Abstract: An electrically insulating touch protection device for an electrical conductor includes an insulating tube and a housing receiving an end of the electrical conductor. The housing has an end section pointing toward the insulating tube. The end section has a first segment and a second segment. The first segment is inserted into the insulating tube and the second segment is placed on the insulating tube.

Abstract: A device for the shakeproof accommodation of electrical special components and/or electrical circuits, particularly in a development as a second component set in a control unit, is made up of a carrier, onto which a circuit substrate, having special components fastened to it, is mounted in an electrically insulated manner over a partial surface, preferably by adhesion

Abstract: A method and system for repairing defective memory in a semiconductor chip. The chip has memory locations, redundant memory, and a central location for ordered fuses. The ordered fuses identify in compressed format defective sections of the memory locations. The defective sections are replaceable by sections of the redundant memory. The ordered fuses have an associated a fuse bit pattern of bits which sequentially represents the defective sections in the compressed format. The method and system determines the order in which the memory locations are wired together; designs a shift register of latches through the memory locations in accordance with the order in which the memory locations are wired together; and associates each of the latches with a corresponding bit of an uncompressed bit pattern from which the fuse bit pattern is derived. The uncompressed bit pattern comprises a sequence of bits, representing the defective sections in uncompressed format.

Abstract: A method and system for generating a set of scan diagnostic patterns for diagnosing fails in scan chains. The method including: (a) selecting a set of latches; (b) selecting a pattern from a set of test patterns; (c) determining the number of lateral insertions of the selected pattern; (d) determining a number of new lateral insertions that the selected pattern would add to the set of scan diagnostic pattern and adding the selected pattern and a corresponding new insertion count to a count list; (e) repeating steps (b) through (d) until all patterns of the set of test patterns have been selected; (f) selecting a pattern from the count list; (g) adding the pattern selected from the count list to the set of scan diagnostic patterns; and (h) repeating steps (b) through (g) until a there are a predetermined number of patterns in the set of scan diagnostic patterns.

Abstract: The pressure plate has at least one friction surface region which can be pressed against a friction facing arrangement of a clutch disk or the like, wherein the pressure plate is formed at least partially from a first material, and wherein a second material having thermal contact with the first material is provided in the pressure plate at least in some areas. In order to be able to compensate for negative umbrella deformation of the pressure plate caused by friction heat during operation of the clutch, the second material has a different thermal expansion, particularly a greater thermal expansion, than the first material.

Abstract: The pressure plate has at least one friction surface region which can be pressed against a friction facing arrangement of a clutch disk or the like, wherein the pressure plate is formed at least partially from a first material, and wherein a second material having thermal contact with the first material is provided in the pressure plate at least in some areas. In order to be able to compensate for negative umbrella deformation of the pressure plate caused by friction heat during operation of the clutch, the second material has a different thermal expansion, particularly a greater thermal expansion, than the first material.