Abstract: Embodiments include a system and circuit for measuring characteristics of a material under test (MUT). In some cases, the system includes a circuit having level detectors to measure the change in strength between a reference signal and a return signal passed through the MUT. The system can include a computing device to evaluate the measured signals and adjust those signals within range of the level detectors and other circuit components. Circuits can include a time-of-flight digital convertor for determining the phase shift between the reference and return signals that pass through the MUT. The measured difference in signal strength and phase can be used to compute the complex impedance or dielectric properties of the MUT. This impedance or dielectric property can be correlated with a physical property of the MUT. The system may be operated at a single frequency, or over a range of frequencies.

Abstract: Embodiments include a system and circuit for measuring characteristics of a material under test (MUT). In some cases, the system includes a circuit having level detectors to measure the change in strength between a reference signal and a return signal passed through the MUT. The system can include a computing device to evaluate the measured signals and adjust those signals within range of the level detectors and other circuit components. Circuits can include a time-of-flight digital convertor for determining the phase shift between the reference and return signals that pass through the MUT. The measured difference in signal strength and phase can be used to compute the complex impedance or dielectric properties of the MUT. This impedance or dielectric property can be correlated with a physical property of the MUT. The system may be operated at a single frequency, or over a range of frequencies.

Abstract: Apparatuses, systems, methods, and computer program products are presented for electronically emulating the impedance characteristics of materials, e.g., for standardizing and calibrating electromagnetic measuring devices for the measurement of physical properties of materials. The electronic impedance emulation apparatus according to some embodiments includes an electronic material emulation circuit in communication with the electromagnetic measuring device. The electronic material emulation circuit and the electromagnetic measuring device are controlled by a at least one computing device, which can control the frequency of signal(s) generated by the electromagnetic measuring device. The at least one computing device can instruct the electronic emulator to produce signals having complex impedance characteristics of the material under test at the test frequency. The emulation data can be stored and used for the calibration and/or standardization of the electromagnetic measuring device.

Abstract: Various embodiments of the invention relate generally to the measurement of the impedance of materials, electronic devices, or components over a range of frequencies, with a system for self-adjusting an input transmit signal and/or a reference signal to produce a measured signal within a desired range of the electronic measuring components over the frequency range based upon the value of the measured signal.

Abstract: Apparatuses, systems, methods, and computer program products are presented for electronically emulating the impedance characteristics of materials, e.g., for standardizing and calibrating electromagnetic measuring devices for the measurement of physical properties of materials. The electronic impedance emulation apparatus according to some embodiments includes an electronic material emulation circuit in communication with the electromagnetic measuring device. The electronic material emulation circuit and the electromagnetic measuring device are controlled by a at least one computing device, which can control the frequency of signal(s) generated by the electromagnetic measuring device. The at least one computing device can instruct the electronic emulator to produce signals having complex impedance characteristics of the material under test at the test frequency. The emulation data can be stored and used for the calibration and/or standardization of the electromagnetic measuring device.