Patents by Inventor Frank J. Metayer

Frank J. Metayer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8538170
    Abstract: Templates of known forms are stored in computer system. The templates are digitized pixels on which connected component analyses are performed resulting in a first list of components. Five to ten of those components are selected to create an ordered feature list for each form. The computer system then captures an optical image of a form positioned on the top of a stack of forms. The optical image is digitized and stored in the computer (or processor) system as a captured digital image of pixels. A connected component analysis is performed on the captured digital image that results in a second list of image components. Image components on the second list are compared to those on the first list and then each succeeding feature in one of the ordered feature lists. If the comparison is successful, the form is known and other marks on the form may then be processed. If the comparison is unsuccessful, a new feature list is tried.
    Type: Grant
    Filed: January 29, 2013
    Date of Patent: September 17, 2013
    Assignee: GTECH Corporation
    Inventor: Frank J. Metayer
  • Publication number: 20130142442
    Abstract: Templates of known forms are stored in computer system. The templates are digitized pixels on which connected component analyses are performed resulting in a first list of components. Five to ten of those components are selected to create an ordered feature list for each form. The computer system then captures an optical image of a form positioned on the top of a stack of forms. The optical image is digitized and stored in the computer (or processor) system as a captured digital image of pixels. A connected component analysis is performed on the captured digital image that results in a second list of image components. Image components on the second list are compared to those on the first list and then each succeeding feature in one of the ordered feature lists. If the comparison is successful, the form is known and other marks on the form may then be processed. If the comparison is unsuccessful, a new feature list is tried.
    Type: Application
    Filed: January 29, 2013
    Publication date: June 6, 2013
    Applicant: GTECH CORPORATION
    Inventor: Frank J. Metayer
  • Patent number: 8233200
    Abstract: A system and process for reading forms using a curvature distortion correction scheme is disclosed. A model image of a known form is partitioned into sectors defined by at least three alignment marks, and a transfer or correction function for each sector is generated by comparing the locations of alignment marks on a captured unread image of a form to those on a model image. The transfer function is then applied to the other marks within the sector to calculate a correct location of the marks. Each sector is sized to reasonably ensure curvature distortions are handled such that all the marks on a form are properly found and interpreted. Errors may be checked and, if they persist, smaller sectors may be defined and employed, if available.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: July 31, 2012
    Assignee: GTech Corporation
    Inventors: Frank J. Metayer, Carlos Cervantes Toral, Duncan D. Xue
  • Publication number: 20090074327
    Abstract: A system and process for reading forms using a curvature distortion correction scheme is disclosed. A model image of a known form is partitioned into sectors defined by at least three alignment marks, and a transfer or correction function for each sector is generated by comparing the locations of alignment marks on a captured unread image of a form to those on a model image. The transfer function is then applied to the other marks within the sector to calculate a correct location of the marks. Each sector is sized to reasonably ensure curvature distortions are handled such that all the marks on a form are properly found and interpreted. Errors may be checked and, if they persist, smaller sectors may be defined and employed, if available.
    Type: Application
    Filed: November 26, 2008
    Publication date: March 19, 2009
    Inventors: Frank J. Metayer, Carlos Cervantes Toral, Duncan D. Xue