Patents by Inventor Frank Damacio Luna

Frank Damacio Luna has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Object inspection system and method for inspecting an object
    Patent number: 11937020
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Grant
    Filed: March 16, 2022
    Date of Patent: March 19, 2024
    Assignee: Inovision Software Solutions, Inc.
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • OBJECT INSPECTION SYSTEM AND METHOD FOR INSPECTING AN OBJECT
    Publication number: 20220264057
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Application
    Filed: March 16, 2022
    Publication date: August 18, 2022
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Object inspection system and method for inspecting an object
    Patent number: 11310467
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Grant
    Filed: May 4, 2020
    Date of Patent: April 19, 2022
    Assignee: INOVISION SOFTWARE SOLUTIONS, INC.
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • OBJECT INSPECTION SYSTEM AND METHOD FOR INSPECTING AN OBJECT
    Publication number: 20200344449
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Application
    Filed: May 4, 2020
    Publication date: October 29, 2020
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Object Inspection System And Method For Inspecting An Object
    Publication number: 20190238796
    Abstract: An object inspection system 10 and a method for detecting defects which utilizes a plurality of cameras 26 and lights 18 to capture images of a portion of an object 14 and which uses the captured images to determine the presence of a defect upon a surface, such as surface 12, of the object 14 and which may communicated the location of the identified defect to an automated defect repair assembly 9.
    Type: Application
    Filed: May 9, 2018
    Publication date: August 1, 2019
    Inventors: Jacob Nathaniel Allen, Brandon David See, Frank Damacio Luna, Zhipeng Liang
  • OBJECT INSPECTION SYSTEM AND METHOD FOR INSPECTING AN OBJECT
    Publication number: 20190096057
    Abstract: An object inspection system 10 and a method for detecting defects which utilizes a plurality of cameras 26 and lights 18 to capture images of a portion of an object 14 and which uses the captured images to determine the presence of a defect upon a surface, such as surface 12, of the object 14 and which may communicated the location of the identified defect to an automated defect repair assembly 9.
    Type: Application
    Filed: May 9, 2018
    Publication date: March 28, 2019
    Inventors: Jacob Nathaniel Allen, Brandon David See, Zhipeng Liang, Frank Damacio Luna