I), comprising a turntable (2) for rotating a substrate (S) placed thereon; an illumination source (4) and a receiving device (5) for evaluating the intensity of the light emerging from the illumination source (4), the edge zone of the substrate (S) placed on the turntable (2), upon rotation thereof, influencing the light intensity striking the receiving device (5); a device (6) for reading the identification marking (I), having a sensing region (E); and a calculation device that calculates a manipulated variable for a correction rotation angle about the rotation axis (A) for alignment of the identification marking (I) with respect to the sensing region (E), and a manipulated variable for a correction motion for changing the position of the sensing region (E) with respect to the rotation axis (A) or with respect to the actual position of the identification marking (I), and outputs them to a positioning devi

Abstract: The invention relates to an arrangement for transporting and inspecting semiconductor substrates (6), having at least three workstations (8, 10, 12), a changer (14), which has at least three arms (14a, 14b, 14c) which are designed to load the individual workstations (8, 10, 12) with semiconductor substrates (6). A measuring device (15) is assigned to the second workstation (10), determines the deviation of the current position of the semiconductor substrate (6) and makes it available to the arrangement (3) for the further inspection of the semiconductor substrate (6). In addition, the changer (14) is not equipped with means for exact positioning of the semiconductor substrates (6) in the workstations (8, 10, 12).

Abstract: The invention relates to an arrangement for transporting and inspecting semiconductor substrates (6), having at least three workstations (8, 10, 12), a changer (14), which has at least three arms (14a, 14b, 14c) which are designed to load the individual workstations (8, 10, 12) with semiconductor substrates (6). A measuring device (15) is assigned to the second workstation (10), determines the deviation of the current position of the semiconductor substrate (6) and makes it available to the arrangement (3) for the further inspection of the semiconductor substrate (6). In addition, the changer (14) is not equipped with means for exact positioning of the semiconductor substrates (6) in the workstations (8, 10, 12).

Abstract: The invention relates to an arrangement for transporting and inspecting semiconductor substrates (6), having at least three workstations (8, 10, 12), a changer (14), which has at least three arms (14a, 14b, 14c) which are designed to load the individual workstations (8, 10, 12) with semiconductor substrates (6). A measuring device (15) is assigned to the second workstation (10), determines the deviation of the current position of the semiconductor substrate (6) and makes it available to the arrangement (3) for the further inspection of the semiconductor substrate (6). In addition, the changer (14) is not equipped with means for exact positioning of the semiconductor substrates (6) in the workstations (8, 10, 12).

Abstract: The invention relates to an arrangement for transporting and inspecting semiconductor substrates (6), having at least three workstations (8, 10, 12), a changer (14), which has at least three arms (14a, 14b, 14c ) which are designed to load the individual workstations (8, 10, 12) with semiconductor substrates (6). A measuring device (15) is assigned to the second workstation (10), determines the deviation of the current position of the semiconductor substrate (6) and makes it available to the arrangement (3) for the further inspection of the semiconductor substrate (6). In addition, the changer (14) is not equipped with means for exact positioning of the semiconductor substrates (6) in the workstations (8, 10, 12).

Abstract: The invention concerns an arrangement for wafer inspection, having a device (3) for transporting the wafers (S) from a transfer station (5) to at least one inspection station (7, 9). For transportation of the wafers (S), the device (3) comprises a feeder (4), rotatable about a rotation axis (Z), having at least one wafer support (14) whose position is pivotable, with the rotation of the feeder (4), between the transfer station (5) and inspection station (7, 9); and a drive device (18) that is coupled to the feeder (4) and with the activation of which the feeder (4) is caused to rotate through a predefined reference rotation angle.

Abstract: The invention relates to an arrangement for transporting and inspecting semiconductor substrates (6), having at least three workstations (8, 10, 12), a changer (14), which has at least three arms (14a, 14b, 14c) which are designed to load the individual workstations (8, 10, 12) with semiconductor substrates (6). A measuring device (15) is assigned to the second workstation (10), determines the deviation of the current position of the semiconductor substrate (6) and makes it available to the arrangement (3) for the further inspection of the semiconductor substrate (6). In addition, the changer (14) is not equipped with means for exact positioning of the semiconductor substrates (6) in the workstations (8, 10, 12).

Abstract: An arrangement for the identification of a substrate (S) having at least one identification marking (I), comprising