Abstract: A method, a computer system, and a computer program product for a shiftleft topology construction is provided. Embodiments of the present invention may include collecting datasets. Embodiments of the present invention may include extracting topological entities from the datasets. Embodiments of the present invention may include correlating a plurality of data from the topological entities. Embodiments of the present invention may include mapping the topological entities. Embodiments of the present invention may include marking entry points for a plurality of subgraphs of the topological entities. Embodiments of the present invention may include constructing a topology graph.

Abstract: A display device includes a diffusion layer providing a single well, an optical element configured to receive light and output the received image light including a concentric series of lens segments made up of active facets, and a waveguide having an in-coupling grating and a waveguide body optically coupled to the image light, where a polarizing component is disposed over an output surface of the optical element. A method to improve a yield of silicon backplane displays includes connecting a diode having a resolution to a backplane and repairing a defect on a pixel display area by dividing the pixel display area into at least one subcircuit, while improving geometry stylization transfer for 3D models of real-world environments. A method for suppressing crosstalk for user conversations includes receiving multiple speech signals captured by multiple microphones and generating directional data for the multiple speech signals based on spatial filtering.

Abstract: A bracket system for attaching a brush to the blades of a rotary lawn mower. The bracket system has a brush attachment, at least one clamp, and a fastening device. The brush attachment has a brush, an elongated vertical slot, and a flange. The at least one clamp is placed around a non-linear lawn mower blade and is secured to the flange by the fastening device. Securing the clamp to the flange by the fastening device secures the brush attachment to the non-linear mower blade. Securing or removing the fastening device allows the attachment or removal of the brush attachment from the clamps, and thus the non-linear mower blade. In another embodiment, the bracket system includes a blade attachment configured to removably attach to the at least one clamp. The blade attachment is positioned on the opposite end of the non-linear lawn mower blade from the brush attachment.

Abstract: A bracket system for attaching a brush to the blades of a rotary lawn mower. The bracket system has a brush attachment, at least one clamp, and a fastening device. The brush attachment has a brush, an elongated vertical slot, and a flange. The at least one clamp is placed around a non-linear lawn mower blade and is secured to the flange by the fastening device. Securing the clamp to the flange by the fastening device secures the brush attachment to the non-linear mower blade. Securing or removing the fastening device allows the attachment or removal of the brush attachment from the clamps, and thus the non-linear mower blade.

Abstract: A universal system for testing different semiconductor devices provides a probe head with a probe pattern that may be used to test different test patterns formed on different semiconductor devices. Each of a plurality of bumps or pads of the test pattern contacts a corresponding probe of the probe head to enable the semiconductor device to be tested. The universal probe head may additionally or alternatively include a substrate design on the probe head that provides a pattern on the substrate of the probe head that may be used in conjunction with different patterns formed on a plurality of different printed circuit boards for testing different semiconductor devices.

Abstract: A system and a method of testing a semiconductor die is provided. An embodiment comprises a plurality of metal tips that are connected to a redistribution layer that fans out the pitch from the tips to metal plugs located in the substrate. The metal tips could be formed using semiconductor processes and either adding smaller layers of metal to larger layers of metal or else removing portions of one piece of metal to form the tips. The metal plugs are connected to a space transformation layer. The space transformation layer is electrically connected to a printed circuit board using, for example, a spring loaded connection such as a pogo pin. The space transformation layer is aligned onto the printed circuit board by a series of guidance mechanisms such as smooth fixtures, and the planarity of the tips is adjusted by adjusting a series of screws.

Abstract: A method and apparatus for clock generation have been disclosed having a selector logic block that controls operation based upon inputs such as analog input(s), digital input(s), a lookup table, and preset value(s), and combinations of such.

Abstract: A system and a method of testing a semiconductor die is provided. An embodiment comprises a plurality of metal tips that are connected to a redistribution layer that fans out the pitch from the tips to metal plugs located in the substrate. The metal tips could be formed using semiconductor processes and either adding smaller layers of metal to larger layers of metal or else removing portions of one piece of metal to form the tips. The metal plugs are connected to a space transformation layer. The space transformation layer is electrically connected to a printed circuit board using, for example, a spring loaded connection such as a pogo pin. The space transformation layer is aligned onto the printed circuit board by a series of guidance mechanisms such as smooth fixtures, and the planarity of the tips is adjusted by adjusting a series of screws.

Abstract: A universal system for testing different semiconductor devices provides a probe head with a probe pattern that may be used to test different test patterns formed on different semiconductor devices. Each of a plurality of bumps or pads of the test pattern contacts a corresponding probe of the probe head to enable the semiconductor device to be tested. The universal probe head may additionally or alternatively include a substrate design on the probe head that provides a pattern on the substrate of the probe head that may be used in conjunction with different patterns formed on a plurality of different printed circuit boards for testing different semiconductor devices.

Abstract: A method and apparatus for Clock and PLL N-Divider Switch have been disclosed.

Abstract: A method and apparatus for a buffer with programmable skew have been disclosed. Several output signals are generated. Based on one of the output signals several feedback signals are generated. The feedback signals are then received and compared. Based on the comparisons, the skew between the output signals is adjusted.

Abstract: A method and apparatus for clock generation have been disclosed having a selector logic block that controls operation based upon inputs such as analog input(s), digital input(s), a lookup table, and preset values(s), and combinations of such.

Abstract: An apparatus comprising a circuit that may be configured to (i) change a frequency of one or more first signals in response to a second signal and (ii) generate a third signal in response to either the second signal or a predetermined time period expiring.