Patents by Inventor Frank J. Koch
Frank J. Koch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6282962Abstract: A gauge for determining a thickness of a coating on a substrate includes a transducer for emitting ultrasonic signals into the coating and for generating electrical signals proportional to the ultrasonic signals received by the transducer, the received signals include first signals reflected from a transducer/coating interface and second signals reflected from a coating/substrate interface; a pulser for sending pulses to the transducer to trigger the emission of the ultrasonic signals; a sampler for sampling the electrical transducer signals and generating sampled data; a timer for controlling the pulser and the sampler so as to perform an equivalent time sampling of the signals received by the sampler; and a controller for calculating a thickness of the coating based on the sampled data, the controller includes the ability to subject the sampled data to a deconvolution analysis so as to distinguish sampled data corresponding to the first signals from sampled data corresponding to the second signals when theType: GrantFiled: October 15, 1997Date of Patent: September 4, 2001Assignee: DeFelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
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Patent number: 6250160Abstract: A gauge for determining a thickness of a coating on a substrate includes a transducer for emitting ultrasonic signals into the coating and for generating electrical signals proportional to the ultrasonic signals received by said transducer, said received signals include first signals reflected from a transducer/coating interface and second signals reflected from a coating/substrate interface; a pulser for sending pulses to the transducer to trigger the emission of said ultrasonic signals; a sampler for sampling the electrical transducer signals and generating sampled data; a timer for controlling the pulser and the sampler so as to perform an equivalent time sampling of the signals received by the sampler; and a controller for calculating a thickness of the coating based on said sampled data, said controller includes the ability to subject said sampled data to a deconvolution analysis so as to distinguish sampled data corresponding to said first signals from sampled data corresponding to said second signals wType: GrantFiled: December 10, 1998Date of Patent: June 26, 2001Assignee: DeFelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
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Patent number: 6050140Abstract: An adhesion tester includes a dolly to be adhered to a coating to be tested; the dolly including at least a portion of a spherical surface; a frame having a hollow portion in a region thereof, in which region the dolly fits; a hydraulic piston within the frame; and a quick connect coupler for connecting the hydraulic piston to the dolly; the coupler including a plurality of ball bearings aligned so as to engage with a lower half of the spherical surface of the dolly so as to connect the dolly with the coupler.Type: GrantFiled: July 31, 1998Date of Patent: April 18, 2000Assignee: Defelsko CorporationInventor: Frank J. Koch
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Patent number: 5930744Abstract: A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.Type: GrantFiled: September 15, 1995Date of Patent: July 27, 1999Assignee: Defelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
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Patent number: 5751608Abstract: A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.Type: GrantFiled: September 15, 1995Date of Patent: May 12, 1998Assignee: DeFelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
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Patent number: 5723791Abstract: A gauge for determining a thickness of a coating on a substrate includes a transducer for emitting ultrasonic signals into the coating and for generating electrical signals proportional to the ultrasonic signals received by the transducer, the received signals include first signals reflected from a transducer/coating interface and second signals reflected from a coating/substrate interface; a pulser for sending pulses to the transducer to trigger the emission of the ultrasonic signals; a sampler for sampling the electrical transducer signals and generating sampled data; a timer for controlling the pulser and the sampler so as to perform an equivalent time sampling of the signals received by the sampler; and a controller for calculating a thickness of the coating based on the sampled data, the controller includes the ability to subject the sampled data to a deconvolution analysis so as to distinguish sampled data corresponding to the first signals from sampled data corresponding to the second signals when theType: GrantFiled: September 28, 1993Date of Patent: March 3, 1998Assignee: DeFelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
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Patent number: 5623427Abstract: A method and apparatus for measuring an anodic capacity of a thermally sprayed coating are described. Eddy current techniques are used to probe the coating and resulting RMS voltages are translated into anodic capacity indications which can be standardized or absolute. Recalibration can be achieved using single point measurement.Type: GrantFiled: September 2, 1994Date of Patent: April 22, 1997Assignee: DeFelsko CorporationInventors: Leon Vandervalk, Frank J. Koch
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Patent number: 5397027Abstract: A stopper for use in a metered dispensing unit including a conduit for carrying fluid from a container to a metering portion of the dispensing unit, the conduit having a flange at one end, a sealing member arranged on the conduit for sealing the conduit against an inside surface of the container, the sealing member having a tube through which the conduit extends, and a system for replaceably securing the sealing member on the conduit between the flange and an end of the conduit which is opposite the flange. For example, the securing system may include a releasable retaining clip.Type: GrantFiled: October 4, 1993Date of Patent: March 14, 1995Assignee: DeFelsko CorporationInventors: Frank J. Koch, Douglas Cleminshaw
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Patent number: 5343146Abstract: A gauge probe for a handheld combination coating thickness gauge allows the combination coating thickness gauge to measure both nonferrous coatings on ferrous substrate and nonconductive coatings on conductive nonferrous substrate. The gauge probe enables the combination coating thickness gauge to determine automatically, with a single probe, the substrate characteristics, and to effect a measurement of the coating thickness on that substrate. The technique used to measure coatings on a ferrous substrate utilizes a permanent magnet to provide a constant magnetic flux and a Hall sensor and thermistor arranged to measure the temperature-compensated magnetic flux density at one of the poles of the permanent magnet. The flux density at the magnet pole can be related to a nonferrous coating thickness on a ferrous substrate. The technique used to measure nonconductive coatings on a conductive nonferrous substrate utilizes eddy current effects.Type: GrantFiled: October 5, 1992Date of Patent: August 30, 1994Assignee: De Felsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
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Patent number: 5293132Abstract: A coating thickness measurement gauge includes a measurement transducer and a particularly advantageous probe arrangement. The probe arrangement includes a probe assembly and a probe housing that encircles the probe assembly. The probe assembly may include an inductor that forms a part of an LC oscillator. The gauge is able to measure the thickness of coatings on magnetic and non-magnetic substrates through use of the same probe assembly. Alternatively, the probe assembly can include a capacitor forming a part of an LC or an RC oscillator. The bottom surface of the probe housing has two oppositely positioned V-shaped grooves formed therein for facilitating the measurement of coating thicknesses on convex surfaces. The outer peripheral surface of the probe housing includes two spaced apart flat surfaces connected together by two arcuate surfaces for stabilizing the gauge during measurement of coating thicknesses on concave surfaces.Type: GrantFiled: June 1, 1993Date of Patent: March 8, 1994Assignee: DeFelsko CorporationInventor: Frank J. Koch
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Patent number: 5241280Abstract: A coating thickness gauge includes a measurement transducer and a particularly advantageous probe arrangement. The probe arrangement includes a probe assembly and a probe housing that encircles the probe assembly. The probe assembly may include an inductor that forms a part of an LC oscillator. The gauge is able to measure the thickness of coatings on magnetic and non-magnetic substrates through use of the same probe assembly. Alternatively, the probe assembly can include a capacitor forming a part of an LC or an RC oscillator. The bottom surface of the probe housing has two oppositely positioned V-shaped grooves formed therein for facilitating the measurement of coating thicknesses on convex surfaces. The outer peripheral surface of the probe housing includes two spaced apart flat surfaces connected together by two arcuate surfaces for stabilizing the gauge during measurement of coating thicknesses on concave surfaces.Type: GrantFiled: June 1, 1990Date of Patent: August 31, 1993Assignee: DeFelsko CorporationInventors: Rashid K. Aidun, Frank J. Koch
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Patent number: 5094009Abstract: A gauge for measuring the thickness of a coating on a substrate includes a housing, an indicator rod movably positioned within the housing, a magnet mounted on the forward end of the indicator rod, and a spring connected to the rearward end of the indicator rod. The housing can have a slot extending along a portion thereof that communicates with the interior of the housing. According to one embodiment, a measurement scale can be positioned adjacent to and extending along the length of the slot and a plurality of indicating marks can be provided on the rod for permitting the thickness of the coating to be determined. The particular indicating mark that is used for determining the thickness of the coating is dependent upon the orientation of the gauge relative to the force of gravity. According to another aspect of the present invention, the magnet can be fabricated from a combination of at least one light rare earth element and at least one heavy rare earth element.Type: GrantFiled: October 17, 1990Date of Patent: March 10, 1992Assignee: DeFelsko CorporationInventors: Frank J. Koch, Marlin S. Walmer
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Patent number: 4859127Abstract: A coiled spring wire fastener includes a first end for engaging with the head of a bolt, a midsection of a constant diameter and a second end portion of a conically, tapered shape. In an alternative embodiment, the coiled spring wire fastener includes an annular midsection for engaging a threaded portion of a bolt, a first annular end portion connected to the annular midsection and having a smaller internal diameter than that of the midsection, and a conically tapered second end portion.Type: GrantFiled: June 3, 1988Date of Patent: August 22, 1989Assignee: Linda Koch BeamishInventor: Frank J. Koch
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Patent number: 4741426Abstract: A coin acceptor includes first and second members initially spaced apart from one another and frictionally carrying a third member having a coin selectively positioned thereon. Moving the first and second members toward one another causes relative displacement between the third member and the first and second members. The relative displacement is compared with a reference position.Type: GrantFiled: December 4, 1986Date of Patent: May 3, 1988Assignee: DeFelsko CorporationInventor: Frank J. Koch
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Patent number: 4705153Abstract: A coin acceptor includes first and second members initially spaced apart from one another and frictionally carrying a third member. Moving the first and second members toward one another displaces the third member a distance corresponding to the weight of the coin selectively positioned on the third member. The distance which the third member is displaced is compared with a reference position.Type: GrantFiled: December 23, 1985Date of Patent: November 10, 1987Assignee: DeFelsko CorporationInventor: Frank J. Koch
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Patent number: D308248Type: GrantFiled: October 3, 1988Date of Patent: May 29, 1990Assignee: Linda Koch BeamishInventor: Frank J. Koch
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Patent number: D331201Type: GrantFiled: October 26, 1990Date of Patent: November 24, 1992Assignee: DeFelsko CorporationInventor: Frank J. Koch
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Patent number: RE41342Abstract: A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.Type: GrantFiled: April 3, 2000Date of Patent: May 18, 2010Assignee: DeFelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish
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Patent number: RE35703Abstract: A gauge probe for a handheld combination coating thickness gauge allows the combination coating thickness gauge to measure both nonferrous coatings on ferrous substrate and nonconductive coatings on conductive nonferrous substrate. The gauge probe enables the combination coating thickness gauge to determine automatically, with a single probe, the substrate characteristics, and to effect a measurement of the coating thickness on that substrate. The technique used to measure coatings on a ferrous substrate utilizes a permanent magnet to provide a constant magnetic flux and a Hall sensor and thermistor arranged to measure the temperature-compensated magnetic flux density at one of the poles of the permanent magnet. The flux density at the magnet pole can be related to a nonferrous coating thickness on a ferrous substrate. The technique used to measure nonconductive coatings on a conductive nonferrous substrate utilizes eddy current effects.Type: GrantFiled: August 28, 1996Date of Patent: December 30, 1997Assignee: DeFelsko CorporationInventors: Frank J. Koch, Leon C. Vandervalk, David J. Beamish